Nyquist Sampling & PSF Calculator

Compute optimal pixel size, z-step, and PSF dimensions for widefield, confocal, STED, two-photon, and light sheet microscopy. Enter your objective NA and wavelength to get Nyquist-compliant sampling intervals.

MicroscopyImagingCalculatorClient-Side
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Microscope Settings

Sampling Check (Optional)

Enter your actual acquisition settings to check Nyquist compliance.

Results

ParameterValue
Lateral Resolution228.8 nm
Axial Resolution811.6 nm
Nyquist Pixel Size99.5 nm
Nyquist Z-Step352.9 nm
PSF FWHM Lateral191.3 nm
PSF FWHM Axial493.6 nm

Resolution & PSF Comparison

  • Setting up a new microscope acquisition to determine correct pixel size and z-step
  • Checking whether your current settings satisfy Nyquist sampling
  • Comparing resolution across modalities for a given objective and wavelength
  • Estimating PSF dimensions for deconvolution setup

Don't use for

  • As a substitute for measuring the actual PSF with sub-resolution beads
  • For aberrated or misaligned optical systems (formulas assume ideal optics)
  • When using non-standard beam shaping (e.g., Bessel beams, lattice light sheet)

Nyquist-Shannon Sampling in Optical Microscopy

The Nyquist-Shannon theorem requires sampling at ≥2× the highest spatial frequency to avoid aliasing. In microscopy the diffraction limit sets the highest frequency, so the required pixel size depends on the optical resolution.

Practical rule: divide the resolution by 2.3 (rather than exactly 2) to provide a small safety margin. This applies independently in X/Y (lateral) and Z (axial) dimensions.
Under-sampling causes aliasing artifacts and lost information. Over-sampling wastes acquisition time, disk space, and signal-to-noise without improving real resolution.

Modality Resolution Comparison

Different microscopy techniques achieve different resolution limits:

  • Widefield: Rayleigh limit 0.61×λ/NA lateral; axial limited by depth of field
  • Confocal: Pinhole rejects out-of-focus light; can reach 0.37×λ/NA lateral with small pinhole
  • Spinning disk: Fixed pinhole array — widefield-like lateral, confocal-like axial
  • STED: Super-resolution via stimulated emission depletion — below 50 nm possible
  • Two-photon: Uses IR excitation; effective wavelength = λ_ex/√2
  • Light sheet: Axial resolution set by min(detection axial, sheet thickness)

Frequently Asked Questions