X-ray beam characterization of an aberration-corrected pair of planar nanofocusing X-ray lenses with ptychography

<p>This data set is split over two zip archives. Each archive contains a scanning coherent X-ray diffraction (ptychography) data set recorded at an X-ray energy of 18 keV. A crossed pair of planar nanofocusing X-ray lenses (NFL) made out of silicon is used to focus the beam and scan a Siemens star test sample. Each data set includes a configuration file and scan position file. In addition, the final result of the obtained ptychographic reconstruction is included.</p><p><strong>Description of the two data sets:</strong></p><ul><li>scan_00033: X-ray beam characterization of the NFL. On this data set the design of the refractive phase correctors was based upon.</li><li>scan_00077: X-ray beam characterization of the NFL with refractive phase corrector milled to the silicon lens by focused ion-beam milling.</li></ul><p><strong>Additional information:</strong></p><p>The diffraction patterns can be found in the 'eiger4m_01' folder. They are split up over multiple h5 files and located in the group '/entry/data/data'. The assignment of diffraction patterns to scan positions can be found in the positions.txt file. All relevant input parameters for ptychography are located in the 'input' group in the ptycho.conf files. The reconstruction results are in the European Data Format (EDF).</p><p><strong>The data set has been published in:</strong></p><p>F. Seiboth, A. Schropp, M. Lyubomirskiy, W. Wang, A. Jahn, S. Kulkarni, T. F. Keller, and C. G. Schroer, "On-chip aberration correction for planar nanofocusing x-ray lenses by focused ion-beam milling," Applied Physics Letters <strong>122</strong>(24), (2023).</p>