Raman spectroscopic mapping and atomic force microscopy statistical analyses for the determination of WS2 flake thickness

<p><span>This database contains the statistical analyses carried out in order to evaluate the thickness of the WS</span>_{<span>2</span>}<span>&nbsp;nanoflakes. In order to have a reliable comparison we determine the methodology of comparing Raman spectroscopic mapping and atomic force microscopy (AFM). </span></p> <p><span>In case of Raman spectroscopy, the thickness is evaluated by employing the separation of the two vibrational mode, namely E</span>_{<span>2g</span>}<span>&nbsp;and A</span>_{<span>1g</span>}<span>. This method is well-established and the number of layers has been previously tabulated in different articles. &nbsp;&nbsp;</span></p> <p><span>Each spectrum of the Raman analysis, is performed with a 100X objective in a confocal microscope, with a 473 nm laser excitation, a laser power of 0.5 mW and an acquisition time of 1 s.</span></p> <p><span>The AFM analysis are carried out in tapping mode with a 512-pixel x 512-pixel resolution and and a scan rate of 1Hz per line.</span></p>