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Table: Critical assessment of charge mobility extraction in field-effect transistors.

<p>This TABLE lists the measurement reliability factor, <em>r</em>, the maximum power density, <em>P</em><sub>max</sub>, dissipated in the transistor<br> channel, as well as the maximum current density, <em>j</em><sub>SD</sub><sup>max</sup>, in the channel of (organic) field-effect transistors (FETs) calculated from the data shown in recent literature reports. For the exact definitions of these parameters see Nature Mater. DOI: 10.1038/nmat5035.</p>

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