zenodoopen
Formation of extended thermal etch pits on annealed Ge wafers -DataSet
<p>Dataset supporting the publication: <a href="https://arxiv.org/ct?url=https%3A%2F%2Fdx.doi.org%2F10.1016%252Fj.apsusc.2018.08.075&v=9dba84e7">10.1016/j.apsusc.2018.08.075</a> <a href="https://arxiv.org/abs/1809.03404">arXiv:1809.03404</a>, including optical microscopy, atomic force microscopy, scanning electron micoscopy</p> <p> </p>
ShareScore
32/100
Overall dataset sharing score
Score breakdown
These five areas show where the dataset supports — or may limit — practical reuse.
- Stewardship
- 4
- Harmonization
- 4
- Access
- 16
- Reuse readiness
- 0
- Engagement
- 8