Tilt stacks of various ASI systems using continous STEM-DPC with an ADF detector in JEOL JEM-2100F

<p>Processed data (GIF-format) of tilt stacks using the ADF detector to acquire images of ASI systems while continuously tilting the specimen&nbsp;in LMSTEM. The structures shown are pinwheel, square and kagome lattices with&nbsp;different dimensions, milled into a 20nm thick layer of permalloy. Bitmaps used for FIB milling can be found in a separate folder.</p> <p><strong>Lattices</strong><br> pw = pinwheel<br> sq = square<br> kag = kagome</p> <p><strong>Sizes of each island</strong><br> XL = 1800nm x 600nm<br> L = 900nm x 300nm<br> M = 600nm x 200nm<br> S = 450nm x 150nm<br> XS = 225nm x 75nm</p> <p><br> We acknowledge the support from the Research Council of Norway for the Norwegian Center for Transmission Electron Microscopy, NORTEM (197405), the Norwegian Micro- and Nano-Fabrication Facility, NorFab (295864), and In-situ Correlated Nanoscale Imaging of Magnetic Fields in Functional Materials, InCoMa (315475).</p>