Kelvin Probe Force Microscopy under Variable Illumination: A Novel Technique To Unveil Charge Carrier Dynamics in GaN

<p>SPV curve in logarithmic scale; XPS results before heating, after heating, and after sputtering; SPV after days in darkness; and AFM and CPD maps (before and after heating) of larger areas with higher spatial resolution than the ones presented here (<a href="https://pubs.acs.org/doi/suppl/10.1021/acs.jpcc.3c01887/suppl_file/jp3c01887_si_001.pdf">PDF</a>)</p>