AVIRIS-3 L2A Orthocorrected Surface Reflectance, Facility Instrument Collection

This dataset contains Level 2A (L2A) surface reflectance images from the Airborne Visible / Infrared Imaging Spectrometer-3 (AVIRIS-3) instrument. This is the NASA Earth Observing System Data and Information System (EOSDIS) facility instrument archive of these data. The NASA AVIRIS-3 is a spectral mapping system that measures reflected radiance at 7.4-nm intervals in the Visible to Shortwave Infrared (VSWIR) spectral range from 390-2500 nm. Surface hemispherical directional reflectance was derived from calibrated radiance using an optimal estimation algorithm. For each flight line, two file types are included: orthocorrected surface reflectance (RFL_ORT) and orthocorrected reflectance uncertainty (UNC_ORT) in netCDF format. Both file types include data projected in a UTM coordinate system. In addition, ancillary files for each flight line are provided, including a quick look image in GeoTIFF format and text files in YAML format that document processing algorithms and parameters used during production.