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27 results for “4D STEM”
Ni-W Based Alloy 4D STEM Data
<p>Ni-W based alloys have been extensively employed in the nuclear energy and national defense industries due to their excellent static/dynamic mechanical properties and high densities. The mechanical performance of these alloys can be further tailored through the addition of a variety of impurities with varying compositions. To investigate the structure of this material and identify any potential precipitates and/or second phases, a 4D-STEM data set was acquired using a Gatan K3 IS camera and a STEMx system in electron counting mode on a JEOL ARM 300F. Data was binned 8x in diffraction space for faster analysis. This data was analyzed for the NUANCE/Gatan Virtual Workshop on 4D STEM: Theory, Acquisition, and Analysis on December 9th, 2020. The python analysis code "DIY: Using Python to Process 4D STEM Data" is available on github at <a href="https://github.com/smribet/DIY_4DSTEM?fbclid=IwAR0xpnlYnnFA3K3hUBSHgizB3MMuDuOHP_kutFoz_UurX9xqDPbStGeeDYk">https://github.com/smribet/DIY_4DSTEM</a>.</p>
Unsupervised Machine Learning and Cepstral Analysis with 4D-STEM for Characterizing Complex Microstructures of Metallic Alloys
<p>Raw 4D-STEM data of Ni50Ti26Hf20Al4 used for analysis in the publication "Unsupervised Machine Learning and Cepstral Analysis with 4D-STEM for Characterizing Complex Microstructures of Metallic Alloys". Datasets were collected using the electron microscope pixel array detector (EMPAD) with a Themis Z STEM. Custom python scripts used for data analysis are available upon request to one of the corresponding authors.</p>
4D-STEM dataset
<p>The 4D dataset of twisted bilayer MoS2, metadata can be summarized as follows:</p> <ul> <li>Material: 11 Twisted bilayer MoS2</li> <li>Convergence angle: 21.4 mrad</li> <li>Field of View (FOV): 30 nm</li> <li>Image Size: 512x512 pixels</li> <li>Acceleration Voltage: 80kV</li> </ul>
4D-STEM data for SFMU Microscopy workshop - Rouen 2023 - France
<p><strong>4D-STEM data for SFMU Microscopy workshop - Rouen 2023 - France</strong></p> <p> </p> <p><strong>Credits: Pyxem Project</strong></p>
High-resolution 4D STEM dataset of SrTiO3 along the [1 0 0] axis at high magnification
<p>This dataset can be used to test various analysis methods for high-resolution 4D STEM, including phase contrast methods such as ptychography. Scan and diffraction coordinates have been calibrated. The high scan magnification allows to identify individual atoms and easily distinguish them from reconstruction artifacts.</p> <p>Data was acquired at a probe-corrected FEI Titan 80-300 STEM operated at 300 kV. The microscope was equipped with a Medipix Merlin for EM detector operated at an acquisition rate for individual diffraction patterns of 1 kHz. The scan size was 128 x 128 scan points and the recorded diffraction patterns had a dimension of 256 x 256 pixel.</p> <p>The convergence angle of the incident probe was measured with a polycrystalline gold specimen. Employing parallel illumination first, the (111) gold diffraction ring was used to calibrate the diffraction space assuming a lattice constant of gold of 0.4083 nm. With the known wavelength the convergence semi-angle was determined to 22.1 mrad from a Ronchigram recorded in the same STEM setting as used in the actual experiment. The convergence semi-angle in pixel was determined from the size of the primary beam on the detector.</p> <p>The rotation and handedness of the detector coordinate system with respect to the scan axes was determined by minimizing the curl of the first moment vector field and making sure that the divergence of the field is negative at atom positions. Note that, in theory, the curl of purely electrostatic fields should vanish. The pixel size in the scan dimension of 12.7 pm was taken from the STEM control software during live processing and verified by comparison with the known lattice constant of SrTiO<sub>3</sub>. The residual scan distortion, that is, the translation of the diffraction pattern as a whole during scanning, was not compensated for since it turned out to be negligible at the atomic-resolution STEM magnifications used in this analysis.</p> <p>The sample thickness was approximately 25 nm, determined by comparing the PACBED with simulation.</p> <p><strong>Parameters</strong></p> <p>Scan pixel size: 12.7 pm</p> <p>Center y: 126 px</p> <p>Center x: 123 px</p> <p>Convergence semi-angle: 22.13 mrad, 15.5 px</p> <p>Thickness: approx. 25 nm</p> <p>Affine transformation of the direction of scan coordinates to detector coordinates using https://github.com/LiberTEM/LiberTEM/blob/master/src/libertem/corrections/coordinates.py:</p> <pre>transformation = rotate_deg(88) @ flip_y() det_sy, det_sx = ((scan_sy, scan_sx) @ transformation)</pre> <p>See the included notebook for an exemplary analysis. See https://arxiv.org/abs/2106.13457 for more details.</p>
Supplementary Information and Raw Data for 'Low-dose 4D-STEM Tomography for Beam-Sensitive Nanocomposites'
<p>Supplementary information containing TEM data and analysis for the article </p> <p>"<strong>Low-dose 4D-STEM Tomography for Beam-Sensitive Nanocomposites</strong>"</p> <p>Link to paper: <a title="DOI URL" href="https://doi.org/10.1021/acsmaterialslett.3c01042">https://doi.org/10.1021/acsmaterialslett.3c01042</a></p> <p>The archive provides a documentation of the evaluation routine as a .pdf file and two scripts that are needed for evaluations. In addition, 4 folders are present after unzipping the archive, which contain</p> <ul> <li>the raw 4D-STEM datasets,</li> <li>vSTEM images,</li> <li>an example of the denoised vSTEM images,</li> <li>the denoised and aligned image stack, and the reconstructed volumes.</li> </ul> <p>If there are any questions/bugs, feel free to contact Milena Hugenschmidt (https://orcid.org/0000-0001-5020-9302).</p>
SiGe Multilayer 4D-STEM Dataset for Strain Mapping - Training purposes internal
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