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50 results for “XPS”
Physico-chemical characterization of sterilized TiO2 nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>TiO<sub>2</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifier in the project: ERM00000413, ERM00000455, ERM00000434).</p> <p>The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA.</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe files <em>Pn.m.o.sample_treatment</em> and for the corresponding .npl files: <em>m.npl</em> with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave.</p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
Physico-chemical characterization of Ce0.9Zr0.1O2 nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>Ce<sub>0.9</sub>Zr<sub>0.1</sub>O<sub>2</sub> nanoparticles were provided by Promethean Particles (EMR identifier in the project: ERM00000399).</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "p" for pristine.</p> <p> </p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
Observational Study on the Clinical Use of ex Vivo Lung Perfusion (XPS™) for Lung Transplantation
ClinicalTrials.gov study NCT06795516. IPD Sharing: Not stated. Countries: 1. Publications: 0.
SORCE XPS Level 4 Solar Spectral Irradiance 1.0nm Res 24-Hour Means V012 (SOR4XPSD_LOW) at GES DISC
The SORCE XPS Level 4 Solar Spectral Irradiance 1.0nm Res 24-Hour Means product (SOR4XPSD_LOW) contains modelled spectral extreme ultraviolet (XUV) irradiances based on calibrated SORCE XUV Photometer System (XPS) data and flare plasma temperature derived from the GOES XRS instrument. The model data are reported in the spectral range from 0-40 nm at a resolution of 1.0 nm (low res) and averaged over a day. The XPS Level 2 data products, along with CHIANTI reference spectra, are used to construct the XPS Level 4 data products.The SOR4XPS5 data are stored in a single netCDF files containing data for the entire mission. Data variables stored in the file include:MODELFLUX: Array of solar irradiances [W/m2/nm] in 1.0 nm bins from 0 to 40 nmERR_ABS: Total combined standard uncertainty of the model flux irradiance results (accuracy)ERR_MEAS: Count-rate based combined standard uncertainty of the XPS-1,-2 measurement (precision)DATE: Year and day-of-year of observation (YYDDD)TIME: Seconds of day for middle of observationXPS_QS: Daily quiet-sun scale factor derived from XPS-1,-2 daily minimumXPS_AR: Daily active-region scale factor derived from XPS-1,-2 daily minimumXPS_FLARE: Flare scale factor for each XPS-1,-2GOES_QS: Daily quiet-sun scale factor derived from GOES XRS-B daily minimumGOES_AR: Daily active-region scale factor derived from GOES XRS-B daily minimumGOES_FLARE: Flare scale factor for each GOES XRS-B integrationFMTEMP: Flare model temperature [log10(K)] derived from ratio of GOES XRS-B to XRS-AFMINDEX: Index into flare model tableFMWEIGHT: Weight parameter for the flare model
SORCE XPS Level 3 Solar Spectral Irradiance Daily Means V012 (SOR3XPSD) at GES DISC
The SORCE XUV Photometer System (XPS) Solar Spectral Irradiance (SSI) Daily Data Product SOR3XPSD contains solar extreme ultraviolet irradiances in the 0.1 to 27 nm range, as well as Lyman-alpha, in broad bands (7-10 nm resolution) as listed below:* Diode 1: 0.1 - 7.0 nm* Diode 2: 0.1 - 7.0 nm* Diode 3: 17.0 - 23.0 nm* Diode 6: 0.1 - 11.0 nm* Diode 7: 0.1 - 7.0 nm* Diode 9: 0.1 - 7.0 nm* Diode 11: 121.0 - 122.0 nmThe data are reported at a mean solar distance of 1 AU and zero relative line-of-sight velocity with respect to the Sun. The accuracy for the XPS Level 3 irradiance is 12-30%, photometer dependent, and the long-term repeatability is 1% per year. The SOR3XPSD data are arranged in a single tabular ASCII text file which can be easily read into a spreadsheet application. The columns contain the date, Julian day, average measurement date, standard deviation of measurement date, diode number, minimum wavelength, maximum wavelength, instrument mode, data version number, median irradiance, mean irradiance, absolute uncertainty, measurement precision, calculation precision, degradation model, degradation version, and number of data points. The rows are arranged with data for each day, repeating for each diode wavelength.
SORCE Combined XPS, SOLSTICE, and SIM Solar Spectral Irradiance 24-Hour Means V001 (SOR3D_COMBINED_001) at GES DISC
The SORCE Combined XPS, SOLSTICE, and SIM Solar Spectral Irradiance 24-Hour Means product consists of daily averages of the solar spetra from 0.1 to 2412 nm. The SORCE instruments make measurements during each daytime orbit portion, 15 orbits per day. This product combines data from the XPS, SOLSTICE and SIM instruments and merges them into a daily averaged solar spectra. The spectral resolution of SIM varies between 1-34 nm, SOLSTICE is 1 nm, and XPS is 7 nm.The SORCE combined data are arranged in a single file in a tabular ASCII text file which can be easily read into a spreadsheet application. The columns contain the date (calendar and Julian Day), min wavelength, max wavelength, instrument mode, input data version, spectral irradiance, irradiance uncertainty, and a data quality flag. Each row represents a separate day and wavelength.
SORCE XPS Level 3 Solar Spectral Irradiance 6-Hour Means V012 (SOR3XPS6) at GES DISC
The SORCE XUV Photometer System (XPS) Solar Spectral Irradiance (SSI) 6-Hour Data Product SOR3XPS6 contains solar extreme ultraviolet irradiances in the 0.1 to 27 nm range, as well as Lyman-alpha, in broad bands (7-10 nm resolution) as listed below:* Diode 1: 0.1 - 7.0 nm* Diode 2: 0.1 - 7.0 nm* Diode 3: 17.0 - 23.0 nm* Diode 6: 0.1 - 11.0 nm* Diode 7: 0.1 - 7.0 nm* Diode 9: 0.1 - 7.0 nm* Diode 11: 121.0 - 122.0 nmThe data are reported at a mean solar distance of 1 AU and zero relative line-of-sight velocity with respect to the Sun. The accuracy for the XPS Level 3 irradiance is 12-30%, photometer dependent, and the long-term repeatability is 1% per year. The SOR3XPS6 data are arranged in a single tabular ASCII text file which can be easily read into a spreadsheet application. The columns contain the date, Julian day, average measurement date, standard deviation of measurement date, diode number, minimum wavelength, maximum wavelength, instrument mode, data version number, median irradiance, mean irradiance, absolute uncertainty, measurement precision, calculation precision, degradation model, degradation version, and number of data points. The rows are arranged with data for each 6 hour time increment, repeating for each diode wavelength.
SORCE XPS Level 4 Solar Spectral Irradiance 0.1nm Res 5-Minute V012 (SOR4XPS5) at GES DISC
The SORCE XPS Level 4 Solar Spectral Irradiance 0.1nm Res 5-Minute product (SOR4XPS5) contains modelled spectral extreme ultraviolet (XUV) irradiances based on calibrated SORCE XUV Photometer System (XPS) data and flare plasma temperature derived from the GOES XRS instrument. The model data are reported in the spectral range from 0-40 nm at a resolution of 0.1 nm about every 5 minutes. The XPS Level 2 data products, along with CHIANTI reference spectra, are used to construct the XPS Level 4 data products.The SOR4XPS5 data are stored in netCDF files containing one year of data. Data variables stored in each file include:MODELFLUX: Array of solar irradiances [W/m2/nm] in 0.1 nm bins from 0.1 to 39.9 nmERR_ABS: Total combined standard uncertainty of the model flux irradiance results (accuracy)ERR_MEAS: Count-rate based combined standard uncertainty of the XPS-1,-2 measurement (precision)DATE: Year and day-of-year of observation (YYDDD)TIME: Seconds of day for middle of observationXPS_QS: Daily quiet-sun scale factor derived from XPS-1,-2 daily minimumXPS_AR: Daily active-region scale factor derived from XPS-1,-2 daily minimumXPS_FLARE: Flare scale factor for each XPS-1,-2GOES_QS: Daily quiet-sun scale factor derived from GOES XRS-B daily minimumGOES_AR: Daily active-region scale factor derived from GOES XRS-B daily minimumGOES_FLARE: Flare scale factor for each GOES XRS-B integrationFMTEMP: Flare model temperature [log10(K)] derived from ratio of GOES XRS-B to XRS-AFMINDEX: Index into flare model tableFMWEIGHT: Weight parameter for the flare model
SORCE XPS Level 4 Solar Spectral Irradiance 0.1nm Res 24-Hour Means V012 (SOR4XPSD_HIGH) at GES DISC
The SORCE XPS Level 4 Solar Spectral Irradiance 0.1nm Res 24-Hour Means product (SOR4XPSD_HIGH) contains modelled spectral extreme ultraviolet (XUV) irradiances based on calibrated SORCE XUV Photometer System (XPS) data and flare plasma temperature derived from the GOES XRS instrument. The model data are reported in the spectral range from 0-40 nm at a resolution of 0.1 nm (high res) and averaged over a day. The XPS Level 2 data products, along with CHIANTI reference spectra, are used to construct the XPS Level 4 data products.The SOR4XPSD_HIGH data are stored in netCDF files containing data for the entire mission. Data variables stored in the file include:MODELFLUX: Array of solar irradiances [W/m2/nm] in 0.1 nm bins from 0.1 to 39.9 nmERR_ABS: Total combined standard uncertainty of the model flux irradiance results (accuracy)ERR_MEAS: Count-rate based combined standard uncertainty of the XPS-1,-2 measurement (precision)DATE: Year and day-of-year of observation (YYDDD)TIME: Seconds of day for middle of observationXPS_QS: Daily quiet-sun scale factor derived from XPS-1,-2 daily minimumXPS_AR: Daily active-region scale factor derived from XPS-1,-2 daily minimumXPS_FLARE: Flare scale factor for each XPS-1,-2GOES_QS: Daily quiet-sun scale factor derived from GOES XRS-B daily minimumGOES_AR: Daily active-region scale factor derived from GOES XRS-B daily minimumGOES_FLARE: Flare scale factor for each GOES XRS-B integrationFMTEMP: Flare model temperature [log10(K)] derived from ratio of GOES XRS-B to XRS-AFMINDEX: Index into flare model tableFMWEIGHT: Weight parameter for the flare model
RSS-NET annotation files at XPS
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