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141 results for “thin films”
Scanning Precession Electron Tomography (SPET) for Structural Analysis of Thin Films along Their Thickness
<p> _______________________________________________________________________________<br> | General information: <br> |_______________________________________________________________________________<br> | Article | Scanning Precession Electron Tomography (SPET) for Structural Analysis <br> | | of Thin Films along Their Thickness <br> |<br> | Authors | Sara Passuti, Julien Varignon, Adrian David, Philippe Boullay <br> |<br> | Journal | Symmetry 2023, 15, 1459 <br> | <br> | DOI | 10.3390/sym15071459 <br> | <br> | Funding | NanED (www.naned.eu)(ESR project 12) <br> | <br> | Project Label | PVO_STO <br> | <br> | Sample Label | PVO_STO <br> | <br> | Dataset description | SPET (scanning precession electron tomography) acquisition on <br> | | the PVO thin film deposited on STO substrate, analyzed in section</p> <p>| | in the form of a TEM lamella. In the main folder the datasets</p> <p>| | corresponding to each one of the analyzed areas of the </p> <p>| | sample at different thicknesses (i.e. distances from the </p> <p>| | interface with the substrate) is found.<br> |______________________________________________________________________________<br> | Experimental <br> |_______________________________________________________________________________<br> | Data Type | Electron diffraction data - 3D ED <br> | <br> | Data collection method | SPET (Scanning Precession Electron Tomography) <br> | <br> | Number of experimental frames | 57 <br> | <br> | tilt range | -50.7° to +43.5° <br> | <br> | Exposure time per frame | 500 ms <br> | <br> | Software used for the data collection | ASI Accos <br> |______________________________________________________________________________<br> | Instrumental: |<br> |_______________________________________________________________________________|<br> | Instrument | Transmission electron microscope <br> | | Jeol F200 <br> | Radiation source | cold FEG <br> | <br> | Accelerating voltage | 200 kV <br> | <br> | Wavelength | 0.0251 Å <br> | <br> | Probe Type | Microdiffraction <br> | <br> | Beam Diameter | 10 nm <br> | <br> | Beam Convergence | Parallel beam, convergence <0.1mrad <br> | <br> | Detector | Hybrid pixel detector ASI Cheetah M3 <br> | <br> | Number of pixels in the image | 512 x 512 <br> | <br> | Pixel size | 55 µm x 55 µm <br> | <br> | Effective camera length | 200 mm <br> | <br> | Calibration constant | 0.00708 Å-1/pixel <br> |______________________________________________________________________________<br> | Sample description: <br> |_______________________________________________________________________________<br> | Name | PVO thin film on STO substrate <br> | | at thickness = 0.52 nm <br> | | film deposited by SPS and cut by FIB <br> | <br> | Chemical composition | PrVO3, SrTiO3 <br> | <br> | Number of crystals contributing | 1 <br> | to the data set <br> |______________________________________________________________________________<br> | Authorship and bibliography <br> |_______________________________________________________________________________<br> | Author of the data | Sara Passuti (ESR 12) <br> | <br> | Related data <br> | <br> |______________________________________________________________________________<br> | Files and data formats <br> |_______________________________________________________________________________<br> | Image format | tiff_16bit <br> | <br> | Folders/files | layer_#1_0.52_nm <br> | | layer_#2_3.28_nm <br> | | layer_#3_4.20_nm <br> | | layer_#4_5.12_nm <br> | | layer_#5_7.88_nm <br> | | layer_#6_9.72_nm <br> | | layer_#7_12.48_nm <br> | | layer_#8_17.08_nm <br> | | layer_#9_29.08_nm <br> | | substrate <br> | | each of the folders contains the respective "tiff" folder containing <br> | | the diffraction patterns in tiff format and the files for the analysis,<br> | | as well as the metadata file with the specific information of the <br> | | dataset <br> ______________________________________________________________________________<br> Notes: <br> _______________________________________________________________________________</p>
LATTE LAO thin films luminescence
<p>LATTE LAO thin films luminescence</p>
Dataset for "Impact of surface anisotropy on the spin-wave dynamics in thin ferromagnetic film"
<p>The dataset consist of the data used to prepare the figures for the manusript entitled <em>Impact of surface anisotropy on the spin-wave dynamics in thin ferromagnetic film.</em> </p> <p>Please read README.txt file to see the description of the data in the files.</p>
Strain, Young's modulus, and structural transition of EuTiO3 thin films probed by micro-mechanical methods (Dataset)
<p>Datafiles of the Article "Strain, Young’s modulus, and structural transition of EuTiO3 thin films probed by micro-mechanical methods (Dataset)"</p>
Open data of Control of damping in perpendicularly magnetized thin films using spin-orbit torques
<p>Open access data set for manuscript "Control of damping in perpendicularly magnetized thin films using spin-orbit torques" published in Physical Review B, <strong>101</strong>, 224401 (2020)</p>
Data for the article "Skyrmion Lattice Phases in Thin Film Multilayer"
<p>Data for the article "Skyrmion Lattice Phases in Thin Film Multilayer" (<a href="https://arxiv.org/abs/2004.09244">[2004.09244] Skyrmion Lattice Phases in Thin Film Multilayer (arxiv.org)</a>)</p>
Data for the article "Identification of Néel vector orientation in antiferromagnetic domains switched by currents in NiO/Pt thin films"
<p>Data for the article "Identification of Néel vector orientation in antiferromagnetic domains switched by currents in NiO/Pt thin films" (<a href="https://arxiv.org/abs/2008.08507">[2008.08507] Identification of Néel vector orientation in antiferromagnetic domains switched by currents in NiO/Pt thin films (arxiv.org)</a>)</p>
Tuning CH3NH3Pb(I1-xBrx)3 Perovskite Oxygen Stability in Thin Films and Solar Cells
<p>The rapid development of organic-inorganic lead halide perovskites has resulted in high efficiency photovoltaic devices. However the susceptibility of these devices to degradation under environmental stress has so far hindered commercial development, requiring for example expensive device encapsulation. Herein, we have investigated the stability of CH3NH3Pb(I1-xBrx)3 [x = 0..1] thin film and solar cells under controlled humidity, light, and oxygen conditions. We show that higher bromide ratios increases tolerance to moisture, with x = 1 thin films being stable to 120 hr of moisture stress. Under light and dry air, partial bromide (x < 1) subsitution does not enhance film stability significantly, with the corresponding solar cells degrading within two hours. In contrast CH3NH3PbBr3 films show excellent stability, with device stability being limited by the organic interlayer. For these x = 1 films we show charge carriers are quenched in the presence of oxygen and form superoxide; however in contrast to perovskites containing iodide, this superoxide does not degrade the crystal. Our observations show that iodide limits the oxygen and light stability of CH3NH3Pb(I1-xBrx)3 perovskites, but that CH3NH3PbBr3 provides an opportunity to develop inherently stable high voltage photovoltaic devices and 4-terminal tandem solar cells.</p>
Oxidation of thin films at the air-water interface of atmospheric aerosol
<p>X-ray reflectivity data (reflectivity vs Q) for the oxidation of insoluble organic material at the air-water interface. The organic material was extracted from atmospheric aerosol and sea water samples. The organic material was reacted with gas-phase ozone and aqueous phase hydroxyl radicals. The reflectivity data was collected at the Diamond Light source on I07 in May 2013 (SI8744) and April 2014 (SI9632) funded by STFC and NERC. The data supports a publication in Atmospheric Environment entitled “Are organic films from atmospheric aerosol and sea water inert to oxidation by ozone at the air-water interface?"</p>
Grid-type transparent conductive thin films of carbon nanotubes as capacitive touch sensors
<p>This dataset contains the measurement data for figures (graphs) published in journal article:</p><p>Grid-type transparent conductive thin films of carbon nanotubes as capacitive touch sensors</p><p>by Ronja Valasma, Eva Bozo, Olli Pitkänen, Topias Järvinen, Aron Dombovari, Melinda Mohl, Gabriela Simone Lorite, Janos Kiss, Zoltan Konya and Krisztian Kordas</p><p>Published 11 May 2020 • © 2020 The Author(s). Published by IOP Publishing Ltd</p><p>Nanotechnology, Volume 31, Number 30</p><p>Citation: Ronja Valasma et al 2020 Nanotechnology 31 305303</p><p>DOI 10.1088/1361-6528/ab8590</p>
Data for "Laser Nanostructured Metasurfaces in Nb Superconducting Thin Films"
<p>Dataset for the article entitled "Laser Nanostructured Metasurfaces in Nb Superconducting Thin Films", submitted to the journal Applied Surface Science.</p><p>Contains original experimental data:</p><p>- SEM images with EDS</p><p>- TEM images</p><p>- SQUID magnetic measurements</p>
Data supplement for "Drops on polymer brushes – advances in thin-film modelling of adaptive substrates"
<p>This dataset contains supplementary data for the following publication:</p> <p>Hartmann, S., Diekmann, J., Greve, D., and & Thiele, U.<br>Drops on polymer brushes – advances in thin-film modelling of adaptive substrates<br><span><em>Langmuir</em></span> <span>2024</span><span>, 40</span><span>, 8</span><span>, 4001–4021</span></p> <p>We provide the source files and data for figures 3-15.</p>
Flat thin films forward simulations (Complex fresnel rs and rp). Rough thin film of sio2, sweeped in thickness about 1micron (Intensity and raw rs and rp.) Both as measured with 0 to NA = 0.9 angles.
<p>This dataset is part of a project under the ATMOC consortium, involving case studies of various simple one-material layers and their optical properties, particularly focusing on their interaction with light in terms of reflectivity. It encompasses samples , studied by institutions like UT Twente, IMEC, and CEA. These samples include flat surfaces coated with materials like Si, Mo, Ru, Al, Ru, Ni, Mo, Nb, Pt, Ta, Cr, TiN, and and rough thermal SiO2 on Si wafers, with thicknesses ranging from a few nanometers to several micrometers, applied through processes like PVD deposition and thermal oxidation at high temperatures.</p> <p>The dataset leverages refractive index data from the online resource "refractiveindex.info" to simulate the optical properties of these layers. The reflection of light is primarily determined by the Fresnel reflection coefficient, with additional simulations for rough surfaces using JCMWave's Finite Element Method (FEM) to understand the effects of surface roughness on light reflection. Primary setup it represents is prototype of Coherent Fourier Scatterometry (typically used for critical parameters of grating reconstruction|).</p> <p>Data are stored in .mat and .csv formats, with MATLAB scripts for generating visualizations of the model results, such as pcolor plots of intensity reflections based on variables like cover thickness and k-axis normalization. Python examples are also provided for loading and visualizing the data. The datasets aim to offer a comprehensive understanding of the optical properties of these materials and structures, supporting the development of standards and models for optical measurements and applications. Additionally, the dataset includes references to further studies and methodologies, such as the T-matrix approach and the Fabry-Perot formula extension, indicating a scholarly foundation in optical physics and engineering research.</p>
XPS measurements on long-term stability of organic radical thin films
<p>XPS raw data underlying Figures 1, 2, and 3 from the publication "Long-Term Degradation Mechanisms in Application-Implemented Radical Thin Films" (DOI: 10.1021/acsami.3c02057).</p>
Engineering of intrinsic chiral torques in magnetic thin films based on the Dzyaloshinskii-Moriya interaction
<p>Open data for <strong>Engineering of intrinsic chiral torques in magnetic thin films based on the Dzyaloshinskii-Moriya interaction</strong></p>
Cation non-stoichiometry in Fe:SrTiO3 thin films and its effect on the electrical conductivity
<p>This dataset contains raw data and figures used in the publication: <a href="https://doi.org/10.1039/D1NA00358E">https://doi.org/10.1039/D1NA00358E</a></p>
RAW data for Correlation analysis of vibration modes in physical vapour deposited Bi2Se3 thin films probed by the Raman mapping technique
<p>Raw data for the "Correlation analysis of vibration modes in physical vapour deposited Bi2Se3 thin films probed by the Raman mapping technique" paper.</p>
Prediction and realisation of high mobility and degenerate p-type conductivity in CaCuP thin films Dataset
<p>Experimental and computational datasets for this publication, including README files. To unzip, in the command line paste the following command:</p> <blockquote> <p>tar -xzvf cacup_data_repository_v2.tar.gz</p> </blockquote> <p>And repeat the command:</p> <blockquote> <p>tar -xzvf <file.tar.gz></p> </blockquote> <p>for each necessary tar file.</p> <p>For any issues with accessibility, please email joe.willis.15@ucl.ac.uk.</p>
Determination of sub-ps lattice dynamics in FeRh thin films
<p>Open Access Data for "Determination of sub-ps lattice dynamics in FeRh thin films" published in Scientific Reports <strong>12</strong>, 8584 (2022)</p> <p>https://doi.org/10.1038/s41598-022-12602-w</p> <p> </p> <p>Raw data from the XFEL experiment are accessible at https://doi.psi.ch/detail/10.16907%2F85ff2f32-f561-4413-a02a-74abc65cc82b</p>
XPS measurements of thin film on SiO2/Si(111) and powder samples (In-foil) of di-cyano-substituted tetrazolinyl radical
<p>XPS raw data underlying Figure 10 from the publication "Thermally Ultrarobust S = 1/2 Tetrazolinyl Radicals: Synthesis, Electronic Structure, Magnetism, and Nanoneedle Assemblies on Silicon Surface" (DOI: 10.1021/jacs.3c03402)</p>
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OpenNeuro
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