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50 results for “XPS”
XPS spectra for Li intercalated few-layer MoS2 films
<h3>Description</h3> <p>Dataset for synchrotron-based x-ray photoelectron (XPS) spectra of Li doped MoS<sub>2</sub> nanofilms grown on c-plane sapphire substrate by two techniques: thermally assisted conversion (TAC) and pulsed laser deposition (PLD). Reference spectra for undoped MoS<sub>2</sub> were measured on a commercial MoS<sub>2</sub> powder sample.</p> <p> </p> <p><strong> Data formats</strong></p> <p>The XPS datasets are available in two formats.</p> <ol> <li><a href="https://doi.org/10.1002/sia.740130202">VAMAS</a> (ASCII ISO 14976).</li> <li>Plain text column files: Double-column files (dat) and corresponding metadata files (txt).</li> </ol>
BAM reference data: XPS raw data of Al-coated titania nanoparticles (JRCNM62001a and JRCNM62002a)
<p>The raw data are given as VAMAS-File. The measurement condtions are given in the file. The C1s-fits are provided as ascii-files.</p> <p>For further information please look at Radnik, J. Kersting, R., Hagenhoff, B., Bennet, F., Ciornii, D.; Nymark, P., Grafström R. and Hodoroaba, V.-D. <em>Nanomaterials </em><strong>2021</strong>, <em>11</em>, 639. https://doi.org/10.3390/nano11030639.</p> <p>The transmission function is obtained as ascii-file trm.dat. The energy scale is kinetic energy.</p> <p> </p> <p>Measurement conditions:</p> <p>XPS measurements were performed at an Axis Ultra DLD (KRATOS, Manchester, UK) with monochromatic Al K radiation (E = 1486.6 eV). The electron emission angle was 0° and the source-to-analyzer angle was 60°. The binding energy scale of the instrument was calibrated following a Kratos analytical procedure, which uses ISO 15472 binding energy data. The setting of the instrument was the hybrid lens mode and the slot mode with an analysis area of approximately 300x700 m². Furthermore, charge neutralization with a flood gun was used. All spectra were recorded in the fixed analyzer transmission (FAT) mode. The samples were measured as powders prepared on a special stainless-steel sample holder.</p> <p> </p> <p> </p> <p> </p>
Coverage-Dependent Stability of RuxSiy on Ru(0001): A Comparative DFT and XPS Study
<p>This repository contains the library of computational structures generated and used for our study "<span>Coverage-dependent stability of Ru<sub><span>x</span></sub>Si<sub><span>y</span></sub> on Ru(0001): a comparative DFT and XPS study</span>" (<a title="Link to landing page via DOI" href="https://doi.org/10.1039/D4CP04069D">https://doi.org/10.1039/D4CP04069D</a>). The final processed data is compiled into a single ASE-compatible database file (https://wiki.fysik.dtu.dk/ase/ase/db/db.html), `RuSi-PCCP-Data.db`.<br><br></p> <p> </p>
XPS and XANES spectra for Li doped MoS2 few-layer films
<p><strong>Description</strong></p> <p>Dataset for x-ray photoelectron (XPS) and absorption near-edge structure (XANES) spectra of Li doped MoS<sub>2</sub> nanofilms grown by one-zone sulfurization on c-plane sapphire substrate.</p> <p> </p> <p><strong>XPS Data formats</strong></p> <p>The same XPS datasets are saved into two different data formats.</p> <ol> <li><a href="https://doi.org/10.1002/sia.740130202">VAMAS</a> (ASCII ISO 14976)</li> <li>Plain text column files: Double-column files (dat) and corresponding metadata files (txt)</li> </ol> <p> </p> <p><strong>XANES Data formats</strong></p> <ol> <li>XDI (<a href="http://github.com/XraySpectroscopy/XAS-Data-Interchange">XAS Data Interchange</a>): raw XANES data</li> <li>PRJ (Athena Project File): normalized XANES data processed in <a href="http://bruceravel.github.io/demeter/">ATHENA free software package.</a></li> </ol> <p> </p>
Benzonitrile on Si(001). XPS, NEXAFS, and STM data. Accepted for publication in PCCP Sept. 2016
<p>This data set contains original XPS and NEXAFS data collected at the Australian Synchrotron. The data are the results of experiments investigating benzonitrile adsorption to the Si(001) surface. The results were written up and have been accepted for publication in Physical Chemistry Chemical Physics in Sept. 2016. The publication date is not yet known. </p>
Datasets of VAMAS TWA2 Project 33: Chemical characterization of graphene related two-dimensional materials by XPS
<p>The datasets contain excel-files of the XPS raw data of the participants of the interlaboratory comparison. Additionally, the protocol is added.</p>
XPS measurements on long-term stability of organic radical thin films
<p>XPS raw data underlying Figures 1, 2, and 3 from the publication "Long-Term Degradation Mechanisms in Application-Implemented Radical Thin Films" (DOI: 10.1021/acsami.3c02057).</p>
NFFA-Europe|Pilot proposal "Resolving Local Coordination of Doped-Carbon Supported Soft-Landed Metal Nanoparticles For CO2 Electroreduction" (PID: 159). XPS data.
<p>XPS data of copper oxide nanoparticles synthesized withtin the NFFA-Europe|Pilot proposal "Resolving Local Coordination of Doped-Carbon Supported Soft-Landed Metal Nanoparticles For CO2 Electroreduction” (PID: 159).</p>
XPS measurements of thin film on SiO2/Si(111) and powder samples (In-foil) of di-cyano-substituted tetrazolinyl radical
<p>XPS raw data underlying Figure 10 from the publication "Thermally Ultrarobust S = 1/2 Tetrazolinyl Radicals: Synthesis, Electronic Structure, Magnetism, and Nanoneedle Assemblies on Silicon Surface" (DOI: 10.1021/jacs.3c03402)</p>
Bromine Adsorption and Thermal Stability on Rh(111): A Combined XPS, LEED and DFT Study [doi: 10.1002/cphc.202300510]
<p>Primary data, meta data, and corresponding lists of figures & tables are included. [doi: 10.1002/cphc.202300510]</p>
XPS, HAXPES, XRD and SEM datasets of functionalized graphene nanoplateletes
<p>The datasets from (Hard Energy) X-ray photoelectron spectroscopy, X-ray diffraction and Scanning Electron Microsopy are related to the publication </p> <p>G. Chemello, X. Knigge, D. Ciornii, B.P. Reed, A.J. Pollard, C.A. Clifford, T. Howe, N. Vyas, V.-D. Hodoroaba, J. Radnik</p> <p>"Influence of the morphology on the functionalization of graphene nanoplatelets analyzed by comparative photoelectron spectroscopy with soft and hard X-rays"</p> <p><em>Advanced Materials Interfaces </em>(2023), DOI: 10.1002/admi.202300116.</p> <p>Details of the materials and the experimental procedures are described in this publications. </p> <p>The filenames contain the material (g5 or g6), functionalization (Fluorine -f, Oxygen _o and raw material _raw), methods (XPS/HAXPES survey or high resolution, XRD, SEM). For the fitted spectra the peak is given: c1s, o1s, f1s. </p> <p>The data are given as tif-files for SEM (*tif). as asc ii files for XRD (*.xy) and the fitted XPS/HAXPES-spectra (*.dat) and as vamas data files for the XPS/HAXPES raw-data (*.npl).</p> <p> </p>
Physico-chemical characterization of sterilized TiO2 D540 nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>TiO<sub>2</sub> D540 nanoparticles, which are TiO<sub>2 </sub>particles, with a diameter of about 540nm, were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifier in the project: ERM00000415, ERM00000457, ERM00000436).</p> <p>The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA.</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment,</em> with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave.</p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
Physico-chemical characterization of sterilized Ce0.25Zr0.75O2 nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>Ce<sub>0.25</sub>Zr<sub>0.75</sub>O<sub>2</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifier in the project: ERM00000402, ERM00000444, ERM00000423).</p> <p>The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA.</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave.</p> <p> </p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
Physico-chemical characterization of sterilized Ce0.75Zr0.25O2 nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>Ce<sub>0.75</sub>Zr<sub>0.25</sub>O<sub>2</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifiers in the project: ERM00000400, ERM00000442, ERM00000421).</p> <p>The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA.</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave.</p> <p> </p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
Physico-chemical characterization of sterilized Ce0.5Zr0.5O2 nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>Ce<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifier in the project: ERM00000401, ERM00000443, ERM00000422).</p> <p>The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA.</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave.</p> <p> </p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
Physico-chemical characterization of sterilized ZrO2 nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>ZrO<sub>2</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifier in the project: ERM00000404, ERM00000446, ERM00000425).</p> <p>The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA.</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave.</p> <p> </p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
Physico-chemical characterization of sterilized TiO2 PVP nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>TiO2 PVP nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifier in the project: ERM00000414, ERM00000456, ERM00000435).</p> <p>The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA.</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave.</p> <p> </p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
Physico-chemical characterization of sterilized AlOOH nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>AlOOH nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifiers in the project: ERM00000396, ERM00000438, ERM00000417).</p> <p>The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA.</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave.</p> <p> </p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
Physico-chemical characterization of CeO2/Co3O4 nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>CeO<sub>2</sub>/Co<sub>3</sub>O<sub>4</sub> nanoparticles were provided by Promethean Particles (EMR identifier in the project: ERM00000397).</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "p" for pristine.</p> <p> </p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
Physico-chemical characterization of sterile Fe3O4 nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>Sterile Fe<sub>3</sub>O<sub>4</sub> nanoparticles were synthesized under aseptic conditions at Mintek, South Africa (EMR-Identifier in the project: ERM00000583).</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "p" for pristine.</p> <p> </p> <p>The authors thank Thorid Lange, who performed the SEM measurements.</p>
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The International Brain Laboratory public data releases expose standardized mouse decision-making experiments, including Neuropixels recordings, widefield calcium imaging, behavior, and session metadata accessed through the ONE API.
OpenNeuro
OpenNeuro is a free, open platform for sharing neuroimaging datasets, with public search, dataset pages, and download paths for web, S3, DataLad, and the OpenNeuro CLI.