zenodoopen
Imaging ellipsometry on exfoliated GaS on sapphire substrate
<p>Delta and Psi maps measured for wavelengths 200 nm to 900 nm with an Accurion EP4 ellipsometer.</p> <p>Ellipsometric enhanced contrast micrograph of the measured region - map.jpg</p> <p>Plotted Delta and Psi maps for 2, 2.5, 3, 3.2 and 3.5 eV are included.</p>
ShareScore
40/100
Overall dataset sharing score
Score breakdown
These five areas show where the dataset supports — or may limit — practical reuse.
- Stewardship
- 4
- Harmonization
- 4
- Access
- 20
- Reuse readiness
- 8
- Engagement
- 4
Dataset details
- Repository
- zenodo
- Published
- February 9, 2022
- License
- cc-by-4.0
- DOI
- 10.5281/zenodo.6034896
Scored with release 0.9.0
ScienceDex for faculty
Your academic CV and NIH biosketch
Make your CV in your school's format and your NIH biosketch from it, then download both as Word files.