Validating x-ray line-profile defect analysis using atomistic models of deformed material

<p>Data and analysis (scripts and Jupyter notebooks) associated with publications:</p> <p>Validating x-ray line-profile defect analysis using atomistic models of deformed material (submitted to Physical Review Materials)</p> <p>Validation of x-ray line-profile analysis of extended defects in deformed crystals (submitted to Physical Review Letters)</p> <p>Preprints of these papers are included here</p>