VMM Noise Measurement Data

<p>This release contains measured data to study the noise of VMM3a readout chips,<br> which are intended to be used in the front-end readout system of a Triple-GEM detector.<br> Their noise is characterised both in term of RMS output voltage and the equivalent noise<br> charge (ENC). The dependence of the noise on a variety of operation parameters, including<br> peaking time and gain factor, are also studied.<br> The measurements have been performed by Emorfili Terzimpasoglou as part of her<br> Master Thesis &rdquo;Investigation on the ASIC for Triple-GEM Detectors&rdquo; at the University<br> of Bonn.</p>