SEM-BSE and Photomicrographs of Slickenlines from Plan de Platanos, Big Piute and Waterman Hill Faults

<p>Photomicrographs and energy dispersive X-ray spectroscopy&nbsp;of Plan de Platanos (<strong>PP</strong>), Big Piute (<strong>BP</strong>) and Waterman Hill (<strong>WH</strong>) Fault Slickenlines</p> <p><strong>PP</strong>---&gt; composition----&gt;andesite</p> <p><strong>BP</strong>---&gt; composition -----&gt;quartzite</p> <p><strong>WH</strong>---&gt;composition&nbsp;-----&gt;mylonitized metasediments</p> <p><strong>Abbreviations:</strong></p> <ul> <li><strong>ppl-</strong>-----&gt;plane polarized light</li> <li><strong>xpl-</strong>-----&gt;plane polarized light</li> </ul> <p><strong>Orientation:&nbsp;</strong>We use Tikoff et al (2019) naming convention for thin section orientation.</p> <ul> <li><strong>XZ-</strong>-parallel to lineations</li> <li><strong>YZ-</strong>-perpendicular to lineations</li> </ul> <p><strong>Instruments:</strong></p> <ul> <li>ZEISS AX10 Petrographic microscope</li> <li>ZEISS Merlin HR-SEM with backscattered electron (BSE) sensor and&nbsp;energy dispersive X-ray spectroscopy (EDS)</li> </ul> <ul> </ul> <p>&nbsp;</p> <p>Tikoff, B., Chatzaras, V., Newman, J., &amp; Roberts, N. M. (2019). Big data in microstructure analysis: Building a universal orientation system for thin sections. Journal of Structural Geology, 125, 226&ndash;234. https://doi.org/10.1016/j.jsg.2018.09.0</p>