Spectroscopic ellipsometry mapping of PAAO (AJ-8-03-31 sample)

<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO). The sample was made by anodization of aluminum polycrystal in 0.3 mol/L oxalic acid at 40 V for 5 minutes and 4 seconds.</p> <p>The measurements were carried out at 20 &times; 20 locations covering all of the sample surface (approximately 4.8 &times; 4.8 mm²). The coordinates of each of 400 locations are available in &quot;mapping_points.csv&quot; file. All measurement data is also included in a single &quot;AJ-8-03-31 Ellipsometry Mapping Measurements.rar&quot; file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 50&deg;, 55&deg;, 60&deg;, 65&deg;, 70&deg;, 75&deg;.</p> <p>Light beam size: microspot (365 &times; 470 &mu;m² at 75&deg; angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method after being covered with hydrogenated amorphous diamond-like carbon and silver nanocomposite. The data can be found here: <a href="https://doi.org/10.5281/zenodo.7260186">https://doi.org/10.5281/zenodo.7260186</a></p>