In situ clamped beam bending of accumulative roll bonded Cu/Nb with 63 nm individual layer thickness

<p>In situ scanning electron microscope (SEM) videos of clamped beam bending of Cu/Nb ARB nanolaminates with 63 nm layer thickness. Each video contains the video captured with SEM and the corresponding measured load vs. displacement curve.</p> <p>The beams were fabricated using focused ion beam (FIB) milling from bulk Cu/Nb sample produced in Los Alamos National Lab, USA. The sample was made using accumulative roll bonding (ARB) process, described in ref. [1].&nbsp;</p> <p>All the beam lengths are aligned either with rolling direction (RD) of the sample of transfer direction of the sample (TD). RD and TD are used to denote the beam length direction in the videos and the table below. Each beam has&nbsp;a rectangular notch located in the center of the beam length. Each notch spans through the beam width. &nbsp;Owing to limited accuracy of FIB, the notch depth was not always same at the front and rear sides of the beam (typically, smaller at the rear sides)</p> <p>Beam geometries:</p> <p>Id | Length,&nbsp;&micro;m | Width,&nbsp;&micro;m | Thickness,&nbsp;&micro;m | Notch depth (front), nm | Notch width (front), nm</p> <p>RD1 | 42 | 5.4 | 4.4 | 1100 | 100</p> <p>RD2 | 20 | 2.8 | 3.1 | 1200 | 300</p> <p>RD3 | 21 | 3 | 2.2 | 700 | 100</p> <p>TD1 | 40 | 4.8 | 5 | 1000 | 250</p> <p>TD2 | 20 | 3 | 2.5 | 700 | 230&nbsp;</p> <p>TD3 | 19 | 3.3 | 3 | 900 | 300</p> <p>TD4 | 19 | 3.5 | 2.6 | 750 | 360</p> <p>All the beams were loaded using Hysitron PI85 picoindenter with truncated cone shape (5&nbsp;&micro;m diameter). The indenter tip was aligned with the notch location and the middle of beam width. RD3 beam had some misalignment along the width.</p> <p>All the beams, except RD3 beam, were loaded under displacement control with displacement rates between 5nm/s to 10nm/s until failure. RD3 beam was loaded under load control with loading rate ~33&micro;N/s. &nbsp;</p> <p>The SEM videos were captured using&nbsp;JEOL JSM-7600F SEM.&nbsp;</p> <p>[1]&nbsp;Irene J Beyerlein et al. &ldquo;Interface-driven microstructure development and ultra high strength of bulk nanostructured Cu-Nb multilayers fabricated by severe plastic deformation&rdquo;. In: Journal of materials research 28.13 (2013), pp. 1799&ndash;1812</p>