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2 results for “nanolaminate”
Data repository for "Interface rotation in Cu/Nb accumulative roll bonded (ARB) nanolaminates"
<p>Data repository for "Interface rotation in Cu/Nb accumulative roll bonded (ARB) nanolaminates"</p> <p>This repository contains raw experimental data for "Interface rotation in Cu/Nb accumulative roll bonded (ARB) nanolaminates" manuscript. Please refer to the manuscript for the data interpretation.</p> <p>The repository structure:</p> <ul> <li><code>CuNbARB-sample-photo.jpg</code> shows a photograph of as-received Cu(63nm)/Nb(63nm) accumulative roll bonded (ARB) nanolaminate sample</li> <li><code>ARB_63nm_DRX</code> contains X-ray diffraction measurements</li> <li><code>RD/TDXFIBmilling</code> folders contain focused ion beam images captured during pillar milling <ul> <li>In <code>RDX/TDX</code>, <code>X</code> refers to pillar number (see Supplementary information.org for the full pillar list). The numbers in the file names inside refer to the corresponding pillars.</li> </ul> </li> <li><code>RD/TDXSEMbefore</code> folders contain scanning electron (SEM) images of the as-fabricated pillars</li> <li><code>RD/TDX-compression</code> folders contain in situ pillar compression data, including some of the SEM images captured before/after the compression, raw load-displacement data (in <code>.hys</code> native Hysitron piconindenter format), load-displacement data exported to raw text (see Supplementary information for examples how to plot load-displacement using the raw text files), SEM videos, SEM videos combined with the load-displacement data, and accelerated videos</li> <li><code>RD/TDX-SEMafter</code> folders contain SEM images of the compressed pillars</li> <li>Supplementary-info folder contains supplementary information</li> </ul> <p>Author: I. Radchenko, W. Zhu, L. Qing, E. Navarro, R. Sahay, P.S. Lee, N. Raghavan, O. Thomas, A.S. Budiman, K. Chen</p>
In situ clamped beam bending of physical vapor deposited Cu/Nb nanolaminate with 20 nm individual layer thickness
<p>In situ scanning electron microscope (SEM) videos of clamped beam bending of Cu/Nb PVD nanolaminate with 20 nm layer thickness and 42+-10 nm grain size at the surface layer. Each video contains the video captured with SEM and the corresponding measured load vs. displacement curve.</p> <p>The beams were fabricated using focused ion beam (FIB) milling from the Cu/Nb sample produced in Los Alamos National Lab, USA. The sample was made using magnetron sputtering, described in ref. [1]. </p> <p>Each beam has a rectangular notch located in the center of the beam length. Each notch spans through the beam width. Owing to limited accuracy of FIB, the notch depth was not always same at the front and rear sides of the beam (typically, smaller at the rear sides)</p> <p>Beam geometries:</p> <p>Id | Length, µm | Width, µm | Thickness, µm | Notch depth (front), nm | Notch width (front), nm</p> <p>PVD1 | 29 | 5 | 1.6 | 380 | 120</p> <p>PVD2 | 29 | 5 | 1.5 | 290 | 305</p> <p>All the beams were loaded using Hysitron PI85 picoindenter with truncated cone shape (5 µm diameter). The indenter tip was aligned with the notch location and the middle of beam width. </p> <p>All the beams were loaded under displacement control with displacement rates between 2nm/s to 10nm/s until failure.</p> <p>The SEM videos were captured using JEOL JSM-7600F SEM. </p> <p>[1] D. Bhattacharyya et al. “Transmission electron microscopy study of the deformation behavior of Cu/Nb and Cu/Ni nanoscale multilayers during nanoindentation”. In: Journal of Materials Research 24.3 (2009), pp. 1291-1302. </p>
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OpenNeuro
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