GaN Stripes EBSD

<p>Raw EBSD Data for a&nbsp;GaN thin film sample with changing polarities and crystal structures as published in:</p> <p>Point-Group Sensitive Orientation Mapping Using EBSD. Winkelmann A., Nolze G., Himmerlich M., Lebedev V., Reichmann A. (2016) In: Holm E.A. et al. (eds) Proceedings of the 6th International Conference on Recrystallization and Grain Growth (ReX&amp;GG 2016). Springer. The data was measured by G.Nolze, the sample was provided by V. Lebedev and M. Himmerlich<br> <a href="https://doi.org/10.1007/978-3-319-48770-0_41">https://doi.org/10.1007/978-3-319-48770-0_41</a></p> <p>The data in&nbsp;<a href="https://zenodo.org/api/files/0f9f0014-75e7-4f63-bf8d-1636448101a8/static_bam_ef.txt?versionId=9ca597c9-edd1-486d-b542-00a5dd1edf72">static_bam_ef.txt&nbsp;</a>&nbsp;is a&nbsp;static EBSD background image (taken from a different experiment with the same detector)</p>