Statistical aspects of interface adhesion and detachment of hierarchically patterned structures: dataset
<p><strong>Data from:</strong></p> <p>N. Esfandiary, M. Zaiser, P. Moretti: Statistical aspects of interface adhesion and detachment of hierarchically patterned structures (2022) Journal of Statistical Mechanics: Theory and Experiment 023301,<br> https://doi.org/10.1088/1742-5468/ac52a4</p> <p> </p> <p><strong>Abstract:</strong></p> <p>We introduce a three dimensional model for interface failure of hierarchical materials adhering to heterogeneous substrates. We find that the hierarchical structure induces scale invariant detachment patterns, which in the limit of low interface disorder prevent interface failure by crack propagation ('detachment fronts'). In the opposite limit of high interface disorder, hierarchical patterns ensure enhanced work of failure as compared to reference non-hierarchical structures. While the study of hierarchical adhesion is motivated by examples of fibrous materials of biological interest, our results indicate that hierarchical patterns can be useful in engineering scenarios in view of tuning and optimizing adhesion properties.</p> <p> </p> <p><strong>Contact:</strong></p> <p>Paolo Moretti<br> Institute of Materials Simulation<br> Friedrich-Alexander-Universität Erlangen-Nürnberg<br> Dr.-Mack-Str. 77<br> 90762 Fürth<br> Germany</p> <p> </p> <p><strong>File naming scheme:</strong></p> <p>hfn: hierarchical fuse network<br> rrn: random reference network</p> <p>uni: uniform threshold distribution <br> wei15: Weibull threshold distribution (shape factor 1.5)<br> wei4: Weibull threshold distribution (shape factor 4)<br> wei9: Weibull threshold distribution (shape factor 9)</p> <p>s1: largest connected components<br> s2: 2nd largest connected components<br> iv: sample iv curve<br> envelope: envelope of iv (displacement control)</p>
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