Medium-definition electron diffraction patterns and their indexation results of a polycrystal Ni sample

<p>This dataset of 33750 medium-resolution (228&times;320) electron diffraction patterns are acquired from an unstrained polycrystal Ni sample. Traces of scratches are visible in the indexation results. The sample tilt angle is 70&deg;, acceleration voltage 20kV, and the step size 0.61 &micro;m. The indexation results, in format &#39;mat&#39; of Matlab, by Hough indexation, IDIC6&amp;3 and IDIC-G6&amp;3&nbsp;are also provided. For each diffraction pattern, 6 parameters calibrated by IDIC and IDIC-G are stocked, i.e. the Euler angle triplet (expressed in radians and with reference&nbsp;to&nbsp;the EBSD detector) and the coordinates of the projection center.</p>