zenodoopen
Electron beam damage to Topological Insulators
<p>Transport data, point spread functions, and analysis code accompanying "Low-damage electron beam lithography for nanostructures on Bi<sub>2</sub>Te<sub>3</sub>-class topological insulator thin films."</p>
ShareScore
36/100
Overall dataset sharing score
Score breakdown
These five areas show where the dataset supports — or may limit — practical reuse.
- Stewardship
- 4
- Harmonization
- 4
- Access
- 16
- Reuse readiness
- 8
- Engagement
- 4