Ion Intercalation in Lanthanum Strontium Ferrite for Aqueous Electrochemical Energy Storage Devices

<p>Dataset for the article: Tang et al.&nbsp;<em>ACS Appl. Mater. Interfaces</em>&nbsp;2022, 14, 16, 18486&ndash;18497.</p> <p>The dataset contains:</p> <ul> <li>&quot;CV&quot;: Cycle Voltammetry of La0.5Sr0.5FeO3-&delta; thin films in 0.1 M KOH solution (scan rate 0.5 mV/s)..</li> <li>&quot;Defect Model Fitting&quot;: Equilibrium concentration of oxygen vacancies, protons (OH^.), Fe⁴⁺&nbsp;calculated by the defect chemistry model in LSF50 as a function of the electrochemical potential applied in the solution.</li> <li>&quot;ex-situ_optical conductivity N2 reduced and post K&quot;: Optical conductivity vs photon energy measured in a sample reduced in N2 and the same sample after a post oxidation&nbsp;in KOH.</li> <li>&quot;in situ_differential charge.rar&quot; Differential charge measured by ellipsometry and electrochemical current during the in-situ experiments</li> <li>&quot;in situ_optical conductivity.rar&quot;: Optical conductivity of LSF thin films vs photon energy measured after the application of the different potentials in the in-situ experiments. Potential applied are reported in the name of the txt files.</li> <li>&quot;in-situ-exp_Optical conductivity and Fe4+ vs E app&quot;: Evolution of the optical conductivity at 2eV and calculated Fe4+ concentration vs equilibrium electrochemical potential applied in the in-situ experiments.</li> <li>&quot;in-situ-exp_time-potential-current.txt&quot; Current measured in the in-situ experiments after the application of electrochemical potentials as a function of time.</li> <li>&quot;optical conductivity ex situ.rar&quot; Ex-situ optical conductivity spectra of LSF thin films oxidized and reduced in different enviroments (N2, O2 and electrochemically in KOH).</li> <li>&quot;PALS.rar&quot; Average lifetime of positrons measured in Positron Annihilation Lifetime Spectroscopy for the LSF thin films oxidized and reduced in different enviroments (N2, O2 and electrochemically in KOH).</li> <li>&quot;SIMS_Oh- and H- intensity.txt&quot;&nbsp;ToF-SIMS depth profiles of H- and OH- ions intensities for the KOH-reduced sample vs sputtering time.</li> <li>&quot;VE-PALS.rar&quot; First, second and third component of the positron lifetime, errors and relative intensities measured by Variable Energy Positron Annihilation Lifetime Spectroscopy&nbsp;for the LSF thin films oxidized and reduced in different enviroments (N2, O2 and electrochemically in KOH).</li> <li>&quot;XRD.rar&quot; X-Ray Diffraction patterns of the LSF thin&nbsp;films oxidized and reduced in different enviroments (N2, O2 and electrochemically in KOH).</li> </ul>