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251 results for “Electrolyte”
A Model-Based Prognostics Methodology For Electrolytic Capacitors Based On Electrical Overstress Accelerated Aging
A remaining useful life prediction methodology for electrolytic capacitors is presented. This methodology is based on the Kalman filter framework and an empirical degradation model. Electrolytic capacitors are used in several applications ranging from power supplies on critical avionics equipment to power drivers for electro-mechanical actuators. These devices are known for their comparatively low reliability and given their criticality in electronics subsystems they are a good candidate for component level prognostics and health management. Prognostics provides a way to assess remaining useful life of a capacitor based on its current state of health and its anticipated future usage and operational conditions. We present here also, experimental results of an accelerated aging test under electrical stresses. The data obtained in this test form the basis for a remaining life prediction algorithm where a model of the degradation process is suggested. This preliminary remaining life prediction algorithm serves as a demonstration of how prognostics methodologies could be used for electrolytic capacitors. In addition, the use degradation progression data from accelerated aging, provides an avenue for validation of applications of the Kalman filter based prognostics methods typically used for remaining useful life predictions in other applications.
A Model-based Prognostics Methodology for Electrolytic Capacitors Based on Electrical Overstress Accelerated Aging
A remaining useful life prediction methodology for elec- trolytic capacitors is presented. This methodology is based on the Kalman filter framework and an empirical degradation model. Electrolytic capacitors are used in several applications ranging from power supplies on critical avionics equipment to power drivers for electro-mechanical actuators. These devices are known for their comparatively low reliability and given their criticality in electronics subsystems they are a good can- didate for component level prognostics and health manage- ment. Prognostics provides a way to assess remaining use- ful life of a capacitor based on its current state of health and its anticipated future usage and operational conditions. We present here also, experimental results of an accelerated ag- ing test under electrical stresses. The data obtained in this test form the basis for a remaining life prediction algorithm where a model of the degradation process is suggested. This prelim- inary remaining life prediction algorithm serves as a demon- stration of how prognostics methodologies could be used for electrolytic capacitors. In addition, the use degradation pro- gression data from accelerated aging, provides an avenue for validation of applications of the Kalman filter based prognos- tics methods typically used for remaining useful life predic- tions in other applications.
Towards A Model-based Prognostics Methodology for Electrolytic Capacitors: A Case Study Based on Electrical Overstress Accelerated Aging
A remaining useful life prediction methodology for elec- trolytic capacitors is presented. This methodology adopts a Kalman filter approach in conjunction with an empirical state-based degradation model to predict the degradation of capacitor parameters through the life of the capacitor. Elec- trolytic capacitors are used in several applications ranging from power supplies on critical avionics equipment to power drivers for electro-mechanical actuators. These devices are known for their comparatively low reliability and given their criticality in electronics subsystems they are good candi- dates for component level prognostics and health manage- ment. Prognostics provides a way to assess remaining use- ful life of a capacitor based on its current state of health and its anticipated future usage and operational conditions. This paper discusses the empirical degradation models and experi- mental results of an accelerated aging test performed on a set of identical capacitors subjected to electrical stress. The data form the basis for developing the Kalman-filter based remain- ing life prediction algorithm.
Towards A Model-Based Prognostics Methodology For Electrolytic Capacitors: A Case Study Based On Electrical Overstress Accelerated Aging
This paper presents a model-driven methodology for predict- ing the remaining useful life of electrolytic capacitors. This methodology adopts a Kalman filter approach in conjunction with an empirical state-based degradation model to predict the degradation of capacitor parameters through the life of the capacitor. Electrolytic capacitors are important components of systems that range from power supplies on critical avion- ics equipment to power drivers for electro-mechanical actuators. These devices are known for their comparatively low reliability and given their critical role in the system, they are good candidates for component level prognostics and health management. Prognostics provides a way to assess remain- ing useful life of a capacitor based on its current state of health and its anticipated future usage and operational conditions. This paper proposes and empirical degradation model and discusses experimental results for an accelerated aging test performed on a set of identical capacitors subjected to electrical stress. The data forms the basis for developing the Kalman-filter based remaining life prediction algorithm.
Aging Methodologies and Prognostic Health Management for Electrolytic Capacitors
Understanding the ageing mechanisms of electronic components critical avionics systems such as the GPS and INAV are of critical importance. Electrolytic capacitors and MOSFET’s have higher failure rates among the components of DC-DC power converter systems. Our current work focuses on analyzing and modeling electrolytic capacitor degradation and its effects on the output of DC-DC converter systems. The output degrada- tion is typically measured by an increase in ESR (Equivalent Series Resistance) and decrease in the capacitance value over long periods of use even under nominal operating conditions. Typically the primary effect of degradation is increased ripple current and this has adverse effects on downstream components. For example, in avionics systems where the power supply drives a GPS unit, ripple currents can cause glitches in the GPS position and velocity output, and this may cause errors in the Inertial Navigation (INAV) system, causing the aircraft to fly off course. In this paper, we present the details of our ageing methodology along with details of experiments and analysis of the results.
Towards Prognostics of Electrolytic Capacitors
A remaining useful life prediction algorithm and degradation model for electrolytic capacitors is presented. Electrolytic capacitors are used in several applications ranging from power supplies on critical avionics equipment to power drivers for electro-mechanical actuators. These devices are known for their low reliability and given their criticality in electronics subsystems they are a good candidate for component level prognostics and health management research. Prognostics provides a way to assess remaining useful life of a capacitor based on its current state of health and its anticipated future usage and operational conditions. In particular, experimental results of an accelerated aging test under electrical stresses are presented. The capacitors used in this test form the basis for a remaining life prediction algorithm where a model of the degradation process is suggested. This preliminary remaining life prediction algorithm serves as a demonstration of how prognostics methodologies could be used for electrolytic capacitors.
Bayesian Framework Approach for Prognostic Studies in Electrolytic Capacitor under Thermal Overstress Conditions
Electrolytic capacitors are used in several applications rang- ing from power supplies for safety critical avionics equipment to power drivers for electro-mechanical actuators. Past expe- riences show that capacitors tend to degrade and fail faster when subjected to high electrical or thermal stress condi- tions during operations. This makes them good candidates for prognostics and health management. Model-based prognos- tics captures system knowledge in the form of physics-based models of components in order to obtain accurate predictions of end of life based on their current state of health and their anticipated future use and operational conditions. The focus of this paper is on deriving first principles degradation mod- els for thermal stress conditions and implementing Bayesian framework for making remaining useful life predictions. Data collected from simultaneous experiments are used to validate the models. Our overall goal is to derive accurate models of capacitor degradation, and use them to remaining useful life in DC-DC converters.
Physics based Degradation Modeling and Prognostics of Electrolytic Capacitors under Electrical Overstress Conditions
This paper proposes a physics based degradation modeling and prognostics approach for electrolytic capacitors. Electrolytic capacitors are critical components in electronics systems in aeronautics and other domains. Degradation's in capacitor and MOSFET components are often the cause of failures in DC-DC converters. For example, prevalent fault effects, such as a ripple voltage surge at the power supply output, can damage interconnected critical subsystems leading to cascading fault propagation. Prognostics in general and in this case electronics components in particular is concerned with the prediction of remaining useful life (RUL) of components and systems. It performs a condition-based health assessment by estimating the current state of health. Furthermore, it leverages the knowledge of the device physics and degradation physics to predict remaining useful life as a function of current state of health and anticipated operational and environmental conditions. Physics-based models capture degradation phenomena in terms of component geometry and energy based principles that define the effect of stressors on the component behavior. This is in contrast to the traditional approach for deriving degradation models from empirical data. Implementing the degradation modeling techniques present a general methodology for estimating lifetimes due to specific failure mechanisms. The failure rate models can be tuned to include parameters that relate to the present health of the device/system and the expected conditions under which it will be operated. The models and algorithms are applied to data from degradation experiments of several COTS capacitors. Results show the efficiency of the approach chosen.
3D printed electrolyte-supported Solid Oxide Cells based on scandia-stabilized zirconia co-doped with ytterbia
Open the record for dataset details and reuse information.
Data associated to the manuscript "On the structure of hybrid water-in-salt electrolytes"
<p>Contains molecular dynamics input files and experimental data used in the article: "On the structure of hybrid water-in-salt electrolytes"</p>
Data_Insight in the behavior of bipolar membrane equipped carbon dioxide electrolyzers at low electrolyte flowrates
<p>The folder contains the processed data of figures 3, 4, 5, and 6 that appear in:</p> <p>Insight in the behavior of bipolar membrane equipped carbon dioxide electrolyzers at low electrolyte flowrates</p> <p>B De Mot, J Hereijgers, N Daems, T Breugelmans</p> <p>Chemical Engineering Journal 428, 131170</p>
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