Find research datasets worth reusing
Search datasets from major research repositories and use ShareScore to quickly assess how well each record supports discovery, access, and reuse.
50
datasets available to search
ShareScore release 0.9.0
Dataset results
50 results for “XPS”
Physico-chemical characterization of Fe3O4 nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>Fe<sub>3</sub>O<sub>4 </sub>nanoparticles were provided by Promethean Particles (EMR identifier in the project: ERM00000409).</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "p" for pristine.</p> <p> </p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
Physico-chemical characterization of sterile ZnO nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>Sterile ZnO<sub> </sub>nanoparticles were synthesized under aseptic conditions at Mintek, South Africa (EMR-Identifier in the project: ERM00000584).</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "p" for pristine.</p> <p> </p> <p>The authors thank Thorid Lange, who performed the SEM measurements.</p>
Physico-chemical characterization of sterile citrated stabilized Au nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>Sterile citrated stabilized Au nanoparticles with a diameter of approx. 30 nm were synthesized under aseptic conditions at Mintek, South Africa (EMR-Identifier in the project: ERM00000582).</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "p" for pristine.</p> <p> </p> <p>The authors thank Thorid Lange, who performed the SEM measurements.</p>
Photoselective Vaporization of the Prostate With the GreenLight XPS™ Laser System vs TURP for the Treatment of BPH
ClinicalTrials.gov study NCT01218672. IPD Sharing: Not stated. Countries: 9. Publications: 2.
XPS investigation of Co-Ni oxidized compounds surface using peak on satellites ratio. Application to Co20Ni80 passive layer structure and composition.
<p>The .xls files contain the data of the Ni2p and Co2p spectra recorded on the spontaneously oxidized alloy sample, during sputtering.</p>
Tutorial videos on the application of XPS inelastic background for characterization of composition and morphology of nano-structures with QUASES software
<p>The tutorial videos illustrate the application of XPS inelastic background analysis for characterization of composition and morphology of nano-structures with QUASES software.</p> <p><strong>For an introduction to the method, see:</strong><br> S. Tougaard "Practical guide to the use of backgrounds in quantitative XPS." <em>J Vac Sci Technol A</em>. 2021;39:011201. doi:10.1116/6.0000661<br> S. Tougaard "Accuracy of the non-destructive surface nanostructure quantification technique based on analysis of the XPS or AES peak shape". <em>Surf Interface Anal</em>. 1998;26(4):249-269. doi:<a href="https://doi-org.proxy1-bib.sdu.dk/10.1002/(SICI)1096-9918(199804)26:4%3C249::AID-SIA368%3E3.0.CO;2-A">https://doi-org.proxy1-bib.sdu.dk/10.1002/(SICI)1096-9918(199804)26:4<249::AID-SIA368>3.0.CO;2-A</a></p> <p> </p> <p>The inelastic background analysis was done with the QUASES-Tougaard software . See www. quases.com.</p> <p>It is recommended to read first the short description in the pdf file: <strong>Guide to the 14 posted videos.pdf.</strong> This explains briefly the purpose of each video. </p> <p>To best understand what is done in Video 9 ("9.Practical procedure to correct for elastic electron scattering.mp4") you should first watch Video 8, then Video 6 and then Video 9.</p> <p> </p>
Physico-chemical characterization of sterilized Co2.25Fe0.75O4 nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>Co<sub>2.25</sub>Fe<sub>0.75</sub>O<sub>4</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifier in the project: ERM00000406, ERM00000448, ERM00000427).</p> <p>The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA.</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe files <em>Pn.m.o.sample_treatment</em> and for the corresponding .npl files: <em>m.npl</em> with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave.</p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
Physico-chemical characterization of sterilized Co0.75Fe2.25O4 nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>Co<sub>0.75</sub>Fe<sub>2.25</sub>O<sub>4</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifiers in the project: ERM00000408, ERM00000450, ERM00000429).</p> <p>The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA.</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe files <em>Pn.m.o.sample_treatment</em> and for the corresponding .npl files: <em>m.npl</em> with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave.</p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
Physico-chemical characterization of sterilized ZnO nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>ZnO nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR-Identifiers in the project: ERM00000416, ERM00000458, ERM00000437).</p> <p>The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA.</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe files <em>Pn.m.o.sample_treatment</em> and for the corresponding .npl files: <em>m.npl</em> with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave.</p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
Physico-chemical characterization of sterilized Co3O4 nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>Co<sub>3</sub>O<sub>4</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifier in the project: ERM00000405, ERM00000447, ERM00000426).</p> <p>The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA.</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe files <em>Pn.m.o.sample_treatment</em> and for the corresponding .npl files: <em>m.npl</em> with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave.</p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
Physico-chemical characterization of sterilized CeO2 nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>CeO<sub>2</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifier in the project: ERM00000398, ERM00000440, ERM00000419).</p> <p>The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA.</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe files <em>Pn.m.o.sample_treatment</em> and for the corresponding .npl files: <em>m.npl</em> with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave.</p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
Physico-chemical characterization of sterilized Fe2O3 nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>Fe<sub>2</sub>O<sub>3</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifiers in the project: ERM00000410, ERM00000452, ERM00000431).</p> <p>The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA.</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe files <em>Pn.m.o.sample_treatment</em> and for the corresponding .npl files: <em>m.npl</em> with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave.</p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
Physico-chemical characterization of sterilized Ce0.1Zr0.9O2 nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>Ce<sub>0.1</sub>Zr<sub>0.9</sub>O<sub>2</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR identifier in the project: ERM00000403, ERM00000445, ERM00000424).</p> <p>The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA.</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe and for the corresponding .npl files <em>Pn.m.o.sample_treatment, </em>with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave.</p> <p> </p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
Holmium Laser Enucleation of Prostate(HOLEP) vs Greenlight(XPS) Laser Photoselective Vapo-Enucleation of Prostate(PVEP)
ClinicalTrials.gov study NCT01494337. IPD Sharing: Not stated. Countries: 1. Publications: 1.
Surface chemistry of a [C2C1Im][OTf] (sub-)wetting layer on Pt(111): a combined XPS, IRAS and STM study
Open the record for dataset details and reuse information.
Revisiting Degradation in the XPS Analysis of Polymers Data
<p>XPS data in VAMAS format for the Surface and Interface Analysis paper entitled " Revisiting Degradation in the XPS Analysis of Polymers". DOI: 10.1002/sia.7151</p> <p>Recommended analysis software is CasaXPS, minimum of Version 2.3.24</p>
Dataset for NXmpes_xps demonstration
<p>Dataset for the generation of Nexus files using the Nomad Nexus parser</p>
GreenLight XPS Laser System Retrospective Chart Review
ClinicalTrials.gov study NCT02139969. IPD Sharing: Not stated. Countries: 2. Publications: 0.
Phase 4 Study of Greenlight XPS Laser Versus BiVAP Saline Vaporization of the Prostate in Men With Symptomatic Benign Prostatic Hyperplasia
ClinicalTrials.gov study NCT01500057. IPD Sharing: Not stated. Countries: 1. Publications: 0.
Physico-chemical characterization of sterilized Co1.5Fe1.5O4 nanoparticles by XPS / HAXPES / SEM
<p>Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</p> <p>Co<sub>1.5</sub>Fe<sub>1.5</sub>O<sub>4</sub> nanoparticles were provided by Promethean Particles and treated differently by project partners from the University of Birmingham (EMR-Identifier in the project: ERM00000407, ERM00000449, ERM00000428).</p> <p>The particles were treated by different sterilization methods (autoclave or microwave) and BSA was or was not added as stabilizer. This finally leads to five different samples: pristine, autoclave, microwave, autoclave with BSA, microwave with BSA.</p> <p>Prior to the measurements, the samples were prepared from the solution as drop cast on Si wafers. First SEM and EDS measurements were performed, followed by XPS and HAXPES measurements on the same samples. Here at first survey spectra were recorded followed by high resolution spectra. For XPS / HAXPES several Si-wafers were mounted together on one platen. The platen was left in the intro chamber of the instrument for several hours before the measurement started.</p> <p>Equipment:</p> <p>SEM images were acquired with a <em>Supra 40 </em>(Zeiss) SEM equipped with a <em>Quantax 400 </em>(Bruker) SDD EDS spectrometer.</p> <p>For X-ray spectroscopy experiments, a combined XPS / HAXPES spectrometer (<em>Quantes </em>from ULVAC-PHI) was used, where XPS is measured at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source). Here it is possible to perform the measurements at the exact same position.</p> <p>Data:</p> <p>For SEM, the data are given in .tif format. For XPS / HAXPES the raw data are given as .spe (PHI format) and .npl (VAMAS format) files. The measurement conditions are given in the data files.</p> <p>Naming of data:</p> <p>SEM: <em>sample_treatment (n)</em>, with n a consecutive number.</p> <p>XPS / HAXPES: For the .spe files <em>Pn.m.o.sample_treatment</em> and for the corresponding .npl files: <em>m.npl</em> with Pn: platen-number, m: spectrum number (order of the measurements); o: point-number, of the position on the sample, sample_treatment with "m" for microwave and "a" for autoclave.</p> <p>The authors thank Sigrid Benemann, who performed the SEM measurements.</p>
ScienceDex guides
Understand access before you commit
These curated guides explain access requirements, typical timelines, costs, and reuse considerations for widely used research datasets.
Allen Brain Atlas
Allen Brain Atlas is an Allen Institute collection of brain map atlases, datasets, APIs, and analysis tools covering mouse, human, and non-human primate brain resources.
Annotated Behaviour and Observability Dataset (ABODe)
ABODe is a University of Edinburgh DataShare dataset for behavior classification in group-housed mice using home-cage video, identities, bounding boxes, ground-plate positions, and annotator labels.
DANDI Archive for NWB datasets
DANDI is a BRAIN Initiative archive for publishing and sharing neurophysiology data, including electrophysiology, optophysiology, and behavioral data packaged as NWB and related standards.
International Brain Laboratory public data
The International Brain Laboratory public data releases expose standardized mouse decision-making experiments, including Neuropixels recordings, widefield calcium imaging, behavior, and session metadata accessed through the ONE API.
OpenNeuro
OpenNeuro is a free, open platform for sharing neuroimaging datasets, with public search, dataset pages, and download paths for web, S3, DataLad, and the OpenNeuro CLI.