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48 results for “PAAO”
Light intensity reflected from PAAO containing samples (AoI 45 deg., 60 deg., two polarisations)
<p>The file contains raw intensity data measured in reflection mode for various material combinations: porous anodized aluminium oxide (PAAO), gold nanoparticles (Au NPs), diamond-like carbon with silver nanoparticles composite (DLC:Ag), quartz, and silicon.</p> <p>List of investigated samples:</p> <table> <thead> <tr> <th scope="col">Sample name</th> <th scope="col">Sample description</th> </tr> </thead> <tbody> <tr> <td>AJ1</td> <td>Aluminium substrate, ~241 nm thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 3 min 16 s), 60 nm diameter Au NPs (dip-coated at a speed of 1 μm/s)</td> </tr> <tr> <td>AJ2</td> <td>Aluminium substrate, ~259 nm thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 3 min 37 s), 60 nm diameter Au NPs (dip-coated at a speed of 1 μm/s)</td> </tr> <tr> <td>AJ3</td> <td>Aluminium substrate, ~293 nm thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 4 min 8 s), 60 nm diameter Au NPs (dip-coated at a speed of 1 μm/s)</td> </tr> <tr> <td>AJ4</td> <td>Aluminium substrate, ~317 nm thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 4 min 30 s), 60 nm diameter Au NPs (dip-coated at a speed of 1 μm/s)</td> </tr> <tr> <td>AJ5</td> <td>Aluminium substrate, ~345 nm thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 4 min 57 s), 60 nm diameter Au NPs (dip-coated at a speed of 1 μm/s)</td> </tr> <tr> <td>AJ6</td> <td>Aluminium substrate, ~276 nm thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 3 min 42 s), ~55 nm thickness, 20 V.% Ag concentration DLC:Ag (magnetron sputtered using silver target, 80 sccm argon gas flow, 5.4 sccm C<sub>2</sub>H<sub>2</sub> gas flow, 405 V voltage, 0.09-0.10 A current, 7·10<sup>-3</sup> mbar work pressure, 2 minutes 32 seconds process duration)</td> </tr> <tr> <td>AJ7</td> <td>Aluminium substrate, ~316 nm thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 4 min 25 s), ~55 nm thickness, 20 V.% Ag concentration DLC:Ag (magnetron sputtered using silver target, 80 sccm argon gas flow, 5.4 sccm C<sub>2</sub>H<sub>2</sub> gas flow, 405 V voltage, 0.09-0.10 A current, 7·10<sup>-3</sup> mbar work pressure, 2 minutes 32 seconds process duration)</td> </tr> <tr> <td>AJ8</td> <td>Aluminium substrate, ~345 nm thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 5 min 4 s), ~55 nm thickness, 20 V.% Ag concentration DLC:Ag (magnetron sputtered using silver target, 80 sccm argon gas flow, 5.4 sccm C<sub>2</sub>H<sub>2</sub> gas flow, 405 V voltage, 0.09-0.10 A current, 7·10<sup>-3</sup> mbar work pressure, 2 minutes 32 seconds process duration)</td> </tr> <tr> <td>Q140</td> <td>Quartz substrate, ~55 nm thickness, 20 V.% Ag concentration DLC:Ag (magnetron sputtered using silver target, 80 sccm argon gas flow, 5.4 sccm C<sub>2</sub>H<sub>2</sub> gas flow, 405 V voltage, 0.09-0.10 A current, 7·10<sup>-3</sup> mbar work pressure, 2 minutes 32 seconds process duration)</td> </tr> <tr> <td>Si140</td> <td>Silicon substrate, ~55 nm thickness, 20 V.% Ag concentration DLC:Ag (magnetron sputtered using silver target, 80 sccm argon gas flow, 5.4 sccm C<sub>2</sub>H<sub>2</sub> gas flow, 405 V voltage, 0.09-0.10 A current, 7·10<sup>-3</sup> mbar work pressure, 2 minutes 32 seconds process duration)</td> </tr> </tbody> </table> <p>The file also contains data for lamp and dark spectra. Images are for illustrative purposes and contain measured sample intensity minus dark intensity.</p> <p>The spectra were collected by a custom-made computer-controlled motorized goniometer set-up with an incandescent lamp light source and an AvaSpec-2048 (Avantes) spectrometer covering a wavelength range of 360–860 nm with 1.2 nm resolution.</p> <p>Notations inside the file: AoI - angle of incidence (45 deg. or 60 deg.), AoD - angle of detection (90 deg. is mirror reflection from 45 deg. incidence, while 120 deg. is the same for 60 deg.), pol - angle of the polarizing prism (0 deg. or 90 deg., light intensity was lower for the 0 deg.).</p>
Phtometry measurements using spectroscopic ellipsometer of PAAO containing samples in air and water (AoI 45 deg., 60 deg., varying polarizer and analyser angles)
<p>The file contains raw intensity data measured in reflection mode for various material combinations: porous anodized aluminium oxide (PAAO), gold nanoparticles (Au NPs), diamond-like carbon with silver nanoparticles composite (DLC:Ag), quartz, and silicon.</p> <p>List of investigated samples:</p> <table> <thead> <tr> <th scope="col">Sample name</th> <th scope="col">Sample description</th> </tr> </thead> <tbody> <tr> <td>AJ1</td> <td>Aluminium substrate, ~241 nm thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 3 min 16 s), 60 nm diameter Au NPs (dip-coated at a speed of 1 μm/s)</td> </tr> <tr> <td>AJ2</td> <td>Aluminium substrate, ~259 nm thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 3 min 37 s), 60 nm diameter Au NPs (dip-coated at a speed of 1 μm/s)</td> </tr> <tr> <td>AJ3</td> <td>Aluminium substrate, ~293 nm thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 4 min 8 s), 60 nm diameter Au NPs (dip-coated at a speed of 1 μm/s)</td> </tr> <tr> <td>AJ4</td> <td>Aluminium substrate, ~317 nm thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 4 min 30 s), 60 nm diameter Au NPs (dip-coated at a speed of 1 μm/s)</td> </tr> <tr> <td>AJ5</td> <td>Aluminium substrate, ~345 nm thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 4 min 57 s), 60 nm diameter Au NPs (dip-coated at a speed of 1 μm/s)</td> </tr> <tr> <td>AJ6</td> <td>Aluminium substrate, ~276 nm thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 3 min 42 s), ~55 nm thickness, 20 V.% Ag concentration DLC:Ag (magnetron sputtered using silver target, 80 sccm argon gas flow, 5.4 sccm C<sub>2</sub>H<sub>2</sub> gas flow, 405 V voltage, 0.09-0.10 A current, 7·10<sup>-3</sup> mbar work pressure, 2 minutes 32 seconds process duration)</td> </tr> <tr> <td>AJ7</td> <td>Aluminium substrate, ~316 nm thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 4 min 25 s), ~55 nm thickness, 20 V.% Ag concentration DLC:Ag (magnetron sputtered using silver target, 80 sccm argon gas flow, 5.4 sccm C<sub>2</sub>H<sub>2</sub> gas flow, 405 V voltage, 0.09-0.10 A current, 7·10<sup>-3</sup> mbar work pressure, 2 minutes 32 seconds process duration)</td> </tr> <tr> <td>AJ8</td> <td>Aluminium substrate, ~345 nm thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 5 min 4 s), ~55 nm thickness, 20 V.% Ag concentration DLC:Ag (magnetron sputtered using silver target, 80 sccm argon gas flow, 5.4 sccm C<sub>2</sub>H<sub>2</sub> gas flow, 405 V voltage, 0.09-0.10 A current, 7·10<sup>-3</sup> mbar work pressure, 2 minutes 32 seconds process duration)</td> </tr> <tr> <td>Q140</td> <td>Quartz substrate, ~55 nm thickness, 20 V.% Ag concentration DLC:Ag (magnetron sputtered using silver target, 80 sccm argon gas flow, 5.4 sccm C<sub>2</sub>H<sub>2</sub> gas flow, 405 V voltage, 0.09-0.10 A current, 7·10<sup>-3</sup> mbar work pressure, 2 minutes 32 seconds process duration)</td> </tr> <tr> <td>Si140</td> <td>Silicon substrate, ~55 nm thickness, 20 V.% Ag concentration DLC:Ag (magnetron sputtered using silver target, 80 sccm argon gas flow, 5.4 sccm C<sub>2</sub>H<sub>2</sub> gas flow, 405 V voltage, 0.09-0.10 A current, 7·10<sup>-3</sup> mbar work pressure, 2 minutes 32 seconds process duration)</td> </tr> </tbody> </table> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Mode: photometry.</p> <p>Light incidence angles: 45°, 60°.</p> <p>Polarizer angles: 0°, 90°.</p> <p>Analyzer angles: 0°, 45°, 90°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The reference was measured from aluminum mirror provided with the ellipsometer for each variation of measurement set-up.</p> <p>Each sample was first measured in air and then after immersion in water. Focusing was performed before each measurement.</p> <p>.smdx and .mup files are generated by the ellipsometer and can be opened using Semilab software. Their file names contain sample name, polarizer angle (Pol), analyzer angle (Ana), incidence angle (ang), and surrounding medium (air/water). .csv files are exported data related to each sample. .jpg files are for illustrative purposes to show the spectra. .rar file contains all the files in this upload.</p> <p> </p>
Refractive index sensitivity of scattering by Al-PAAO-Au film substrates
<p>Project: Nanostructured multilayer hybrid coatings for interferometric and optoelectronic sensors (LZP-2020/1-0200)</p>
Spectroscopic ellipsometry mapping of PAAO (AJ-5-04-27 sample)
<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 4 minutes and 57 seconds.</p> <p>The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm<sup>2</sup>). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-5-04-27 Ellipsometry Mapping Measurements.rar" file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method after being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.7118686</p>
FDTD simulation of 290 nm thickness PAAO with Au NPs in different mediums (AoI 60 deg., s- and p-polarizations)
<p>FDTD software: Lumerical (Ansys, version 2021 R2.3).</p> <p>Structure: aluminum (Palik) substrate; 290 nm thickness (<em>h</em>) aluminum oxide (Palik) layer with 35 nm diameter (<em>RPo</em>) cylindrical pores with 100 nm distance (<em>D</em>) between the pore centers (representing porous anodized aluminum oxide - PAAO); 60 nm diameter (<em>RNP</em>) gold (Johnson and Christy) nanoparticles (Au NPs) placed directly above each pore.</p> <p>Refractive index of the surrounding medium (<em>n</em>): 1.0; 1.1.</p> <p>Simulation region: from 300 nm below the substrate/PAAO interface to 1.3 µm above PAAO surface; x and y spans are equal to one period of the structure.</p> <p>Mesh override region: from 50 nm below the PAAO to 50 nm above the nanoparticles; 2 nm step size in each direction.</p> <p>Light source: BFAST plane wave light source; 500 nm above PAAO; 60° angle of incidence (<em>ang</em>); 300 nm – 1000 nm wavelength range; s- and p-polarizations (<em>pol</em>).</p> <p>Monitors (frequency domain field and power): (1) 2D Z-normal; 1 µm above PAAO; results are in "<em>_reflection.txt</em>" files. (2) 2D Y-normal; centered to the structure; starts 50 nm below PAAO and ends 50 nm above nanoparticles; results are in "<em>.fsp</em>" files. (3) 2D X-normal; centered to the structure; starts 50 nm below PAAO and ends 50 nm above nanoparticles; results are in "<em>.fsp</em>" files.</p> <p>Information in the file name: <em>h</em> - thickness of PAAO; <em>pol</em> - polarization; <em>RNP</em> - diameter of gold nanoparticles; <em>RPo</em> - diameter of pores; <em>D</em> - distance between pore centers; <em>ang</em> - angle of incidence; <em>n</em> - refractive index of surrounding medium.</p> <p>Files: (1) "<em>_reflection.txt</em>" - lambda(nm) (first column) - wavelength in nanometers; Y (second column) - T data from the monitor above the structure. (2) "<em>_p0.log</em>" - log file produced by the software while running the simulation. (3) "<em>.fsp</em>" - Lumerical software file containing the simulation project; it can be used to extract data from Y- and X-normal monitors (license required to open these files). (4) "<em>Lumerical_Screenshots.pdf</em>" - shows software screenshots for every object and its every property; red text is added to show which values are different for different simulations. (5) "<em>Structure_Illustration.png</em>" - a schematic of modeled structure. (6) "<em>h290.jpg</em>" - a preview of data from "<em>_reflection.txt</em>" files.</p>
FDTD simulation of 260 nm thickness PAAO with Au NPs in different mediums (AoI 60 deg., s- and p-polarizations)
<p>FDTD software: Lumerical (Ansys, version 2021 R2.3).</p> <p>Structure: aluminum (Palik) substrate; 260 nm thickness (<em>h</em>) aluminum oxide (Palik) layer with 35 nm diameter (<em>RPo</em>) cylindrical pores with 100 nm distance (<em>D</em>) between the pore centers (representing porous anodized aluminum oxide - PAAO); 60 nm diameter (<em>RNP</em>) gold (Johnson and Christy) nanoparticles (Au NPs) placed directly above each pore.</p> <p>Refractive index of the surrounding medium (<em>n</em>): 1.0; 1.1.</p> <p>Simulation region: from 300 nm below the substrate/PAAO interface to 1.3 µm above PAAO surface; x and y spans are equal to one period of the structure.</p> <p>Mesh override region: from 50 nm below the PAAO to 50 nm above the nanoparticles; 2 nm step size in each direction.</p> <p>Light source: BFAST plane wave light source; 500 nm above PAAO; 60° angle of incidence (<em>ang</em>); 300 nm – 1000 nm wavelength range; s- and p-polarizations (<em>pol</em>).</p> <p>Monitors (frequency domain field and power): (1) 2D Z-normal; 1 µm above PAAO; results are in "<em>_reflection.txt</em>" files. (2) 2D Y-normal; centered to the structure; starts 50 nm below PAAO and ends 50 nm above nanoparticles; results are in "<em>.fsp</em>" files. (3) 2D X-normal; centered to the structure; starts 50 nm below PAAO and ends 50 nm above nanoparticles; results are in "<em>.fsp</em>" files.</p> <p>Information in the file name: <em>h</em> - thickness of PAAO; <em>pol</em> - polarization; <em>RNP</em> - diameter of gold nanoparticles; <em>RPo</em> - diameter of pores; <em>D</em> - distance between pore centers; <em>ang</em> - angle of incidence; <em>n</em> - refractive index of surrounding medium.</p> <p>Files: (1) "<em>_reflection.txt</em>" - lambda(nm) (first column) - wavelength in nanometers; Y (second column) - T data from the monitor above the structure. (2) "<em>_p0.log</em>" - log file produced by the software while running the simulation. (3) "<em>.fsp</em>" - Lumerical software file containing the simulation project; it can be used to extract data from Y- and X-normal monitors (license required to open these files). (4) "<em>Lumerical_Screenshots.pdf</em>" - shows software screenshots for every object and its every property; red text is added to show which values are different for different simulations. (5) "<em>Structure_Illustration.png</em>" - a schematic of modeled structure. (6) "<em>h260.jpg</em>" - a preview of data from "<em>_reflection.txt</em>" files.</p>
FDTD simulation of various thickness PAAO covered with Ag NPs and DLC in different mediums (AoI 45 deg., s-polarization)
<p>FDTD software: Lumerical (Ansys, version 2021 R2.3).</p> <p>Structure: aluminum (Palik) substrate; 230/260/290/320/350 nm thickness (<em>h</em>) aluminum oxide (Palik) layer with 35 nm diameter (<em>RPo</em>) cylindrical pores with 100 nm distance (<em>D</em>) between the pore centers (representing porous anodized aluminum oxide - PAAO); 60 nm diameter (<em>AgRNP</em>) silver (Palik) nanoparticles (Ag NPs) placed directly above each pore; 60 nm thickness (<em>DLC</em>) layer with experimentally obtained optical properties of diamond-like carbon (DLC). Ag nanoparticles are encapsulated in DLC. DLC optical properties are averaged result of the matrix properties in DLC:Ag nanocomposite obtained by fitting spectroscopic ellipsometry data, which is available here: <a href="https://doi.org/10.5281/zenodo.7341684">https://doi.org/10.5281/zenodo.7341684</a> The file used in the simulations is provided in this data set.</p> <p>Refractive index of the surrounding medium (<em>n</em>): 1.0; 1.1; 1.2; 1.3.</p> <p>Simulation region: from 300 nm below the substrate/PAAO interface to 1.3 µm above PAAO surface; x and y spans are equal to one period of the structure.</p> <p>Mesh override region: from 50 nm below the PAAO to 50 nm above DLC:Ag; 2 nm step size in each direction.</p> <p>Light source: BFAST plane wave light source; 500 nm above PAAO; 45° angle of incidence (<em>ang</em>); 300 nm – 1000 nm wavelength range; s-polarization (<em>pol</em>).</p> <p>Monitor (frequency domain field and power): 2D Z-normal; 1 µm above PAAO; results are in "<em>_reflection.txt</em>" files.</p> <p>Information in the file name: <em>h</em> - thickness of PAAO; <em>AgRNP</em> - diameter of silver nanoparticles; <em>DLC</em> - thickness of DLC; <em>pol</em> - polarization; <em>RPo</em> - diameter of pores; <em>D</em> - distance between pore centers; <em>ang</em> - angle of incidence; <em>n</em> - refractive index of surrounding medium.</p> <p>Files: (1) "<em>_reflection.txt</em>" - lambda(nm) (first column) - wavelength in nanometers; Y (second column) - T data from the monitor above the structure. (2) "<em>_p0.log</em>" - log file produced by the software while running the simulation. (3) "<em>.fsp</em>" - Lumerical software file containing the simulation project (license required to open these files). (4) "<em>Lumerical_Screenshots.pdf</em>" - shows software screenshots for every object and its every property; red text is added to show which values are different for different simulations. (5) "<em>Structure_Illustration.jpg</em>" - a schematic of modeled structure. (6) "<em>.jpg</em>" - a preview of data from "<em>_reflection.txt</em>" files. (7) "<em>DLC_SE_nk_average.txt</em>" - contains DLC optical properties (first column - wavelength in nanometers; second column - refractive index; third column - extinction coefficient).</p>
Real-time PAAO
<p>Real-time thickness measurements</p> <ul> <li><strong>Originals</strong> - Directory with all saved spectra with preserved timestamps</li> <li><strong>Organized files</strong> - Directory with processed data <ul> <li><strong>1. Pre anodizing spectrum</strong> - Directory with spectra before anodization process</li> <li><strong>2. Anodizing spectrum</strong> - Directory with spectra during anodization process</li> <li><strong>3. Post anodizing spectrum</strong> - Directory with spectra after anodization process</li> <li><strong>4. Anodizing Plots</strong> - Directory with images of spectra and fitted spectra during an anodization process</li> <li><strong>5. Anodizing Data</strong> - Directory with tab delimited data of spectra and fitted spectra during an anodization process. <em>(1st column: Wavelength (nm); 2nd column: Experimental reflection(a.u.); 3rd column: Fitted reflection (a.u.))</em></li> <li><strong>Current_per_time.dat</strong> - tab delimited data for current dependence on anodization time <em>(1st column: Anodization time (s); 2nd column: Current (mA))</em></li> <li><strong>Thickness_per_time.dat</strong> - tab delimited data for PAAO thickness dependence on anodization time <em> (1st column: Anodization time (s); 2nd column: Thickness (nm))</em></li> <li><strong>Thickness_per_time.png</strong> - plot of PAAO thickness dependence on anodization time</li> <li><strong>Anodization_parameters.txt</strong> - data containing information about anodization parameters ( Voltage, Temperature, etc.)</li> </ul> </li> </ul> <p>Zip file name consists of: 1.Date 2.Time 3.Desired_Thickness 4.Fitted_Thickness 5.Anod_time 6.Temperature 7.Voltage 8.Solution 9.Material.zip</p> <p>Project: Nanostructured multilayer hybrid coatings for interferometric and optoelectronic sensors (LZP-2020/1-0200)</p>
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