Light intensity reflected from PAAO containing samples (AoI 45 deg., 60 deg., two polarisations)

<p>The file contains raw intensity data measured in reflection mode for various material combinations: porous anodized aluminium oxide (PAAO), gold nanoparticles (Au NPs), diamond-like carbon with silver nanoparticles composite (DLC:Ag), quartz, and silicon.</p> <p>List of investigated samples:</p> <table> <thead> <tr> <th scope="col">Sample name</th> <th scope="col">Sample description</th> </tr> </thead> <tbody> <tr> <td>AJ1</td> <td>Aluminium substrate, ~241 nm thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 3 min 16 s), 60 nm diameter Au NPs (dip-coated at a speed of 1 &mu;m/s)</td> </tr> <tr> <td>AJ2</td> <td>Aluminium substrate, ~259 nm thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 3 min 37 s), 60 nm diameter Au NPs (dip-coated at a speed of 1 &mu;m/s)</td> </tr> <tr> <td>AJ3</td> <td>Aluminium substrate, ~293 nm&nbsp;thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 4 min 8 s), 60 nm diameter Au NPs (dip-coated at a speed of 1 &mu;m/s)</td> </tr> <tr> <td>AJ4</td> <td>Aluminium substrate, ~317 nm&nbsp;thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 4 min 30 s), 60 nm diameter Au NPs (dip-coated at a speed of 1 &mu;m/s)</td> </tr> <tr> <td>AJ5</td> <td>Aluminium substrate, ~345 nm&nbsp;thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 4 min 57 s), 60 nm diameter Au NPs (dip-coated at a speed of 1 &mu;m/s)</td> </tr> <tr> <td>AJ6</td> <td>Aluminium substrate, ~276 nm&nbsp;thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 3 min 42 s), ~55 nm thickness, 20 V.% Ag concentration DLC:Ag (magnetron sputtered using silver target, 80 sccm argon gas flow, 5.4 sccm C₂H₂ gas flow, 405 V voltage, 0.09-0.10 A current, 7&middot;10^-3 mbar work pressure, 2 minutes 32 seconds process duration)</td> </tr> <tr> <td>AJ7</td> <td>Aluminium substrate, ~316 nm&nbsp;thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 4 min 25 s), ~55 nm thickness, 20 V.% Ag concentration DLC:Ag (magnetron sputtered using silver target, 80 sccm argon gas flow, 5.4 sccm C₂H₂ gas flow, 405 V voltage, 0.09-0.10 A current, 7&middot;10^-3 mbar work pressure, 2 minutes 32 seconds process duration)</td> </tr> <tr> <td>AJ8</td> <td>Aluminium substrate, ~345 nm&nbsp;thickness PAAO (anodized in 0.3 mol/L oxalic acid at 40 V for 5 min 4 s), ~55 nm thickness, 20 V.% Ag concentration DLC:Ag (magnetron sputtered using silver target, 80 sccm argon gas flow, 5.4 sccm C₂H₂ gas flow, 405 V voltage, 0.09-0.10 A current, 7&middot;10^-3 mbar work pressure, 2 minutes 32 seconds process duration)</td> </tr> <tr> <td>Q140</td> <td>Quartz substrate, ~55 nm thickness, 20 V.% Ag concentration DLC:Ag (magnetron sputtered using silver target, 80 sccm argon gas flow, 5.4 sccm C₂H₂ gas flow, 405 V voltage, 0.09-0.10 A current, 7&middot;10^-3 mbar work pressure, 2 minutes 32 seconds process duration)</td> </tr> <tr> <td>Si140</td> <td>Silicon substrate, ~55 nm thickness, 20 V.% Ag concentration DLC:Ag (magnetron sputtered using silver target, 80 sccm argon gas flow, 5.4 sccm C₂H₂ gas flow, 405 V voltage, 0.09-0.10 A current, 7&middot;10^-3 mbar work pressure, 2 minutes 32 seconds process duration)</td> </tr> </tbody> </table> <p>The file also contains data for lamp and dark spectra. Images are for illustrative purposes and contain measured sample intensity minus dark intensity.</p> <p>The spectra were collected by a custom-made computer-controlled motorized goniometer set-up with an incandescent lamp light source and an AvaSpec-2048 (Avantes) spectrometer covering a wavelength range of 360&ndash;860&nbsp;nm with 1.2&nbsp;nm resolution.</p> <p>Notations inside the file: AoI - angle of incidence (45 deg. or 60 deg.), AoD - angle of detection (90 deg. is mirror reflection from 45 deg. incidence, while 120 deg. is the same for 60 deg.), pol - angle of the polarizing prism (0 deg. or 90 deg., light intensity was lower for the 0 deg.).</p>