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9 results for “DLC:Ag”
Spectroscopic ellipsometry mapping of PAAO:DLC:Ag (AJ-8-03-31-DLCAg sample)
<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO) covered with hydrogenated amorphous diamond-like carbon and silver (DLC:Ag) nanocomposite. The sample was made by 2 processes: (1) anodization of aluminum polycrystal in 0.3 mol/L oxalic acid at 40 V for 5 minutes and 4 seconds and then (2) depositing DLC:Ag employing reactive unbalanced magnetron sputtering in direct current mode using silver target (80 sccm argon gas flow, 5.4 sccm C<sub>2</sub>H<sub>2</sub> gas flow, 405 V voltage, 0.09-0.10 A current, 7·10<sup>-3</sup> mbar work pressure, 2 minutes 32 seconds process duration).</p> <p>The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm<sup>2</sup>). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-8-03-31-DLCAg Ellipsometry Mapping Measurements.rar" file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method before being covered with DLC:Ag. The data can be found here: <a href="https://doi.org/10.5281/zenodo.7056065">https://doi.org/10.5281/zenodo.7056065</a></p>
Spectroscopic ellipsometry mapping of PAAO:DLC:Ag (AJ-7-03-31-DLCAg sample)
<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO) covered with hydrogenated amorphous diamond-like carbon and silver (DLC:Ag) nanocomposite. The sample was made by 2 processes: (1) anodization of aluminum polycrystal in 0.3 mol/L oxalic acid at 40 V for 4 minutes and 35 seconds and then (2) depositing DLC:Ag employing reactive unbalanced magnetron sputtering in direct current mode using silver target (80 sccm argon gas flow, 5.4 sccm C<sub>2</sub>H<sub>2</sub> gas flow, 405 V voltage, 0.09-0.10 A current, 7·10<sup>-3</sup> mbar work pressure, 2 minutes 32 seconds process duration).</p> <p>The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm<sup>2</sup>). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-7-03-31-DLCAg Ellipsometry Mapping Measurements.rar" file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method before being covered with DLC:Ag. The data can be found here: <a href="https://doi.org/10.5281/zenodo.7053393">https://doi.org/10.5281/zenodo.7053393</a></p>
FDTD simulation of various thickness PAAO covered with Ag NPs and DLC in different mediums (AoI 45 deg., p-polarization)
<p>FDTD software: Lumerical (Ansys, version 2021 R2.3).</p> <p>Structure: aluminum (Palik) substrate; 230/260/290/320/350 nm thickness (<em>h</em>) aluminum oxide (Palik) layer with 35 nm diameter (<em>RPo</em>) cylindrical pores with 100 nm distance (<em>D</em>) between the pore centers (representing porous anodized aluminum oxide - PAAO); 60 nm diameter (<em>AgRNP</em>) silver (Palik) nanoparticles (Ag NPs) placed directly above each pore; 60 nm thickness (<em>DLC</em>) layer with experimentally obtained optical properties of diamond-like carbon (DLC). Ag nanoparticles are encapsulated in DLC. DLC optical properties are averaged result of the matrix properties in DLC:Ag nanocomposite obtained by fitting spectroscopic ellipsometry data, which is available here: <a href="https://doi.org/10.5281/zenodo.7341684">https://doi.org/10.5281/zenodo.7341684</a> The file used in the simulations is provided in this data set.</p> <p>Refractive index of the surrounding medium (<em>n</em>): 1.0; 1.1; 1.2; 1.3.</p> <p>Simulation region: from 300 nm below the substrate/PAAO interface to 1.3 µm above PAAO surface; x and y spans are equal to one period of the structure.</p> <p>Mesh override region: from 50 nm below the PAAO to 50 nm above DLC:Ag; 2 nm step size in each direction.</p> <p>Light source: BFAST plane wave light source; 500 nm above PAAO; 45° angle of incidence (<em>ang</em>); 300 nm – 1000 nm wavelength range; p-polarization (<em>pol</em>).</p> <p>Monitor (frequency domain field and power): 2D Z-normal; 1 µm above PAAO; results are in "<em>_reflection.txt</em>" files.</p> <p>Information in the file name: <em>h</em> - thickness of PAAO; <em>AgRNP</em> - diameter of silver nanoparticles; <em>DLC</em> - thickness of DLC; <em>pol</em> - polarization; <em>RPo</em> - diameter of pores; <em>D</em> - distance between pore centers; <em>ang</em> - angle of incidence; <em>n</em> - refractive index of surrounding medium.</p> <p>Files: (1) "<em>_reflection.txt</em>" - lambda(nm) (first column) - wavelength in nanometers; Y (second column) - T data from the monitor above the structure. (2) "<em>_p0.log</em>" - log file produced by the software while running the simulation. (3) "<em>.fsp</em>" - Lumerical software file containing the simulation project (license required to open these files). (4) "<em>Lumerical_Screenshots.pdf</em>" - shows software screenshots for every object and its every property; red text is added to show which values are different for different simulations. (5) "<em>Structure_Illustration.jpg</em>" - a schematic of modeled structure. (6) "<em>.jpg</em>" - a preview of data from "<em>_reflection.txt</em>" files. (7) "<em>DLC_SE_nk_average.txt</em>" - contains DLC optical properties (first column - wavelength in nanometers; second column - refractive index; third column - extinction coefficient).</p>
FDTD simulation of stack of 320 nm PAAO and various thickness DLC:Ag mixture in different mediums (AoI 45 deg., s-polarization)
<p>FDTD software: Lumerical (Ansys, version 2021 R2.3).</p> <p>Structure: aluminum (Palik) substrate; 320 nm thickness (<em>h</em>e) aluminum oxide (Palik) layer with 35 nm diameter (<em>RPo</em>) cylindrical pores with 100 nm distance (<em>D</em>) between the pore centers (representing porous anodized aluminum oxide - PAAO); 35/50/65 nm thickness (<em>DLC</em>) layer with experimentally obtained optical properties of diamond-like carbon and silver nanocomposite (DLC:Ag). The pores extend through both PAAO and DLC:Ag layers as it was observed in SEM images. DLC:Ag optical properties are averaged result of the layer properties in DLC:Ag nanocomposite obtained by fitting spectroscopic ellipsometry data, which is available here: <a href="https://doi.org/10.5281/zenodo.7341684">https://doi.org/10.5281/zenodo.7341684</a> The file used in the simulations is provided in this data set. Here DLC:Ag is considered as homogeneous materials without separating DLC and Ag phases.</p> <p>Refractive index of the surrounding medium (<em>n</em>): 1.0; 1.1; 1.2; 1.3.</p> <p>Simulation region: from 300 nm below the substrate/PAAO interface to 1.3 µm above PAAO surface; x and y spans are equal to one period of the structure.</p> <p>Mesh override region: from 50 nm below the PAAO to 50 nm above DLC:Ag; 2 nm step size in each direction.</p> <p>Light source: BFAST plane wave light source; 500 nm above PAAO; 45° angle of incidence (<em>ang</em>); 300 nm – 1000 nm wavelength range; s-polarization (<em>pol</em>).</p> <p>Monitor (frequency domain field and power): 2D Z-normal; 1 µm above PAAO; results are in "<em>_reflection.txt</em>" files.</p> <p>Information in the file name: <em>he</em> - thickness of PAAO; <em>DLC</em> - thickness of DLC:Ag; <em>pol</em> - polarization; <em>RPo</em> - diameter of pores; <em>D</em> - distance between pore centers; <em>ang</em> - angle of incidence; <em>n</em> - refractive index of surrounding medium.</p> <p>Files: (1) "<em>_reflection.txt</em>" - lambda(nm) (first column) - wavelength in nanometers; Y (second column) - T data from the monitor above the structure. (2) "<em>_p0.log</em>" - log file produced by the software while running the simulation. (3) "<em>.fsp</em>" - Lumerical software file containing the simulation project (license required to open these files). (4) "<em>Lumerical_Screenshots.pdf</em>" - shows software screenshots for every object and its every property; red text is added to show which values are different for different simulations. (5) "<em>Structure_Illustration.png</em>" - a schematic of modeled structure. (6) "PAAO320nm<em>.jpg</em>" - a preview of data from "<em>_reflection.txt</em>" files. (7) "<em>DLC_Ag_SE_nk_average.txt</em>" - contains DLC:Ag optical properties (first column - wavelength in nanometers; second column - refractive index; third column - extinction coefficient).</p>
FDTD simulation of stack of 290 nm PAAO and various thickness DLC:Ag mixture in different mediums (AoI 45 deg., s-polarization)
<p>FDTD software: Lumerical (Ansys, version 2021 R2.3).</p> <p>Structure: aluminum (Palik) substrate; 290 nm thickness (<em>h</em>e) aluminum oxide (Palik) layer with 35 nm diameter (<em>RPo</em>) cylindrical pores with 100 nm distance (<em>D</em>) between the pore centers (representing porous anodized aluminum oxide - PAAO); 35/50/65 nm thickness (<em>DLC</em>) layer with experimentally obtained optical properties of diamond-like carbon and silver nanocomposite (DLC:Ag). The pores extend through both PAAO and DLC:Ag layers as it was observed in SEM images. DLC:Ag optical properties are averaged result of the layer properties in DLC:Ag nanocomposite obtained by fitting spectroscopic ellipsometry data, which is available here: <a href="https://doi.org/10.5281/zenodo.7341684">https://doi.org/10.5281/zenodo.7341684</a> The file used in the simulations is provided in this data set. Here DLC:Ag is considered as homogeneous materials without separating DLC and Ag phases.</p> <p>Refractive index of the surrounding medium (<em>n</em>): 1.0; 1.1; 1.2; 1.3.</p> <p>Simulation region: from 300 nm below the substrate/PAAO interface to 1.3 µm above PAAO surface; x and y spans are equal to one period of the structure.</p> <p>Mesh override region: from 50 nm below the PAAO to 50 nm above DLC:Ag; 2 nm step size in each direction.</p> <p>Light source: BFAST plane wave light source; 500 nm above PAAO; 45° angle of incidence (<em>ang</em>); 300 nm – 1000 nm wavelength range; s-polarization (<em>pol</em>).</p> <p>Monitor (frequency domain field and power): 2D Z-normal; 1 µm above PAAO; results are in "<em>_reflection.txt</em>" files.</p> <p>Information in the file name: <em>he</em> - thickness of PAAO; <em>DLC</em> - thickness of DLC:Ag; <em>pol</em> - polarization; <em>RPo</em> - diameter of pores; <em>D</em> - distance between pore centers; <em>ang</em> - angle of incidence; <em>n</em> - refractive index of surrounding medium.</p> <p>Files: (1) "<em>_reflection.txt</em>" - lambda(nm) (first column) - wavelength in nanometers; Y (second column) - T data from the monitor above the structure. (2) "<em>_p0.log</em>" - log file produced by the software while running the simulation. (3) "<em>.fsp</em>" - Lumerical software file containing the simulation project (license required to open these files). (4) "<em>Lumerical_Screenshots.pdf</em>" - shows software screenshots for every object and its every property; red text is added to show which values are different for different simulations. (5) "<em>Structure_Illustration.png</em>" - a schematic of modeled structure. (6) "<em>PAAO290nm.jpg</em>" - a preview of data from "<em>_reflection.txt</em>" files. (7) "<em>DLC_Ag_SE_nk_average.txt</em>" - contains DLC:Ag optical properties (first column - wavelength in nanometers; second column - refractive index; third column - extinction coefficient).</p>
FDTD simulation of stack of 260 nm PAAO and various thickness DLC:Ag mixture in different mediums (AoI 45 deg., s-polarization)
<p>FDTD software: Lumerical (Ansys, version 2021 R2.3).</p> <p>Structure: aluminum (Palik) substrate; 260 nm thickness (<em>h</em>e) aluminum oxide (Palik) layer with 35 nm diameter (<em>RPo</em>) cylindrical pores with 100 nm distance (<em>D</em>) between the pore centers (representing porous anodized aluminum oxide - PAAO); 35/50/65 nm thickness (<em>DLC</em>) layer with experimentally obtained optical properties of diamond-like carbon and silver nanocomposite (DLC:Ag). The pores extend through both PAAO and DLC:Ag layers as it was observed in SEM images. DLC:Ag optical properties are averaged result of the layer properties in DLC:Ag nanocomposite obtained by fitting spectroscopic ellipsometry data, which is available here: <a href="https://doi.org/10.5281/zenodo.7341684">https://doi.org/10.5281/zenodo.7341684</a> The file used in the simulations is provided in this data set. Here DLC:Ag is considered as homogeneous materials without separating DLC and Ag phases.</p> <p>Refractive index of the surrounding medium (<em>n</em>): 1.0; 1.1; 1.2; 1.3.</p> <p>Simulation region: from 300 nm below the substrate/PAAO interface to 1.3 µm above PAAO surface; x and y spans are equal to one period of the structure.</p> <p>Mesh override region: from 50 nm below the PAAO to 50 nm above DLC:Ag; 2 nm step size in each direction.</p> <p>Light source: BFAST plane wave light source; 500 nm above PAAO; 45° angle of incidence (<em>ang</em>); 300 nm – 1000 nm wavelength range; s-polarization (<em>pol</em>).</p> <p>Monitor (frequency domain field and power): 2D Z-normal; 1 µm above PAAO; results are in "<em>_reflection.txt</em>" files.</p> <p>Information in the file name: <em>he</em> - thickness of PAAO; <em>DLC</em> - thickness of DLC:Ag; <em>pol</em> - polarization; <em>RPo</em> - diameter of pores; <em>D</em> - distance between pore centers; <em>ang</em> - angle of incidence; <em>n</em> - refractive index of surrounding medium.</p> <p>Files: (1) "<em>_reflection.txt</em>" - lambda(nm) (first column) - wavelength in nanometers; Y (second column) - T data from the monitor above the structure. (2) "<em>_p0.log</em>" - log file produced by the software while running the simulation. (3) "<em>.fsp</em>" - Lumerical software file containing the simulation project (license required to open these files). (4) "<em>Lumerical_Screenshots.pdf</em>" - shows software screenshots for every object and its every property; red text is added to show which values are different for different simulations. (5) "<em>Structure_Illustration.jpg</em>" - a schematic of modeled structure. (6) "<em>PAAO260nm.jpg</em>" - a preview of data from "<em>_reflection.txt</em>" files. (7) "<em>DLC_Ag_SE_nk_average.txt</em>" - contains DLC:Ag optical properties (first column - wavelength in nanometers; second column - refractive index; third column - extinction coefficient).</p>
FDTD simulation of various thickness DLC:Ag mixture on quartz substrate in different mediums (AoI 45 deg., s-polarization)
<p>FDTD software: Lumerical (Ansys, version 2021 R2.3).</p> <p>Structure: SiO<sub>2</sub> (Palik) substrate; 35/50/65 nm thickness (<em>DLC</em>) layer with experimentally obtained optical properties of diamond-like carbon and silver nanocomposite (DLC:Ag). DLC:Ag optical properties are averaged result of the layer properties in DLC:Ag nanocomposite obtained by fitting spectroscopic ellipsometry data, which is available here: <a href="https://doi.org/10.5281/zenodo.7341684">https://doi.org/10.5281/zenodo.7341684</a> The file used in the simulations is provided in this data set. Here DLC:Ag is considered as homogeneous materials without separating DLC and Ag phases.</p> <p>Refractive index of the surrounding medium (<em>n</em>): 1.0; 1.1; 1.2; 1.3.</p> <p>Simulation region: from 300 nm below the substrate/DLC:Ag interface to 1.3 µm above it.</p> <p>Mesh override region: from 50 nm below the substrate/DLC:Ag interface to 50 nm above DLC:Ag; 2 nm step size in each direction.</p> <p>Light source: BFAST plane wave light source; 500 nm above the substrate/DLC:Ag interface; 45° angle of incidence (<em>ang</em>); 300 nm – 1000 nm wavelength range; s-polarization (<em>pol</em>). The model structure is not periodic, however, BFAST light source was used for easier comparison with other structures with the same material, which are periodic.</p> <p>Monitor (frequency domain field and power): 2D Z-normal; 1 µm above the substrate/DLC:Ag interface; results are in "<em>_reflection.txt</em>" files.</p> <p>Information in the file name: <em>DLC</em> - thickness of DLC:Ag; <em>pol</em> - polarization; <em>onQ</em> - indicates quartz substrate; <em>ang</em> - angle of incidence; <em>n</em> - refractive index of surrounding medium.</p> <p>Files: (1) "<em>_reflection.txt</em>" - lambda(nm) (first column) - wavelength in nanometers; Y (second column) - T data from the monitor above the structure. (2) "<em>_p0.log</em>" - log file produced by the software while running the simulation. (3) "<em>.fsp</em>" - Lumerical software file containing the simulation project (license required to open these files). (4) "<em>Lumerical_Screenshots.pdf</em>" - shows software screenshots for every object and its every property; red text is added to show which values are different for different simulations. (5) "<em>.jpg</em>" - a preview of data from "<em>_reflection.txt</em>" files. (7) "<em>DLC_Ag_SE_nk_average.txt</em>" - contains DLC:Ag optical properties (first column - wavelength in nanometers; second column - refractive index; third column - extinction coefficient).</p>
Spectroscopic ellipsometry measurements of DLC:Ag (samples 139, 140)
<p>Spectroscopic ellipsometry measurement data obtained from the hydrogenated amorphous diamond-like carbon and silver (DLC:Ag) nanocomposite deposited on quartz (Q) and silicon (Si) substrates. DLC:Ag was deposited employing reactive unbalanced magnetron sputtering in direct current mode using silver target. Process parameters: 80 sccm argon gas flow, 5.4 sccm C<sub>2</sub>H<sub>2</sub> gas flow, 7·10<sup>-3</sup> mbar work pressure, 419-422 V or 405 V voltage (sample 139 or 140, respectively), 0.09-0.11 A or 0.09-0.10 A current (sample 139 or 140, respectively), 2 minutes 35 seconds or 2 minutes 32 seconds process duration (sample 139 or 140, respectively).</p> <p>The measurements were carried out at 5 locations on each sample and each substrate.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p>
FDTD simulation of various thickness PAAO covered with Ag NPs and DLC in different mediums (AoI 45 deg., s-polarization)
<p>FDTD software: Lumerical (Ansys, version 2021 R2.3).</p> <p>Structure: aluminum (Palik) substrate; 230/260/290/320/350 nm thickness (<em>h</em>) aluminum oxide (Palik) layer with 35 nm diameter (<em>RPo</em>) cylindrical pores with 100 nm distance (<em>D</em>) between the pore centers (representing porous anodized aluminum oxide - PAAO); 60 nm diameter (<em>AgRNP</em>) silver (Palik) nanoparticles (Ag NPs) placed directly above each pore; 60 nm thickness (<em>DLC</em>) layer with experimentally obtained optical properties of diamond-like carbon (DLC). Ag nanoparticles are encapsulated in DLC. DLC optical properties are averaged result of the matrix properties in DLC:Ag nanocomposite obtained by fitting spectroscopic ellipsometry data, which is available here: <a href="https://doi.org/10.5281/zenodo.7341684">https://doi.org/10.5281/zenodo.7341684</a> The file used in the simulations is provided in this data set.</p> <p>Refractive index of the surrounding medium (<em>n</em>): 1.0; 1.1; 1.2; 1.3.</p> <p>Simulation region: from 300 nm below the substrate/PAAO interface to 1.3 µm above PAAO surface; x and y spans are equal to one period of the structure.</p> <p>Mesh override region: from 50 nm below the PAAO to 50 nm above DLC:Ag; 2 nm step size in each direction.</p> <p>Light source: BFAST plane wave light source; 500 nm above PAAO; 45° angle of incidence (<em>ang</em>); 300 nm – 1000 nm wavelength range; s-polarization (<em>pol</em>).</p> <p>Monitor (frequency domain field and power): 2D Z-normal; 1 µm above PAAO; results are in "<em>_reflection.txt</em>" files.</p> <p>Information in the file name: <em>h</em> - thickness of PAAO; <em>AgRNP</em> - diameter of silver nanoparticles; <em>DLC</em> - thickness of DLC; <em>pol</em> - polarization; <em>RPo</em> - diameter of pores; <em>D</em> - distance between pore centers; <em>ang</em> - angle of incidence; <em>n</em> - refractive index of surrounding medium.</p> <p>Files: (1) "<em>_reflection.txt</em>" - lambda(nm) (first column) - wavelength in nanometers; Y (second column) - T data from the monitor above the structure. (2) "<em>_p0.log</em>" - log file produced by the software while running the simulation. (3) "<em>.fsp</em>" - Lumerical software file containing the simulation project (license required to open these files). (4) "<em>Lumerical_Screenshots.pdf</em>" - shows software screenshots for every object and its every property; red text is added to show which values are different for different simulations. (5) "<em>Structure_Illustration.jpg</em>" - a schematic of modeled structure. (6) "<em>.jpg</em>" - a preview of data from "<em>_reflection.txt</em>" files. (7) "<em>DLC_SE_nk_average.txt</em>" - contains DLC optical properties (first column - wavelength in nanometers; second column - refractive index; third column - extinction coefficient).</p>
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