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Spectroscopic ellipsometry mapping of PAAO (AJ-1-04-20 sample)

Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 3 minutes and 16 seconds. The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm2). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-1-04-20 Ellipsometry Mapping Measurements.rar" file. Ellipsometer: rotating compensator GES5-E (Semilab). Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum. Detector: UV-Vis CCD with 0.8 nm resolution. Spectral range: approximately 230-960 nm. Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°. Light beam size: microspot (365 × 470 μm2 at 75° angle of incidence). The same sample was also measured using the same spectroscopic ellipsometry method after being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.7059281

Spectroscopic ellipsometry mapping of PAAO (AJ-3-04-20 sample)

Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 4 minutes and 8 seconds. The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm2). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-3-04-20 Ellipsometry Mapping Measurements.rar" file. Ellipsometer: rotating compensator GES5-E (Semilab). Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum. Detector: UV-Vis CCD with 0.8 nm resolution. Spectral range: approximately 230-960 nm. Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°. Light beam size: microspot (365 × 470 μm2 at 75° angle of incidence). The same sample was also measured using the same spectroscopic ellipsometry method after being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.7115166

Spectroscopic ellipsometry mapping of PAAO (AJ-2-04-20 sample)

Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 3 minutes and 37 seconds. The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm2). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-2-04-20 Ellipsometry Mapping Measurements.rar" file. Ellipsometer: rotating compensator GES5-E (Semilab). Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum. Detector: UV-Vis CCD with 0.8 nm resolution. Spectral range: approximately 230-960 nm. Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°. Light beam size: microspot (365 × 470 μm2 at 75° angle of incidence). The same sample was also measured using the same spectroscopic ellipsometry method after being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.7059828

Spectroscopic ellipsometry mapping of PAAO (AJ-4-04-20 sample)

Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 4 minutes and 30 seconds. The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm2). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-4-04-20 Ellipsometry Mapping Measurements.rar" file. Ellipsometer: rotating compensator GES5-E (Semilab). Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum. Detector: UV-Vis CCD with 0.8 nm resolution. Spectral range: approximately 230-960 nm. Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°. Light beam size: microspot (365 × 470 μm2 at 75° angle of incidence). The same sample was also measured using the same spectroscopic ellipsometry method after being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.7115401

Light intensity in reflection mode of PAAO (AJ-5-04-27 sample, 2nd anodization)

Light intensity data recorded during the anodization of aluminum monocrystal. Light source: SLS201L/M (ThorLabs). Spectrometer: USB4000 (OceanOptics). Spectra acquisition software: SpectraSuite (OceanOptics). Integration time: 380 µs. Scans to average: 10. Spectrum is recorded every 500 ms during anodization. ref.txt includes reference spectra just before the start of anodization process. All measurements data is also included in a single "AJ-5-04-27.zip" file. Anodization was performed in 0.3 mol/L oxalic acid at 40 V for 4 min 57 s.

Light intensity in reflection mode of PAAO (AJ-3-04-20 sample, 2nd anodization)

Light intensity data recorded during the anodization of aluminum monocrystal. Light source: SLS201L/M (ThorLabs). Spectrometer: USB4000 (OceanOptics). Spectra acquisition software: SpectraSuite (OceanOptics). Integration time: 380 µs. Scans to average: 10. Spectrum is recorded every 500 ms during anodization. ref.txt includes reference spectra just before the start of anodization process. All measurements data is also included in a single "AJ-3-04-20.zip" file. Anodization was performed in 0.3 mol/L oxalic acid at 40 V for 4 min 8 s.

Light intensity in reflection mode of PAAO (AJ-4-04-20 sample, 2nd anodization)

Light intensity data recorded during the anodization of aluminum monocrystal. Light source: SLS201L/M (ThorLabs). Spectrometer: USB4000 (OceanOptics). Spectra acquisition software: SpectraSuite (OceanOptics). Integration time: 360 µs. Scans to average: 10. Spectrum is recorded every 500 ms during anodization. ref.txt includes reference spectra just before the start of anodization process. All measurements data is also included in a single "AJ-1-04-20.zip" file. Anodization was performed in 0.3 mol/L oxalic acid at 40 V for 4 min 30 s.

Light intensity in reflection mode of PAAO (AJ-2-04-20 sample, 2nd anodization)

Light intensity data recorded during the anodization of aluminum monocrystal. Light source: SLS201L/M (ThorLabs). Spectrometer: USB4000 (OceanOptics). Spectra acquisition software: SpectraSuite (OceanOptics). Integration time: 360 µs. Scans to average: 10. Spectrum is recorded every 500 ms during anodization. ref.txt includes reference spectra just before the start of anodization process. All measurements data is also included in a single "AJ-2-04-20.zip" file. Anodization was performed in 0.3 mol/L oxalic acid at 40 V for 3 min 37 s.

Light intensity in reflection mode of PAAO (AJ-1-04-20 sample, 2nd anodization)

Light intensity data recorded during the anodization of aluminum monocrystal. Light source: SLS201L/M (ThorLabs). Spectrometer: USB4000 (OceanOptics). Spectra acquisition software: SpectraSuite (OceanOptics). Integration time: 330 µs. Scans to average: 10. Spectrum is recorded every 500 ms during anodization. ref.txt includes reference spectra just before the start of anodization process. All measurements data is also included in a single "AJ-1-04-20.zip" file. Anodization was performed in 0.3 mol/L oxalic acid at 40 V for 3 min 16 s.

Light intensity in reflection mode of PAAO (AJ-3-04-20 sample, 1st anodization)

Light intensity data recorded during the anodization of aluminum monocrystal. Light source: SLS201L/M (ThorLabs). Spectrometer: USB4000 (OceanOptics). Spectra acquisition software: SpectraSuite (OceanOptics). Integration time: 360 us. Scans to average: 10. Spectrum is recorded every 2 s during anodization. ref.txt includes reference spectra just before the start of anodization process. All measurements data is also included in a single "AJ-3-04-20.zip" file. Anodization was performed in 0.3 mol/L oxalic acid at 40 V for 1 hour.

SEM images of PAAO samples (AJ series 1-to-5)

Scanning electron microscopy (SEM) images of porous anodized aluminum oxide (PAAO) samples. The samples were made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for: 3 min 16 s (AJ-1), 3 min 37 s (AJ-2), 4 min 8 s (AJ-3), 4 min 30 s (AJ-4), 4 min 57 s (AJ-5). The imaging was performed on the surface (top) of the sample, darker parts represent pores. SEM: FEI Quanta 200 FEG (FEI). Vacuum mode: high vacuum (< 6·10-4 Pa). Accelerating voltage: 20 kV. Magnification: 50 000, 100 000, 200 000.

Spectroscopic ellipsometry mapping of PAAO (AJ-6-03-31 sample)

Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO). The sample was made by anodization of aluminum polycrystal in 0.3 mol/L oxalic acid at 40 V for 3 minutes and 42 seconds. The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm2). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-6-03-31 Ellipsometry Mapping Measurements.rar" file. Ellipsometer: rotating compensator GES5-E (Semilab). Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum. Detector: UV-Vis CCD with 0.8 nm resolution. Spectral range: approximately 230-960 nm. Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°. Light beam size: microspot (365 × 470 μm2 at 75° angle of incidence). The same sample was also measured using the same spectroscopic ellipsometry method after being covered with hydrogenated amorphous diamond-like carbon and silver nanocomposite. The data can be found here: <a href="https://doi.org/10.5281/zenodo.7257252">https://doi.org/10.5281/zenodo.7257252</a>

Spectroscopic ellipsometry mapping of PAAO (AJ-7-03-31 sample)

Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO). The sample was made by anodization of aluminum polycrystal in 0.3 mol/L oxalic acid at 40 V for 4 minutes and 35 seconds. The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm2). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-7-03-31 Ellipsometry Mapping Measurements.rar" file. Ellipsometer: rotating compensator GES5-E (Semilab). Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum. Detector: UV-Vis CCD with 0.8 nm resolution. Spectral range: approximately 230-960 nm. Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°. Light beam size: microspot (365 × 470 μm2 at 75° angle of incidence). The same sample was also measured using the same spectroscopic ellipsometry method after being covered with hydrogenated amorphous diamond-like carbon and silver nanocomposite. The data can be found here: <a href="https://doi.org/10.5281/zenodo.7257907">https://doi.org/10.5281/zenodo.7257907</a>

Spectroscopic ellipsometry mapping of PAAO (AJ-8-03-31 sample)

Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO). The sample was made by anodization of aluminum polycrystal in 0.3 mol/L oxalic acid at 40 V for 5 minutes and 4 seconds. The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm2). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-8-03-31 Ellipsometry Mapping Measurements.rar" file. Ellipsometer: rotating compensator GES5-E (Semilab). Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum. Detector: UV-Vis CCD with 0.8 nm resolution. Spectral range: approximately 230-960 nm. Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°. Light beam size: microspot (365 × 470 μm2 at 75° angle of incidence). The same sample was also measured using the same spectroscopic ellipsometry method after being covered with hydrogenated amorphous diamond-like carbon and silver nanocomposite. The data can be found here: <a href="https://doi.org/10.5281/zenodo.7260186">https://doi.org/10.5281/zenodo.7260186</a>

Spectroscopic ellipsometry mapping of PAAO:Au (AJ-2-04-20-Au sample)

Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide covered with gold nanoparticles (PAAO:Au). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 3 minutes and 37 seconds. Then it was dip-coated in 60 nm diameter gold nanoparticles suspension. Extraction speed was 500 nm/s. The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm2). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-2-04-20-Au Ellipsometry Mapping Measurements.rar" file. Ellipsometer: rotating compensator GES5-E (Semilab). Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum. Detector: UV-Vis CCD with 0.8 nm resolution. Spectral range: approximately 230-960 nm. Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°. Light beam size: microspot (365 × 470 μm2 at 75° angle of incidence). The same sample was also measured using the same spectroscopic ellipsometry method before being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.5718202

Spectroscopic ellipsometry mapping of PAAO:Au (AJ-1-04-20-Au sample)

Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide covered with gold nanoparticles (PAAO:Au). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 3 minutes and 16 seconds. Then it was dip-coated in 60 nm diameter gold nanoparticles suspension. Extraction speed was 500 nm/s. The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm2). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-1-04-20-Au Ellipsometry Mapping Measurements.rar" file. Ellipsometer: rotating compensator GES5-E (Semilab). Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum. Detector: UV-Vis CCD with 0.8 nm resolution. Spectral range: approximately 230-960 nm. Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°. Light beam size: microspot (365 × 470 μm2 at 75° angle of incidence). The same sample was also measured using the same spectroscopic ellipsometry method before being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.5718025

Spectroscopic ellipsometry mapping of PAAO:Au (AJ-3-04-20-Au sample)

Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide covered with gold nanoparticles (PAAO:Au). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 4 minutes and 8 seconds. Then it was dip-coated in 60 nm diameter gold nanoparticles suspension. Extraction speed was 500 nm/s. The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm2). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-3-04-20-Au Ellipsometry Mapping Measurements.rar" file. Ellipsometer: rotating compensator GES5-E (Semilab). Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum. Detector: UV-Vis CCD with 0.8 nm resolution. Spectral range: approximately 230-960 nm. Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°. Light beam size: microspot (365 × 470 μm2 at 75° angle of incidence). The same sample was also measured using the same spectroscopic ellipsometry method before being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.5718424

Spectroscopic ellipsometry mapping of PAAO:Au (AJ-4-04-20-Au sample)

Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide covered with gold nanoparticles (PAAO:Au). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 4 minutes and 30 seconds. Then it was dip-coated in 60 nm diameter gold nanoparticles suspension. Extraction speed was 500 nm/s. The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm2). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-4-04-20-Au Ellipsometry Mapping Measurements.rar" file. Ellipsometer: rotating compensator GES5-E (Semilab). Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum. Detector: UV-Vis CCD with 0.8 nm resolution. Spectral range: approximately 230-960 nm. Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°. Light beam size: microspot (365 × 470 μm2 at 75° angle of incidence). The same sample was also measured using the same spectroscopic ellipsometry method before being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.5734486

Spectroscopic ellipsometry mapping of PAAO:Au (AJ-5-04-27-Au sample)

Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide covered with gold nanoparticles (PAAO:Au). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 4 minutes and 57 seconds. Then it was dip-coated in 60 nm diameter gold nanoparticles suspension. Extraction speed was 500 nm/s. The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm2). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-5-04-27-Au Ellipsometry Mapping Measurements.rar" file. Ellipsometer: rotating compensator GES5-E (Semilab). Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum. Detector: UV-Vis CCD with 0.8 nm resolution. Spectral range: approximately 230-960 nm. Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°. Light beam size: microspot (365 × 470 μm2 at 75° angle of incidence). The same sample was also measured using the same spectroscopic ellipsometry method before being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.5734894

FDTD simulation of 230 nm thickness PAAO with Au NPs in different mediums (AoI 60 deg., s- and p-polarizations)

FDTD software: Lumerical (Ansys, version 2021 R2.3). Structure: aluminum (Palik) substrate; 230 nm thickness (h) aluminum oxide (Palik) layer with 35 nm diameter (RPo) cylindrical pores with 100 nm distance (D) between the pore centers (representing porous anodized aluminum oxide - PAAO); 60 nm diameter (RNP) gold (Johnson and Christy) nanoparticles (Au NPs) placed directly above each pore. Refractive index of the surrounding medium (n): 1.0; 1.1. Simulation region: from 300 nm below the substrate/PAAO interface to 1.3 µm above PAAO surface; x and y spans are equal to one period of the structure. Mesh override region: from 50 nm below the PAAO to 50 nm above the nanoparticles; 2 nm step size in each direction. Light source: BFAST plane wave light source; 500 nm above PAAO; 60° angle of incidence (ang); 300 nm – 1000 nm wavelength range; s- and p-polarizations (pol). Monitors (frequency domain field and power): (1) 2D Z-normal; 1 µm above PAAO; results are in "_reflection.txt" files. (2) 2D Y-normal; centered to the structure; starts 50 nm below PAAO and ends 50 nm above nanoparticles; results are in ".fsp" files. (3) 2D X-normal; centered to the structure; starts 50 nm below PAAO and ends 50 nm above nanoparticles; results are in ".fsp" files. Information in the file name: h - thickness of PAAO; pol - polarization; RNP - diameter of gold nanoparticles; RPo - diameter of pores; D - distance between pore centers; ang - angle of incidence; n - refractive index of surrounding medium. Files: (1) "_reflection.txt" - lambda(nm) (first column) - wavelength in nanometers; Y (second column) - T data from the monitor above the structure. (2) "_p0.log" - log file produced by the software while running the simulation. (3) ".fsp" - Lumerical software file containing the simulation project; it can be used to extract data from Y- and X-normal monitors (license required to open these files). (4) "Lumerical_Screenshots.pdf" - shows software screenshots for every object and its every property; red text is added to show which values are different for different simulations. (5) "Structure_Illustration.png" - a schematic of modeled structure. (6) "h230.jpg" - a preview of data from "_reflection.txt" files.