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130 results for “Power Systems”
Estimation of Faults in DC Electrical Power System
This paper demonstrates a novel optimizationbased approach to estimating fault states in a DC power system. The model includes faults changing the circuit topology along with sensor faults. Our approach can be considered as a relaxation of the mixed estimation problem. We develop a linear model of the circuit and pose a convex problem for estimating the faults and other hidden states. A sparse fault vector solution is computed by using l1 regularization. The solution is computed reliably and efficiently, and gives accurate diagnostics on the faults. We demonstrate a real-time implementation of the approach for an instrumented electrical power system testbed at NASA. Accurate estimates of multiple faults are computed in milliseconds on a PC. The approach performs well despite unmodeled transients and other modeling uncertainties present in the system.
Diagnosing Faults in Electrical Power Systems of Spacecraft and Aircraft
Electrical power systems play a critical role in spacecraft and aircraft, and they exhibit a rich variety of failure modes. This paper discusses electrical power system fault diagnosis by means of probabilistic techniques. Specically, we discuss our development of a diagnostic capability for an electrical power system testbed, ADAPT, located at NASA Ames. We emphasize how we have tackled two challenges, regarding modelling and real-time performance, often encountered when developing diagnostic applications. We carefully discuss our Bayesian network modeling approach for electrical power systems. To achieve real-time performance, we build on recent theoretically well-founded developments that compile a Bayesian network into an arithmetic circuit. Arithmetic circuits have low footprint and are optimized for embedded, real-time systems such as spacecraft and aircraft. We discuss our probabilistic diagnostic models developed for ADAPT along with successful experimental results.
Probabilistic Fault Diagnosis in Electrical Power Systems
Electrical power systems play a critical role in spacecraft and aircraft. This paper discusses our development of a diagnostic capability for an electrical power system testbed, ADAPT, using probabilistic techniques. In the context of ADAPT, we present two challenges, regarding modelling and real-time performance, often encountered in real-world diagnostic applications. To meet the modelling challenge, we discuss our novel high-level specification language which supports auto-generation of Bayesian networks. To meet the real-time challenge, we compile Bayesian networks into arithmetic circuits. Arithmetic circuits typically have small footprints and are optimized for the real-time avionics systems found in spacecraft and aircraft. Using our approach, we present how Bayesian networks with over 400 nodes are auto-generated and then compiled into arithmetic circuits. Using real-world data from ADAPT as well as simulated data, we obtain average inference times smaller than one millisecond when computing diagnostic queries using arithmetic circuits that model our real-world electrical power system. Reference: O. J. Mengshoel, A. Darwiche, K. Cascio, M. Chavira, S. Poll, and S. Uckun, “Diagnosing Faults in Electrical Power Systems of Spacecraft and Aircraft”, In Proc. of the Twentieth Innovative Applications of Artificial Intelligence, Conference (IAAI-08), Chicago, IL, 2008. BibTex Reference: @inproceedings{mengshoel08diagnosing, author = {Mengshoel, O. J. and Darwiche, A. and Cascio, K. and Chavira, M. and Poll, S. and Uckun, S.}, title = {Diagnosing Faults in Electrical Power Systems of Spacecraft and Aircraft}, booktitle = {Proceedings of the Twentieth Innovative Applications of Artificial Intelligence Conference (IAAI-08)}, pages = {1699--1705}, address = {Chicago, IL}, year = {2008} }
New Sensing Application to Diagnose Power Semiconductor Aging in Actuator Power Drive Systems
This paper presents a new sensing application to diagnose power semiconductor aging in power drive systems. It has been shown previously that device parasitic characteristics change during the aging process which results in detectable changes in their frequency response. This change is manifested in the current signal at very high frequencies. Therefore, using a wideband AC current sensor, high frequency components of the current can be acquired, providing a way to detect device aging.
Accelerated Aging System for Prognostics of Power Semiconductor Devices
Prognostics is an engineering discipline that focuses on estimation of the health state of a component and the prediction of its remaining useful life (RUL) before failure. Health state estimation is based on actual conditions and it is fundamental for the prediction of RUL under anticipated future usage. Failure of electronic devices is of great concern as future aircraft will see an increase of electronics to drive and control safety-critical equipment throughout the aircraft. Therefore, development of prognostics solutions for electronics is of key importance. This paper presents an accelerated aging system for gate-controlled power transistors. This system allows for the understanding of the effects of failure mechanisms, and the identification of leading indicators of failure which are essential in the development of physics-based degradation models and RUL prediction. In particular, this system isolates electrical overstress from thermal overstress. Also, this system allows for a precise control of internal temperatures, enabling the exploration of intrinsic failure mechanisms not related to the device packaging. By controlling the temperature within safe operation levels of the device, accelerated aging is induced by electrical overstress only, avoiding the generation of thermal cycles. The temperature is controlled by active thermal-electric units. Several electrical and thermal signals are measured in-situ and recorded for further analysis in the identification of leading indicators of failures. This system, therefore, provides a unique capability in the exploration of different failure mechanisms and the identification of precursors of failure that can be used to provide a health management solution for electronic devices.
High power of 0.26 Terahertz radiation induced genes involved in immune system and nervous system changes in the nematode Caenorhabditis Elegans
GEO Series GSE243842. Caenorhabditis elegans. 6 samples. Type: Expression profiling by high throughput sequencing.
Dataset for optimization results of circulating cooling water system for codensning power plant
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Hand-powered interfacial electric-field-enhanced water disinfection system
GEO Series GSE305452. Escherichia coli. 6 samples. Type: Expression profiling by high throughput sequencing.
Trustworthiness of Artificial Intelligence – Powered Autonomous Healthcare Systems: An Assessment Framework Informed by Experts Insights
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JochenC/Power-System-Operation-Using-Learned-Security-Rules--A-Disjunctive-Optimization-Approach: Power System Operation using Learned Security Rules: A Disjunctive Optimization Approach
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