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15 results for “Electron backscatter diffraction”
Refinements for Bragg coherent X-ray diffraction imaging: Electron backscatter diffraction alignment and strain field computation
<p>Here we present the final crystal reconstructions and analysis scripts for the paper titled "Refinement for Bragg coherent X-ray diffraction imaging: Electron backscatter diffraction alignment and strain field computation" published in Journal of Applied Crystallography, 55, 2022. Please see the README file for more information.</p>
A simple, static and stage mounted direct electron detector based electron backscatter diffraction system
<h3><strong>Data set for </strong><i><strong>A simple, static and stage mounted direct electron detector based electron backscatter diffraction system</strong></i></h3><p>T.Zhang, T. B. Britton</p><p> </p><h3><strong>Contents</strong></h3><p><strong>- New in v2.0.0: CAD drawings of the stage</strong></p><p> </p><p>- Single Si(100) diffraction patterns at 4 camera lengths, and at 4 corners of the sample</p><p>- Horizontal and vertical line scan on Si(100) with 20 grid points</p><p>- 20x20 mapping scan on a polycrystalline Cu sample</p><p>Scan parameters for the line scans and map are included in logfiles within each subfolder.</p><p> </p><p>All pattern files are provided in .h5 format and .tif format. Analyses of the patterns were performed with AstroEBSD and MTEX.</p>
Electron Backscatter Diffraction Patterns from Titanium-added Interstitial-free Steel Containing Subgrains
<h3><strong>Associated Publications</strong></h3> <ol> <li>Bennett IV, T.J. and Taleff, E.M. Dynamic Grain Growth Driven by Subgrain Boundaries in an Interstitial-Free Steel During Deformation at 850 °C. <em>Metall Mater Trans A</em> 55, 429–446 (2024). <a href="https://doi.org/10.1007/s11661-023-07256-w">https://doi.org/10.1007/s11661-023-07256-w</a>.</li> <li>Bennett IV, T.J. and Taleff, E.M. Imaging and Segmenting Grains and Subgrains using Backscattered Electron Techniques. Under review (2024).</li> </ol> <h3><strong>Data Description</strong></h3> <p>These data were collected by Thomas J. Bennett IV on July 28, 2022.</p> <p>The electron backscatter diffraction (EBSD) data and associated electron backscatter diffraction patterns (EBSPs) contained herein were acquired from a titanium-added interstitial-free (Ti-IF) steel sheet material containing numerous subgrains. The Ti-IF steel specimen that provided these data was ramped to 850 degrees Celsius over 30 minutes, held at this temperature for one hour, and then deformed at a constant true-strain rate of 10^-4 s^-1. Upon reaching a final true strain of 0.225, the specimen was air quenched while maintaining a constant stress to preserve subgrains formed during high-temperature deformation. The tensile specimen was cut from a Ti-IF steel sheet received in a hard as-rolled condition with the tensile axis parallel to the sheet rolling direction. EBSPs were acquired from a section cut from the center of the deformed gage region using a JEOL JSM-IT300HR SEM equipped with an EDAX Velocity EBSD camera at the Center for Integrated Nanotechnologies.</p> <p>The following conditions were used for EBSD data acquisition:</p> <table> <tbody> <tr> <td>Accelerating Voltage:</td> <td>20 kV</td> </tr> <tr> <td>Beam Current:</td> <td>80%</td> </tr> <tr> <td>Working Distance:</td> <td>20.0 mm</td> </tr> <tr> <td>Magnification:</td> <td>200×</td> </tr> <tr> <td>Dynamic Focus:</td> <td>44 (out of 255, arbitrary units)</td> </tr> <tr> <td>Specimen Tilt:</td> <td>70 degrees</td> </tr> <tr> <td>Scanning Grid Type:</td> <td>Square</td> </tr> <tr> <td>Step Size (x and y):</td> <td>0.5 μm</td> </tr> <tr> <td>Scan Size:</td> <td>520 (across) × 340 (down) pixels</td> </tr> <tr> <td>EBSD Camera Resolution:</td> <td>446 × 446 pixels</td> </tr> <tr> <td>EBSD Camera Binning:</td> <td>1 × 1</td> </tr> <tr> <td>EBSD Camera Exposure Time:</td> <td>10 ms</td> </tr> <tr> <td>Frame Averaging:</td> <td>None</td> </tr> <tr> <td>Specimen Tensile Direction:</td> <td>Horizontal</td> </tr> <tr> <td>Specimen Rolling Direction:</td> <td>Horizontal</td> </tr> <tr> <td>Specimen Long Transverse Direction:</td> <td>Vertical</td> </tr> <tr> <td>Specimen Short Transverse Direction:</td> <td>Normal to plane</td> </tr> <tr> <td>Pattern Center (EMSphInx Convention):</td> <td>(x_pc, y_pc, L) = (-0.2 pixels, 112.76 pixels, 21736.4 μm)</td> </tr> <tr> <td>EBSD Camera Elevation Angle:</td> <td>3 degrees</td> </tr> <tr> <td>EBSD Camera Screen Width:</td> <td>32 mm</td> </tr> <tr> <td>Pixel size on EBSD Camera Screen:</td> <td>71.749 μm/pixel ( = 32000 μm / 446 pixels)</td> </tr> </tbody> </table> <p> </p> <p><em>Note:</em> Conversions between different pattern center conventions may be found in the journal article below or at the following link: <a href="https://github.com/EMsoft-org/EMsoft/wiki/DItutorial">https://github.com/EMsoft-org/EMsoft/wiki/DItutorial</a>.</p> <ul> <li>Jackson, M.A., Pascal, E., and De Graef, M. Dictionary Indexing of Electron Back-Scatter Diffraction Patterns: a Hands-On Tutorial. <em>Integr Mater Manuf Innov</em> 8, 226–246 (2019). <a href="https://doi.org/10.1007/s40192-019-00137-4">https://doi.org/10.1007/s40192-019-00137-4</a>.</li> </ul> <h3><strong>File Descriptions</strong></h3> <ul> <li>Specimen_orientation.pdf - A schematic showing specimen reference directions and the orientation used for EBSD data acquisition.</li> <li>Patterns.zip - A compressed archive containing Patterns.up2. This file contains 16-bit EBSPs and is 70,336,697,616 bytes (70.3 GB) uncompressed.</li> <li>SHT_Indexed.ang - A file containing orientation data produced by indexing Patterns.up2 using EMSphInx. Orientations are represented by Euler angles (Bunge convention) and are to be interpreted using the EDAX Setting 2 convention (see MTEX documentation at <a href="https://mtex-toolbox.github.io/EBSDReferenceFrame.html">https://mtex-toolbox.github.io/EBSDReferenceFrame.html</a>).</li> <li>SHT_Indexed.h5 - A file in HDF5 format containing orientation data and other relevant information produced by indexing Patterns.up2 using EMSphInx.</li> <li>SHT_Indexed_IPFmap.png - An image of an inverse pole figure map colored with respect to the short transverse direction showing the data from SHT_Indexed.ang.</li> </ul> <p><em>Note:</em> The basic format of "up2" files is the following. The first 4 bytes provide the version number. The second 4 bytes are the width of the patterns. The third 4 bytes are the height of the patterns. The fourth 4 bytes are the starting position of the pattern image data.</p> <h3><strong>Acknowledgments</strong></h3> <p>The authors gratefully acknowledge support from the National Science Foundation under Grant DMR-2003312 and instrumentation under Grant DMR-9974476. The authors also gratefully acknowledge support from the U.S. Department of Energy, Office of High Energy Physics under Grant DE-SC0009960. This work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science by Los Alamos National Laboratory (Contract 89233218CNA000001) and Sandia National Laboratories (Contract DE-NA-0003525). The authors thank Mr. Thomas Cayia (Arcelor Mittal) for providing the interstitial-free steel material used for this study.</p>
Data for "The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements"
<p>Data for "The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements"</p> <p>Vivian Tong1, Jun Jiang1, Angus J Wilkinson2, and T Ben Britton1<br /> 1. Department of Materials, Imperial College London, Prince Consort Road, London, SW7 2AZ, UK<br /> 2. Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK</p> <p>For more information please contact: b.britton@imperial.ac.uk (Ben Britton)</p> <p>--<br /> The zip contains three subfolders:<br /> Fig4 Interaction volume measurement<br /> Fig14 Error approaching gb<br /> Fig16 GrainBoundaryProbability</p> <p>--<br /> Further details:</p> <p>Fig4 Interaction volume measurement -</p> <p>Measurement and simulation data of EBSD inteaction volume</p> <p>Includes calculated model & EBSD patterns for measurement<br /> EBSD patterns are from Zircaloy-4 and scanned on a Bruker eFlashHR camera in high resolution mode (1600 x 1200) attached to a Zeiss Auriga-40 SEM. The sample was tilted to 70 degrees and the SEM image shows the tilt corrected scanned region.</p> <p><br /> Fig14 Error approaching gb -<br /> 15 patterns are included that were used to create many simulated grain boundary pairs. These were captured from the same sample as used in Fig4.<br /> The spreadsheet details results shown in Fig 4.</p> <p><br /> Fig 16 GrainBoundary Pobability -<br /> This describes results from the simple Voronoi tessalation model (virtual grain structure) and sampling with a fixed step size, similar to a real EBSD scan. Probabilities were calcualted for different interaction volume sizes and critical distances.</p> <p> </p>
Data for: Optimizing broad ion beam polishing of zircaloy-4 for electron backscatter diffraction analysis
<p>This is the data to support a manuscript that explores how to optimize sample preparation of zircaloy-4 using broad ion beam polishing.</p> <p>If you wish to follow-up on this data, please contact Dr Ben Britton (ben.britton@ubc.ca).</p> <p>The data was collected and curated by Ning Fang and Ruth Birch.</p>
Electron backscatter diffraction data and backscatter electron images from a cold-rolled and recovered Al-Mn alloy
<p>Three electron backscatter diffraction (EBSD) data sets and three sets of backscatter electron (BSE) images from the same region of interest in a cold-rolled and recovered Al-Mn alloy.</p> <p>The data forms part of the supplementary material to the paper H W Ånes, A T J van Helvoort, K Marthinsen "Correlated subgrain and particle analysis of a recovered Al-Mn alloy by directly combining EBSD and backscatter electron imaging" (2022), published in Materials Characterization.</p> <p>The data was acquired in order to study the effect of particles on recovery and recrystallization in the Al-Mn alloy. The particles detected in the BSE images were inserted in the EBSD map after the EBSD map had been corrected for distortions by image registration using the BSE images.</p> <p>See the GitHub repository https://github.com/hakonanes/correlated-grains-particles-workflow for Jupyter notebooks and (MATLAB) MTEX scripts used to analyze the data.</p>
Electron backscatter diffraction data and backscatter electron images from four conditions from a cold-rolled and annealed Al-Mn alloy
<p>Raw electron backscatter diffraction (EBSD) datasets and backscatter electron (BSE) images acquired from four conditions from a cold-rolled and non-isothermally annealed Al-Mn alloy: as deformed, 175 C, 300 C and 325 C. The heating rate is 50 C/h. The material is recovered after 300 C and partly recrystallized after 325 C.</p> <p>The data forms part of the supplementary material to the paper "Orientation dependent pinning of (sub)grains by dispersoids during recovery and recrystallization in an Al-Mn alloy" (2023) published in Acta Materialia (https://doi.org/10.1016/j.actamat.2023.118761).</p> <p>The data was acquired in order to study the effect of particles on recovery and recrystallization in the Al-Mn alloy. The particles detected in the BSE images were inserted in the EBSD map after the EBSD map had been corrected for distortions by image registration using the BSE images.</p> <p>See the <em>GitHub</em> repository https://github.com/hakonanes/p-texture-al-mn-alloys for <em>Jupyter</em> notebooks and <em>MTEX</em> (<em>MATLAB</em>) and <em>ImageJ</em> scripts used to process and analyze the data.</p> <p>See the <em>README.txt </em>file for a description of the file contents.</p>
Electron backscatter diffraction patterns from a single crystal silicon wafer
<p>An electron backscatter diffraction (EBSD) dataset of (50, 50) patterns of (480, 480) pixel resolution from a single crystal silicon wafer. The patterns were acquired on a NORDIF UF-1100 detector in a Zeiss Supra 55 VP FEG SEM operated at 20 kV. The working distance was 16.1 mm and the nominal sample tilt was 70<span class="math-tex">\(^{\circ}\)</span>. The nominal step size is 40 μm, so the scan covers a nominal area of (2 x 2) μm<sup>2</sup>.</p> <p>The patterns are stored in NORDIF's binary file format (Pattern.dat) with the top-left pixel in the top-left pattern as the first byte, and the bottom-right pixel in the bottom-right pattern as the last byte. The patterns can be opened in for example the open-source Python package kikuchipy (https://github.com/pyxem/kikuchipy) with the following commands:</p> <pre><code class="language-python">import kikuchipy as kp s = kp.load("Pattern.dat")</code></pre>
Dataset for: Characterization of local deformation around hydrides in Zircaloy-4 using conventional and high angular resolution electron backscatter diffraction
<p>Datasets for:</p> <p>Characterization of local deformation around hydrides in Zircaloy-4 using conventional and high angular resolution electron backscatter diffraction</p> <p>Ruth M. Birch<sup>1,2*</sup>, James O. Douglas<sup>1</sup>, T. Ben Britton<sup>1,2</sup></p> <ol> <li>Department of Materials, Imperial College London, Exhibition Road, London, UK, SW7 2AZ</li> <li>Department of Materials Engineering, University of British Columbia, Frank Forward Building, 309-6350 Stores Road, Vancouver, BC, Canada V6T 1Z4</li> </ol> <p>---</p> <p>h5 files for all 4 examples used in the paper:</p> <ul> <li>Example 1: JustGBZrH_20kx_WD16-4_DD17_T10-4_Px100nm</li> <li>Example 2: ZrH_WD16_DD18_T10-4_px0</li> <li>Example 3: 20kx_WD16-5_DD17_T10-2_Px0-1um.</li> <li>Example 4: ZrHSpikes_18kx_WD16-5_DD17_T10-2_Px100nm<br> </li> </ul> <p>High quality figures for all figures in the paper (600 dpi)</p> <p> </p>
Data for "TrueEBSD: correcting spatial distortions in electron backscatter diffraction maps"
<p>Data for "TrueEBSD: correcting spatial distortions in electron backscatter diffraction maps" published in Ultramicroscopy.</p> <p>Journal DOI: <a href="https://doi.org/10.1016/j.ultramic.2020.113130">https://doi.org/10.1016/j.ultramic.2020.113130</a>;<br> Preprint DOI: <a href="https://arxiv.org/abs/1909.00347">https://arxiv.org/abs/1909.00347</a>.</p> <p>The zipped folder contains:</p> <ol> <li>Readme (text file)</li> <li>'Ti-64' data subfolder: data for one of the maps in the Ti-64 map stitching example</li> <li>'ZrH' data subfolder: data for the hydride-containing Zircaloy-4 example</li> <li>'CP-Zr' data subfolder: data for the in-situ deformed Zr example</li> <li> 'MATLAB scripts' subfolder: TrueEBSD source code.</li> </ol> <p> </p> <p>Each data subfolder contains:</p> <ul> <li>Input image files</li> <li>EBSD orientation files in Bruker CTF format</li> <li>'Outputs' subfolder containing output figures as image files.</li> </ul> <p>The 'MATLAB scripts' subfolder contains TrueEBSD source code:</p> <ul> <li>The primary user interface is 'input_deck.m'. Most user settings can be changed here. <ul> <li>The input deck entries here have been pre-filled for the Ti-64 dataset.</li> </ul> </li> <li>To use TrueEBSD, run 'input_deck.m' in MATLAB.</li> <li>The method is outlined in 'main.m', which calls functions in 'MATLAB scripts\code\'.</li> </ul>
Dataset for: Improving parent-austenite twinned grain reconstruction using electron backscatter diffraction in low carbon austenite
<p><strong>Improving parent-austenite twinned grain reconstruction using electron backscatter diffraction in low carbon austenite</strong></p> <p><strong> </strong>Ruth M. Birch<sup>1</sup>*, T. Ben Britton<sup>1</sup>, W. J. Poole<sup>1</sup></p> <p>1. Department of Materials Engineering, University of British Columbia, Frank Forward Building, 309-6350 Stores Road, Vancouver, BC, Canada V6T 1Z4</p> <p>*corresponding author: ruth.birch@ubc.ca</p> <p>---</p> <p><strong>Abstract: <br></strong></p> <p>Thermomechanical controlled processing (TMCP) is widely used to optimize the final properties of high strength low alloy (HSLA) steels, via microstructure engineering. The room temperature microstructures are influenced by the high temperature austenite phase, and the austenite microstructure <span>is commonly</span><span>can be</span> accessed by reconstruction using electron backscatter diffraction (EBSD) data of the final microstructure. A challenge for reconstruction of the <span>PAG </span><span>parent austenite grain (PAG) </span>microstructure and subsequent austenite grain size measurement is the presence of austenite-phase annealing twins, and we address<span> this</span> challenge with a new <span>‘</span>re-sort<span>’</span> algorithm. Our algorithm has been validated using the retained austenite regions (which were recovered via advanced pattern matching of EBSD patterns). We demonstrate that the re-sort algorithm improves the PAG reconstruction significantly, especially for the grain boundary network and correlation with other methods of grain size assessment and development of TMCP steels.</p> <p>---</p> <p><strong>Dataset includes:</strong></p> <ul> <li>Higher quality figures</li> <li>EBSD dataset with/without pattern matching:<br> <ul> <li>1mm map Specimen 1 Site 1 Map Data 1-Subset 1.h5oina</li> <li>1mm map Specimen 1 Site 1 Map Data 1-Subset 1-PatternMatching.h5oina</li> </ul> </li> <li>Code bundle</li> </ul>
Data Bundle for "Rapid electron backscatter diffraction mapping: Painting by numbers"
<p>This data is a release of EBSD data for "Rapid electron backscatter diffraction mapping: Painting by numbers"<br> Figure 5 and Figure 6 contain the EBSD data.<br> FFArgus.png = far field ARGUS image <br> NFArgus.png = near field ARGUS image<br> IPF = image data for the EBSD data<br> *.ctf = export of Bruker CTF data for full EBSD map to plot EBSD maps (e.g. in MTEX)<br> *.txt = reconstructed EBSD data in columns: euler1 euler 2 euler 3 euler 3 xpos ypos phaseID<br> *.prg = Bruker project file (use this to link the EBSD patterns to the NF Argus image)<br> EBSP folder = EBSPs as captured.</p> <p>The data bundle was prepared by Ben Britton (b.britton@imperial.ac.uk).</p> <p>The figures are presented in the powerpoint (which can be extracted as a zip if needed).</p>
Data for 'The effect of δ-hydride on the micromechanical deformation of a Zr alloy studied by in situ high angular resolution electron backscatter diffraction'
<p>This is the data bundle for <br> "The effect of delta-hydride on the micromechanical deformation of a Zr alloy studied by in situ high angular resolution electron backscatter diffraction" <br> published in Scripta Materialia in 2019</p> <p>Siyang Wang 1, Szilvia Kalácska 2, Xavier Maeder 2, Johann Michler 2, Finn Giuliani 1, T. Ben Britton 1</p> <p>1 Imperial College London, London, UK SW7 2AZ<br> 2 EMPA, Swiss Federal Laboratories for Materials Science and Technology, Laboratory for Mechanics of Materials and Nanostructures, Feuerwerkerstrasse 39, 3602, Thun, Switzerland</p> <p>Please refer to the newest version of this data bundle, if there are multiple versions.</p> <p>For more information email siyang.wang15@imperial.ac.uk (Mr. Siyang Wang).</p>
Data for 'Indexing electron backscatter diffraction patterns with a refined template matching approach'
<p>Data for 'Indexing electron backscatter diffraction patterns with a refined template matching approach'</p> <p>Alexander Foden, T Ben Britton<br> Department of Materials, Imperial College London, Prince Consort Road, London, SW7 2AZ, UK</p> <p>For more information please contact: b.britton@imperial.ac.uk (Ben Britton) or a.foden16@imperial.ac.uk (Alex Foden)</p> <p>---</p> <p>File contains:</p> <p>High resolution image for Figures 1 - 11</p> <p>CSV data files for Figures 2, 3, 4, 5, 7 and 8. Figures 1 and 6 are illustrative and contain no data.</p> <p>EBSD data for figures 9, 10 and 11 can be found here <a href="https://zenodo.org/record/3459415#.XYym9C5KhaQ">https://zenodo.org/record/3459415#.XYym9C5KhaQ</a></p>
Data from: Electron backscatter diffraction (EBSD) analysis of maniraptoran eggshells with important implications for microstructural and taphonomic interpretations
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