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5 results for “Precession Electron Diffraction”
Scanning precession electron diffraction data of partly overlapping magnesium oxide nanoparticles
<p>Scanning precession electron diffraction (SPED) data of cubical magnesium oxide (MgO) nanoparticles are provided. The MgO particles in the data are partly overlapping and some share the same orientation. The dataset was used for demonstration of nanocrystal segmentation in SPED data, which is presented in the article entitled "Nanocrystal segmentation in scanning precession electron diffraction data" [1]. In this publication, two methods for nanocrystal segmentation are presented based on; i) virtual dark-field imaging and ii) non-negative matrix factorisation, both incorporating watershed image segmentation. The workflows and code used for the segmentation demonstrated in the article are available open-source [2].</p> <p>Here, two files are provided based on one raw SPED dataset:</p> <p>- "SPED_MgO_1.hdf5": raw data cropped in navigation space to dimensions (219, 228|144, 144) and exported to hdf5, and</p> <p>- "SPED_MgO.hdf5": the same data binned by 2 in navigation space to yield dimensions (109, 114|144, 144).</p> <p>Adrian Lervik is acknowledged for specimen preparation.</p> <p>[1] Bergh, T., Johnstone, D., Crout, P., Høgås, S., Midgley, P., Holmestad, R., Vullum, P. And Van Helvoort, A. (2019), Nanocrystal segmentation in scanning precession electron diffraction data. Journal of Microscopy. doi:<a href="https://doi.org/10.1111/jmi.12850">10.1111/Jmi.12850</a></p> <p>[2] Duncan N. Johnstone, Phillip Crout, Simon Høgås, Tina Bergh, Joonatan Laulainen, & Stef Smeets. (2019). pyxem/pyxem-demos: pyxem-demos v0.10.0. Zenodo. http://doi.org/10.5281/zenodo.3533670</p> <p> </p>
Determination of the spinel content in cycled Li1.2Ni0.13Mn0.54Co0.13O2 using three-dimensional electron diffraction and precession electron diffraction
<p>(hkl,I)-lists for the 150 times cycled NMC material</p>
Precession electron diffraction dataset from nanocrystaline Cu-Ag (FCC) alloy collected on pixelated TVIPS detector
<p><strong>Summary</strong></p> <p>This is a 4D scanning transmission electron microscopy (4D STEM) dataset collected in near-parallel beam + precession mode (PED) of a nanocrystaline Cu-Ag sample, collected on a high quality pixelated detector inside a transmission electron microscope (TEM). The dataset is represented by a 4D array, comprising a 2D grid of scan points, with each scan point mapping to an electron diffraction spot pattern. From this kind of dataset it is possible to derive local crystal orientations and strains. The dataset is in the .hspy format, the native hdf5 format of the <a href="https://zenodo.org/record/5082777">HyperSpy</a> library.</p> <p><strong>Material and sample preparation</strong></p> <p>The sample was prepared from a nanocrystalline Cu-Ag thin film. The details are described in the following publication:</p> <p>Oellers, Tobias, et al. "Thin-Film Microtensile-Test Structures for High-Throughput Characterization of Mechanical Properties." <em>ACS combinatorial science</em> 22.3 (2020): 142-149.</p> <p>The sample was prepared by punching a 3 mm diameter disc out, gluing this to a Cu single hole grid, and subsequent Ar+ ion milling until perforation at 2.5 kV using a PIPS II system (Gatan). The rough milling was followed with a 0.5 kV cleaning.</p> <p><strong>Microscopy parameters and data collection</strong></p> <p>PED was performed in a JEM-2200FS TEM (JEOL) operating at 200 kV. The microscope was operated in nanobeam diffraction mode with the smallest spot size (Spot 5) and a condenser aperture size of 10 μm. The probe diameter was ~ 1 nm with a convergence angle of ~2 mrad. A precession frequency of 100 Hz and a precession angle of 0.5° were applied during the nanobeam scanning. Data was collected on a TemCam-XF416 pixelated CMOS<br> detector (TVIPS). The camera length as indicated in the operating software was 15 cm, and collected images were 2k by 2k in size (hardware binning of 2). The dataset comprises 150x150 scan points and pixel depth is 2 bytes (unsigned 16 bit integers).</p> <p><strong>Data processing</strong></p> <p>The raw data was collected in the .tvips format. The original dataset was about 100 GB in size and is no longer available. This dataset was converted to the .hspy format using the <a href="https://zenodo.org/record/4288857">TVIPSconverter</a> tool. In the conversion, the images were binned by an additional factor of 4 to a final size of 512x512. A median filter was also applied to the data.</p> <p><strong>Data characteristics</strong></p> <p>Scan shape: 150 x 150 pixels</p> <p>Image shape: 512 x 512 pixels</p> <p>Pixel dtype: uint16</p> <p>Scan pixel size: about 1 nm, scan dimensions were never calibrated</p> <p>Image pixel size: 0.01155 Angstrom<sup>-1</sup> / pixel</p> <p>Note that scale factors are not stored in the dataset! The dataset can be read with HyperSpy using the load function (please see the HyperSpy documentation). It is highly recommended to have a working installation of <a href="https://zenodo.org/record/5075520">Pyxem</a> as well to process the data.</p> <p><strong>Additional notes</strong></p> <p>Data was collected with the TVIPS scan generator which can be quite buggy. A large number of the scan points are worthless. In addition, the detector background was not properly subtracted in the image, resulting in striped artifacts in the images.</p>
Data in support of: `Two-Dimensional Strain Mapping with Scanning Precession Electron Diffraction: An Investigation into Data Analysis Routines'
<p>This upload contains data in support of a manuscript currently under review. More details to follow.</p>
Dataset for "Scanning precession electron diffraction data analysis approaches for phase mapping of precipitates in aluminium alloys"
<p>Data needed to reproduce the results in "Scanning precession electron diffraction data analysis approaches for phase mapping of precipitates in aluminium alloys" published in Ultramicroscopy. The codes and notebooks can be found at 10.5281/zenodo.8321258.</p>
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