FDTD simulation of stack of 320 nm PAAO and various thickness DLC:Ag mixture in different mediums (AoI 45 deg., s-polarization)

<p>FDTD software: Lumerical (Ansys, version 2021 R2.3).</p> <p>Structure: aluminum (Palik) substrate; 320 nm thickness (<em>h</em>e) aluminum oxide (Palik) layer with 35 nm diameter (<em>RPo</em>) cylindrical pores with 100 nm&nbsp;distance (<em>D</em>) between the pore centers (representing porous anodized aluminum oxide - PAAO); 35/50/65 nm thickness (<em>DLC</em>) layer with experimentally obtained optical properties of diamond-like carbon and silver nanocomposite (DLC:Ag). The pores extend through both PAAO and DLC:Ag layers as it was observed in SEM images. DLC:Ag optical properties are averaged result of the layer properties in DLC:Ag nanocomposite obtained by fitting spectroscopic ellipsometry data, which is available here:&nbsp;<a href="https://doi.org/10.5281/zenodo.7341684">https://doi.org/10.5281/zenodo.7341684</a> The file used in the simulations is provided in this data set. Here DLC:Ag is considered as homogeneous materials without separating DLC and Ag phases.</p> <p>Refractive index of the surrounding medium (<em>n</em>): 1.0; 1.1; 1.2; 1.3.</p> <p>Simulation region: from 300 nm below the substrate/PAAO interface to 1.3 &micro;m above PAAO surface; x and y spans are equal to one period of the structure.</p> <p>Mesh override region: from 50 nm below the PAAO to 50 nm above DLC:Ag; 2 nm step size in each direction.</p> <p>Light source: BFAST plane wave light source; 500 nm above PAAO; 45&deg; angle of incidence (<em>ang</em>); 300 nm &ndash; 1000 nm wavelength range; s-polarization (<em>pol</em>).</p> <p>Monitor (frequency domain field and power): 2D Z-normal; 1 &micro;m above PAAO; results are in &quot;<em>_reflection.txt</em>&quot; files.</p> <p>Information in the file name: <em>he</em> - thickness of PAAO; <em>DLC</em> - thickness of DLC:Ag; <em>pol</em> - polarization; <em>RPo</em> - diameter of pores; <em>D</em> - distance between pore centers; <em>ang</em> - angle of incidence; <em>n</em> - refractive index of surrounding medium.</p> <p>Files: (1) &quot;<em>_reflection.txt</em>&quot; - lambda(nm) (first column) - wavelength in nanometers; Y (second column) - T data from the monitor above the structure. (2) &quot;<em>_p0.log</em>&quot; - log file produced by the software while running the simulation. (3) &quot;<em>.fsp</em>&quot; - Lumerical software file containing the simulation project (license required to open these files). (4) &quot;<em>Lumerical_Screenshots.pdf</em>&quot; - shows software screenshots for every object and its every property; red text is added to show which values are different for different simulations. (5) &quot;<em>Structure_Illustration.png</em>&quot; - a schematic of modeled structure. (6) &quot;PAAO320nm<em>.jpg</em>&quot; - a preview of data from &quot;<em>_reflection.txt</em>&quot; files. (7) &quot;<em>DLC_Ag_SE_nk_average.txt</em>&quot; - contains DLC:Ag optical properties (first column - wavelength in nanometers; second column - refractive index; third column - extinction coefficient).</p>