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21 results for “ellipsometry”
Pushing the Study of Point Defects in Thin Film Ferrites to Low Temperatures Using In Situ Ellipsometry
<p>Dataset for article "Pushing the Study of Point Defects in Thin Film Ferrites to Low Temperatures Using In Situ Ellipsometry" published in <em>Adv. Mater. Interfaces</em> 2021, <strong>8</strong>, 2001881. </p> <p>The data includes:</p> <ul> <li>XRD data of La<sub>1-x</sub>Sr<sub>x</sub>FeO<sub>3</sub> thin films</li> <li>Optical conductivity of LSF films as a function of oxygen partial pressure and Sr content</li> <li>Concentration of electronic holes in LSF thin films as a function of oxygen partial pressure and temperature</li> <li>Defect chemistry models employed for describing the concentration of point defects in LSF thin films.</li> <li>Equilibrium constants for oxygen incorporation reactions in LSF thin films at different temperatures</li> <li>Ellipsometry raw data of LSF50 thin film as a function of equivalent oxygen pressure </li> <li>Electrochemical impedance spectra of the LSF50 thin film at 400 ºC</li> </ul>
Spectroscopic ellipsometry mapping of PAAO (AJ-1-04-20 sample)
<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 3 minutes and 16 seconds.</p> <p>The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm<sup>2</sup>). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-1-04-20 Ellipsometry Mapping Measurements.rar" file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method after being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.7059281</p>
Spectroscopic ellipsometry mapping of PAAO (AJ-3-04-20 sample)
<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 4 minutes and 8 seconds.</p> <p>The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm<sup>2</sup>). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-3-04-20 Ellipsometry Mapping Measurements.rar" file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method after being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.7115166</p>
Spectroscopic ellipsometry mapping of PAAO (AJ-2-04-20 sample)
<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 3 minutes and 37 seconds.</p> <p>The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm<sup>2</sup>). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-2-04-20 Ellipsometry Mapping Measurements.rar" file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method after being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.7059828</p>
Spectroscopic ellipsometry mapping of PAAO (AJ-4-04-20 sample)
<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 4 minutes and 30 seconds.</p> <p>The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm<sup>2</sup>). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-4-04-20 Ellipsometry Mapping Measurements.rar" file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method after being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.7115401</p>
Imaging ellipsometry on exfoliated GaS on sapphire substrate
<p>Delta and Psi maps measured for wavelengths 200 nm to 900 nm with an Accurion EP4 ellipsometer.</p> <p>Ellipsometric enhanced contrast micrograph of the measured region - map.jpg</p> <p>Plotted Delta and Psi maps for 2, 2.5, 3, 3.2 and 3.5 eV are included.</p>
Optical constants of several multilayer transition metal dichalcogenides measured by spectroscopic ellipsometry in the 300-1700 nm range: high-index, anisotropy, and hyperbolicity
<p># Data and plotting code for "Optical constants of several multilayer transition metal dichalcogenides measured by spectroscopic ellipsometry in the 300-1700 nm range: high-index, anisotropy, and hyperbolicity" by Battulga Munkhbat, Piotr Wróbel, Tomasz J. Antosiewicz, and Timur O. Shegai, ACS Photonics (2022); https://doi.org/10.1021/acsphotonics.2c00433</p> <p><br> ## Contents</p> <p>* <TMD-material>: directories with raw and derived data for all 10 TMDs<br> * f3_dataset_*_nm_ex1_ex2_ey1_ey2_ez1_ez2.txt: obtained permittivities<br> * plot_*_v1.m: Matlab scripts for plotting data</p> <p>## Description of the data</p> <p>The raw and derived data stored in directories <TMD> contain the following files:</p> <p>* <TMD>/<date>-<TMD>.SEsnap: binary data file with collected data, CompleteEASE format<br> * <TMD>/<date>-<TMD>-E*.mat: ascii text file with permittivity data separated into individual components as exported from CompleteEASE software<br> * <TMD>/<date>-<TMD>-full.mat: ascii text file with fitted model parameters as exported from CompleteEASE software<br> * <TMD>/<TMD>-data/*.txt: selected raw data and fits for all considered samples (Mueller Matrix or Delta/Psi/depolarization).</p> <p>The structure of the data file names is as follows:<br> <order-number-in-CompleteEASE>-s<sample-name>-<data-type>.txt for general ellipsometry (delta, psi, depolarization) or<br> <order-number-in-CompleteEASE>-s<sample-name>-o<in-plane-sample-rotation-number>-mm.txt for Mueller Matrix measurements.</p> <p>The following two scripts can be used to plot the raw measured data (solig lines) along with corresponding fits (black dotted lines):</p> <p>* plot_mm_v1.m: Matlab script for plotting Mueller Matrix data for WTe2 and ReS2<br> * plot_psi_delta_depol_v1.m: Matlab script for plotting psi, delta, and depolarization data for other TMDs</p> <p>The diagonal permittivity tensor data are saved in the f3_dataset_*_nm_ex1_ex2_ey1_ey2_ez1_ez2.txt files which can be plotted using the plot_permittivity_v1.m Matlab script. The format of this file is as follows:</p> <p>wavelength in nanometers; real part of epsilon_xx; imaginary part of epsilon_xx; real part of epsilon_yy; imaginary part of epsilon_yy; real part of epsilon_zz; imaginary part of epsilon_zz;</p> <p> </p> <p> </p>
Spectroscopic ellipsometry mapping of PAAO (AJ-6-03-31 sample)
<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO). The sample was made by anodization of aluminum polycrystal in 0.3 mol/L oxalic acid at 40 V for 3 minutes and 42 seconds.</p> <p>The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm<sup>2</sup>). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-6-03-31 Ellipsometry Mapping Measurements.rar" file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method after being covered with hydrogenated amorphous diamond-like carbon and silver nanocomposite. The data can be found here: <a href="https://doi.org/10.5281/zenodo.7257252">https://doi.org/10.5281/zenodo.7257252</a></p>
Spectroscopic ellipsometry mapping of PAAO (AJ-7-03-31 sample)
<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO). The sample was made by anodization of aluminum polycrystal in 0.3 mol/L oxalic acid at 40 V for 4 minutes and 35 seconds.</p> <p>The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm<sup>2</sup>). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-7-03-31 Ellipsometry Mapping Measurements.rar" file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method after being covered with hydrogenated amorphous diamond-like carbon and silver nanocomposite. The data can be found here: <a href="https://doi.org/10.5281/zenodo.7257907">https://doi.org/10.5281/zenodo.7257907</a></p>
Spectroscopic ellipsometry mapping of PAAO (AJ-8-03-31 sample)
<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO). The sample was made by anodization of aluminum polycrystal in 0.3 mol/L oxalic acid at 40 V for 5 minutes and 4 seconds.</p> <p>The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm<sup>2</sup>). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-8-03-31 Ellipsometry Mapping Measurements.rar" file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method after being covered with hydrogenated amorphous diamond-like carbon and silver nanocomposite. The data can be found here: <a href="https://doi.org/10.5281/zenodo.7260186">https://doi.org/10.5281/zenodo.7260186</a></p>
Spectroscopic ellipsometry mapping of PAAO:Au (AJ-2-04-20-Au sample)
<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide covered with gold nanoparticles (PAAO:Au). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 3 minutes and 37 seconds. Then it was dip-coated in 60 nm diameter gold nanoparticles suspension. Extraction speed was 500 nm/s.</p> <p>The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm<sup>2</sup>). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-2-04-20-Au Ellipsometry Mapping Measurements.rar" file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method before being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.5718202</p>
Spectroscopic ellipsometry mapping of PAAO:Au (AJ-1-04-20-Au sample)
<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide covered with gold nanoparticles (PAAO:Au). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 3 minutes and 16 seconds. Then it was dip-coated in 60 nm diameter gold nanoparticles suspension. Extraction speed was 500 nm/s.</p> <p>The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm<sup>2</sup>). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-1-04-20-Au Ellipsometry Mapping Measurements.rar" file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method before being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.5718025</p>
Spectroscopic ellipsometry mapping of PAAO:Au (AJ-3-04-20-Au sample)
<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide covered with gold nanoparticles (PAAO:Au). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 4 minutes and 8 seconds. Then it was dip-coated in 60 nm diameter gold nanoparticles suspension. Extraction speed was 500 nm/s.</p> <p>The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm<sup>2</sup>). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-3-04-20-Au Ellipsometry Mapping Measurements.rar" file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method before being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.5718424</p>
Spectroscopic ellipsometry mapping of PAAO:Au (AJ-4-04-20-Au sample)
<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide covered with gold nanoparticles (PAAO:Au). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 4 minutes and 30 seconds. Then it was dip-coated in 60 nm diameter gold nanoparticles suspension. Extraction speed was 500 nm/s.</p> <p>The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm<sup>2</sup>). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-4-04-20-Au Ellipsometry Mapping Measurements.rar" file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method before being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.5734486</p>
Spectroscopic ellipsometry mapping of PAAO:Au (AJ-5-04-27-Au sample)
<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide covered with gold nanoparticles (PAAO:Au). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 4 minutes and 57 seconds. Then it was dip-coated in 60 nm diameter gold nanoparticles suspension. Extraction speed was 500 nm/s.</p> <p>The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm<sup>2</sup>). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-5-04-27-Au Ellipsometry Mapping Measurements.rar" file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method before being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.5734894</p>
Spectroscopic ellipsometry mapping of PAAO:DLC:Ag (AJ-8-03-31-DLCAg sample)
<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO) covered with hydrogenated amorphous diamond-like carbon and silver (DLC:Ag) nanocomposite. The sample was made by 2 processes: (1) anodization of aluminum polycrystal in 0.3 mol/L oxalic acid at 40 V for 5 minutes and 4 seconds and then (2) depositing DLC:Ag employing reactive unbalanced magnetron sputtering in direct current mode using silver target (80 sccm argon gas flow, 5.4 sccm C<sub>2</sub>H<sub>2</sub> gas flow, 405 V voltage, 0.09-0.10 A current, 7·10<sup>-3</sup> mbar work pressure, 2 minutes 32 seconds process duration).</p> <p>The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm<sup>2</sup>). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-8-03-31-DLCAg Ellipsometry Mapping Measurements.rar" file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method before being covered with DLC:Ag. The data can be found here: <a href="https://doi.org/10.5281/zenodo.7056065">https://doi.org/10.5281/zenodo.7056065</a></p>
Spectroscopic ellipsometry mapping of PAAO:DLC:Ag (AJ-7-03-31-DLCAg sample)
<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO) covered with hydrogenated amorphous diamond-like carbon and silver (DLC:Ag) nanocomposite. The sample was made by 2 processes: (1) anodization of aluminum polycrystal in 0.3 mol/L oxalic acid at 40 V for 4 minutes and 35 seconds and then (2) depositing DLC:Ag employing reactive unbalanced magnetron sputtering in direct current mode using silver target (80 sccm argon gas flow, 5.4 sccm C<sub>2</sub>H<sub>2</sub> gas flow, 405 V voltage, 0.09-0.10 A current, 7·10<sup>-3</sup> mbar work pressure, 2 minutes 32 seconds process duration).</p> <p>The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm<sup>2</sup>). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-7-03-31-DLCAg Ellipsometry Mapping Measurements.rar" file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method before being covered with DLC:Ag. The data can be found here: <a href="https://doi.org/10.5281/zenodo.7053393">https://doi.org/10.5281/zenodo.7053393</a></p>
Time-resolved pump-probe ellipsometry of the photoinduced insulator-metal transition in 25 nm VO2 thin films
<h3>Data available</h3> <p>Transient pseudo dielectric function and ellipsometric parameters (\Psi and \Delta) measured with a time-resolved pump-probe ellipsometry on a 25 nm VO2 film deposited on SiO2.</p> <p>The data of the transient pseudo dielectric function and ellipsometric parameters (\Psi and \Delta) are provided for different pump wavelengths and pump fluences.</p> <ul> <li>\lambda_{pump} = 400 nm - F_{pump} = 3.058 mJ/cm2</li> <li>\lambda_{pump} = 400 nm - F_{pump} = 3.823 mJ/cm2</li> <li>\lambda_{pump} = 400 nm - F_{pump} = 5.352 mJ/cm2</li> <li>\lambda_{pump} = 400 nm - F_{pump} = 6.117 mJ/cm2</li> <li>\lambda_{pump} = 400 nm - F_{pump} = 7.646 mJ/cm2</li> </ul> <ul> <li>\lambda_{pump} = 800 nm - F_{pump} = 1.536 mJ/cm2</li> <li>\lambda_{pump} = 800 nm - F_{pump} = 1.919 mJ/cm2</li> <li>\lambda_{pump} = 800 nm - F_{pump} = 2.109 mJ/cm2</li> <li>\lambda_{pump} = 800 nm - F_{pump} = 2.654 mJ/cm2</li> <li>\lambda_{pump} = 800 nm - F_{pump} = 2.793 mJ/cm2</li> </ul> <h3>Naming of the files</h3> <p>In the .zip file that can be downloaded here, there are several folders.</p> <p>Each are named as lambda_pump_XXX_nm_fluence_YYY_mJcm-2 where XXX is either 400 or 800 and YYY is the fluence value.</p> <p>In each folder are four files.</p> <ul> <li>diffdelta.txt - values of the transient ellipsometric parameter \Delta.</li> <li>diffpsi.txt- values of the transient ellipsometric parameter \Delta.</li> <li>diffpseudoepsilon1.txt- values of the real part of the transient pseudo dielectric function.</li> <li>diffpseudoepsilon2.txt- values of the real part of the transient pseudo dielectric function.</li> </ul> <h3>Structure of the files</h3> <p>Each file has the same structure:</p> <p>The first row an array time delays in picosecond for which measurements have been performed.</p> <p>In the rest of rows, the first element of the array are the photon energy, while the rest of the elements are the values of the transient dielectric function or ellipsometric parameters (\Psi and \Delta) at each of the elements in the time delay array.</p> <p>Example:</p> <p>time delay t1 t2 t3</p> <p>E1(eV) Delta(E1, t1) Delta(E1, t2) Delta(E1, t3)</p> <p>E2(eV) Delta(E2, t1) Delta(E2, t2) Delta(E2, t3)</p> <p>E3(eV) Delta(E3, t1) Delta(E3, t2) Delta(E3, t3)</p>
Spectroscopic ellipsometry mapping of PAAO (AJ-5-04-27 sample)
<p>Spectroscopic ellipsometry measurement data obtained from the porous anodized aluminum oxide (PAAO). The sample was made by anodization of aluminum monocrystal in 0.3 mol/L oxalic acid at 40 V for 4 minutes and 57 seconds.</p> <p>The measurements were carried out at 20 × 20 locations covering all of the sample surface (approximately 4.8 × 4.8 mm<sup>2</sup>). The coordinates of each of 400 locations are available in "mapping_points.csv" file. All measurement data is also included in a single "AJ-5-04-27 Ellipsometry Mapping Measurements.rar" file.</p> <p>Ellipsometer: rotating compensator GES5-E (Semilab).</p> <p>Light source: 75 W xenon short arc lamp with 185-2000 nm wavelength spectrum.</p> <p>Detector: UV-Vis CCD with 0.8 nm resolution.</p> <p>Spectral range: approximately 230-960 nm.</p> <p>Light incidence angles: 50°, 55°, 60°, 65°, 70°, 75°.</p> <p>Light beam size: microspot (365 × 470 μm<sup>2</sup> at 75° angle of incidence).</p> <p>The same sample was also measured using the same spectroscopic ellipsometry method after being covered with gold nanoparticles. The data can be found here: https://doi.org/10.5281/zenodo.7118686</p>
Ellipsometry Measurements for determination of brazeability
<p>A Dataset containing Ellipsometry Measurements and wetting experiments of different surface conditions to determine brazeability.</p>
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DANDI Archive for NWB datasets
DANDI is a BRAIN Initiative archive for publishing and sharing neurophysiology data, including electrophysiology, optophysiology, and behavioral data packaged as NWB and related standards.
International Brain Laboratory public data
The International Brain Laboratory public data releases expose standardized mouse decision-making experiments, including Neuropixels recordings, widefield calcium imaging, behavior, and session metadata accessed through the ONE API.
OpenNeuro
OpenNeuro is a free, open platform for sharing neuroimaging datasets, with public search, dataset pages, and download paths for web, S3, DataLad, and the OpenNeuro CLI.