Spark OES Metal Analyzer, 174–520 nm

SKU CS-ANL-00007
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Benchtop spark optical emission spectrometer with argon self-purified optics for ferrous and non-ferrous alloys.

Scientist guidance
Louise Corscadden, PhD, Director of Science

Louise Corscadden, PhD

Director of Science · ConductScience

Ask Louise about Spark OES Metal Analyzer, 174–520 nm fit, setup, configuration, or quote prep.

Key Specifications

Full details →
Optical System
Optical chamber with argon self-purification system
Optical System - Chamber
Optical chamber with argon self-purification system
Optical System - Wavelength Range
174~520 nm
Source
Programmable full digital pulse source
Source - Ignition
High energy pre-ignition technology, ignition pulse: 1~14Kv
Source - Discharge
Maximum discharge frequency: 1000Hz, Maximum discharge current: 400A
Category: Analytical Instruments

A spark optical emission spectrometer for solid metal analysis. A programmable full-digital pulse source and a Paschen–Runge optic with CMOS detectors return a certified-grade result in seconds, and the argon self-purification system keeps the optical chamber stable between campaigns.

Key features

  • Stability upgrade
  • Ease of use upgrade
  • Adopt scientific research level CMOS detector with better performance
  • Adopt stable and reliable programmable full digital pulse optic source
  • Lower Noise: Scientific research grade photosensitive element, lower noise, strong anti-interference, stability upgrade of anti-halo technology
  • Anti-Interference: detector has high integration, which can avoid introducing noise into external circuits
  • Fast Reading Speed: Fast reading speed: OEO (Optimal Element Oriented) technology is adopted, and pixel signals are read separately to achieve parameter optimization design.
  • High UV Response: Higher UV response sensitivity, no need for coating, achieving non-metallic element (N, C, S, P) analysis, with better results

Applications

Built for foundries, metal QC and incoming-inspection laboratories.

  • Casting
  • Aerospace
  • Precision Manufacturing
  • Automobile Manufacturing
  • Rail Transit

Choosing the right configuration

Match the sample matrix and target elements to the required detection limits, sample-introduction hardware, gas supply, exhaust, cooling, and data-system configuration. ConductScience confirms these items against the proposed method before the system is quoted.

Features & Benefits

Stability upgrade
Ease of use upgrade
Adopt scientific research level CMOS detector with better performance
Adopt stable and reliable programmable full digital pulse optic source
Lower Noise: Scientific research grade photosensitive element, lower noise, strong anti-interference, stability upgrade of anti-halo technology
Anti-Interference: detector has high integration, which can avoid introducing noise into external circuits
Fast Reading Speed: Fast reading speed: OEO (Optimal Element Oriented) technology is adopted, and pixel signals are read separately to achieve parameter optimization design.
High UV Response: Higher UV response sensitivity, no need for coating, achieving non-metallic element (N, C, S, P) analysis, with better results
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Spark OES Metal Analyzer, 174–520 nm
Spark OES Metal Analyzer, 174–520 nm
Request Quote
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