Dual-phase alloy microstructure for phase fraction analysis
ConductVision · Materials Vision

Materials vision software for measurement, inspection, and digital twins.

Connect microscopy, SEM, CT, macro imaging, and video inspection to calibrated measurements, reviewable overlays, batch exports, and digital-twin-ready material records.

34
Applications across eight measurement families.
7+
Standards referenced, from grain size to pilling.
10
Shared primitives behind every page.
100%
Outputs reviewable. Overlays and thresholds logged.

The application atlas

34 applications across eight measurement families. Search by your material problem — grain size, pilling, corrosion, pores, cells, inspection video, or digital-twin inputs — and open the closest workflow. Several link to existing ConductVision pages.

Etched metal microstructure with clear grain boundaries for grain size analysisMicrostructureASTM E112
Optical · SEM

Grain size analysis

Average grain size and full distributions, traced automatically from etched micrographs.

Mean grain sizeASTM G-numberSize histogram+1 more
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Dual-phase alloy microstructure for phase fraction analysisMicrostructure
Optical · SEM · EBSD

Phase & microstructure fraction

Segment phases and constituents to quantify area fraction and spatial distribution.

Phase %Phase mapDistribution+1 more
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Polished steel microscopy field with nonmetallic inclusions for content ratingMicrostructureASTM E1245
Optical · SEM

Inclusion & content rating

Detect and classify inclusions, then rate content by type and severity across fields.

Inclusion countType classArea fraction+1 more
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SEM-like fracture surface with ductile dimples and cleavage featuresMicrostructure
SEM · Optical

Fractography

Segment ductile dimple, cleavage, fatigue, and intergranular regions on fracture surfaces.

Region mapDimple sizeInit.-site flags+1 more
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Polished coating cross-section with pores for thickness and porosity measurementSurface
Optical · SEM cross-section

Coating thickness & porosity

Thickness profiles and sub-surface porosity from polished coating cross-sections.

Thickness profileMin / max / meanPore fraction
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Thin-film surface image with coating coverage defectsSurface
Optical · Macro

Coating & film coverage

Quantify surface coverage, holidays, and uniformity for films and thin coatings.

Coverage %UniformityVoid map+1 more
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Corroded metal surface with pits for pitting analysisSurface
Optical · Macro · SEM

Corrosion & pitting

Segment rust by class, count pits, and track coverage across time points.

Corroded area %Pit countPit diameter+1 more
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Worn material surface with scratches and debris for roughness analysisSurface
Optical · SEM · AFM export

Wear, scratch & roughness

Measure wear tracks, scratches, and delamination from tribology and surface images.

Track widthScratch lengthDebris count+1 more
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Sessile droplet on a flat coated surface for contact angle measurementSurface
Optical · Sessile-drop

Contact angle & wettability

Extract droplet geometry and static contact angle from sessile-drop images.

Contact angleLeft / right angleBaseline+1 more
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Engineered surface texture microscopy image for domain and anomaly analysisSurface
SEM · AFM export · Optical

Surface texture analysis

Texture, domain size, and anomaly heatmaps from microscopy, SEM, and AFM exports.

Texture classDomain sizeOrientation+1 more
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SEM-style powder particles for image-based particle size analysisPowderISO 13322-1
Optical · SEM

Particle size analysis

Static image-analysis particle sizing with shape descriptors across full fields.

Size distributionFeret diameterCircularity+1 more
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TEM-like nanoparticle field with agglomerates for nanoscale sizingPowder
TEM · SEM

Nanoparticle analysis

TEM and SEM particle size, shape, and agglomeration for nanomaterials and catalysts.

Equivalent diameterAspect ratioCircularity+1 more
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Crushed mineral grains for granular particle analysisPowder
Optical · SEM · Process imaging

Mineral & granular analysis

Particle size, shape, and mineral-class proxies for mineral processing streams.

Size & shapeMineral classLiberation+1 more
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Abraded woven fabric with raised pills for textile pilling assessmentTextileWorked example
Flatbed scan · Macro photo

Textile pilling grade

Predict an ISO pilling grade from a fabric image, with density and the features behind the call.

ISO gradePilling densitySHAP attribution+2 more
Explore
Illustrative fibers imagery for Fiber diameter distributionTextile
Microprojection · Optical microscopy · SEM

Fiber diameter distribution

Mean diameter, CV%, and D10/D50/D90 for wool, synthetic, and nanofiber, measured from the image.

Mean diameterCV%D10 / D50 / D90+2 more
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Illustrative fabric imagery for Fabric inspection (4-point)Textile
Line scan · Inspection table · Flatbed scan

Fabric inspection (4-point)

Detect fabric defects, assign demerit points by size, and total them per 100 square yards.

Defect mapDefect classPenalty points (1–4)+2 more
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Illustrative fabric imagery for Cover factor & open areaTextile
Transmitted light · Flatbed scan · Microscopy

Cover factor & open area

Optical open area, pore size distribution, and cover uniformity measured on the actual fabric.

Open area %Pore countPore size distribution+1 more
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Illustrative fibers imagery for Foreign fiber contaminationTextile
Web imaging · Sliver scan · Macro photo

Foreign fiber contamination

Find polypropylene, coloured, and foreign fibers in the web before they reach the dyehouse.

Contaminant countLocation mapFiber length & width+2 more
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Illustrative particles imagery for Nep & trash countTextile
Card web imaging · Flatbed scan · Microscopy

Nep & trash count

Count neps, seed-coat fragments, and trash per gram of cotton web, sized and classified.

Neps per gramTrash per gramSize distribution+2 more
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Illustrative fabric imagery for Dimensional stability & skewTextile
Flatbed scan · Overhead rig · Macro photo

Dimensional stability & skew

Warp and weft shrinkage plus skew, measured from marked-square photographs before and after wash.

Warp shrinkage %Weft shrinkage %Skew / torque %+2 more
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Top-down SEM of nanoscale silicon reference lines used for critical-dimension metrologyJoining
Top-down SEM · Optical CD

Critical dimension (CD) metrology

Line width, space, and via diameter measured from top-down images, with per-feature tables.

Line width & spaceVia / contact diameterCD uniformity map+2 more
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SEM of patterned silicon lines showing the rough, wavy edges measured as line-edge roughnessJoining
Top-down SEM

Line edge & width roughness (LER / LWR)

Line edge and line width roughness as 3-sigma deviation along patterned lines.

LER (3 sigma)LWR (3 sigma)Edge profile+2 more
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Processed 150 mm silicon wafer with a grid of dies and ink-marked defective diesJoining
Wafer scan · Optical inspection · SEM review

Wafer defect map & binning

Detect, locate, size, and bin defects across a wafer into a spatial map.

Defect countWafer mapDefect class bins+2 more
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Cross-section SEM of dense resist lines leaning and merging at tight pitch, showing pattern collapseJoining
Top-down SEM · Optical inspection

Photoresist pattern defects

Detect resist pattern collapse, bridging, footing, and scumming after develop.

Defect count by modeCollapse / bridge / footing classLocation map+2 more
Explore
SEM of gas-atomized 316L stainless steel powder: spherical particles with visible satellitesAdditive
Optical microscopy · SEM

Metal powder feedstock QC

Particle size, sphericity, and satellite fraction for metal AM feedstock.

D10 / D50 / D90Sphericity distributionSatellite fraction+2 more
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Illustration of additively-manufactured metal porosity: irregular lack-of-fusion voids and round gas pores in a metal matrixAdditive
Polished cross-section · CT slice

Printed-part porosity

Porosity fraction with lack-of-fusion versus gas-pore classification from a cross-section.

Porosity %Pore countLack-of-fusion vs gas class+2 more
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Coated lithium-ion battery electrode on foil showing a ragged, chattered uncoated edge defectAdditive
Web imaging · Flatbed scan · Microscopy

Battery electrode coating defects

Detect pinholes, agglomerates, streaks, and uncoated patches on electrode coatings.

Defect count by typePinhole / agglomerate / streak classDefect density per m2+2 more
Explore
Fiber optic connector end-face under inspection microscope: the fiber core disc with a scratch across itJoining
Fiber inspection scope · Microscopy

Fiber optic end-face inspection

Count and grade scratches and defects by zone on a connector end-face, per IEC 61300-3-35.

Scratch count by zoneDefect count by zoneZone A/B/C/D pass/fail+2 more
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Optical micrograph of etched ductile iron: round graphite nodules in a pearlite/ferrite matrixMicrostructure
Optical microscopy · Polished section

Graphite nodularity

Nodularity percentage and nodule count per mm2 for ductile and compacted graphite iron.

Nodularity %Nodule count / mm2Shape / roundness class+2 more
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Composite cross-section with fiber bundles for orientation analysisTextile
Optical cross-section · SEM · CT slice

Composite fiber orientation

Fiber orientation, void content, and ply defects from polished sections and CT slices.

Orientation tensorFiber area %Void content+1 more
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Microscopy field with dispersed fibers and inclusions for countingTextile
Optical · SEM

Fiber & inclusion analysis

Count and size fibers and inclusions, with area fraction and class breakdowns.

Fiber countLength / diameterArea fraction+1 more
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Polymer membrane surface with pinholes and film defectsTextile
Optical · SEM · Macro

Polymer film & membrane defects

Pinholes, bubbles, scratches, and coverage uniformity for films and membranes.

Pinhole countBubble / voidScratch map+1 more
Explore
SEM-style metal powder with satellite particles for additive manufacturing QCAdditive
Powder SEM · Layer images · CT slice

Additive manufacturing QC

From powder morphology to post-build cross-sections: layer anomalies and pore maps.

Powder sphericitySatellite flagsLayer anomaly+1 more
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Porous battery electrode cross-section for coating and pore analysisAdditive
SEM · Optical cross-section · CT slice

Battery electrode analysis

Coating, particle, pore, and crack measurements for electrodes, before and after cycling.

Coating thicknessParticle sizePore fraction+1 more
Explore
Etched weld cross-section with porosity for weld defect analysisJoining
Macro · Optical · Radiograph

Weld defect analysis

Pores, cracks, fusion boundaries, and bead geometry from macro and microscopy.

Defect classPorosity %Bead geometry+1 more
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Close-up solder joint array for electronics inspectionJoining
Optical · X-ray · Cross-section

Solder joint inspection

Joint-quality classification and void measurement for solder and bond images.

Joint classVoid %Defect map+1 more
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Wafer inspection field with die grid and defect pattern clustersJoining
Wafer map · Optical

Semiconductor defect patterns

Classify wafer-map patterns and quantify defect clusters and densities.

Pattern classCluster mapDefect density+1 more
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PCB inspection close-up with components and solder featuresJoining
Optical · AOI

Electronics inspection

PCB and package inspection for missing, short, open, and contamination defects.

Defect classLocationCount+1 more
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Micro-CT-like porous rock slice for digital rock porosity analysisGeology
Micro-CT slice · SEM

Digital rock & porosity

Pore fraction, throat proxies, and fracture density from micro-CT slices and SEM.

Pore fractionThroat proxyFracture density+1 more
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Polarized petrographic thin section with colorful mineral grainsGeology
Polarized optical

Petrographic thin section

Mineral phase maps, grain size, and sorting from thin-section microscopy.

Phase mapGrain sizeSorting+1 more
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Material surface with branching cracks for crack detection and growth trackingGeology
Optical · SEM · Macro

Crack detection & growth

Crack segmentation, length, width proxy, and growth over time for lab specimens.

Crack maskLengthWidth proxy+2 more
Explore
H and E-style histology field for tissue region analysisAdjacent life science
Brightfield · Whole-slide

Pathology & histology

Region and feature quantification on stained tissue sections.

Region areaPositive %Feature count+1 more
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Phase-contrast cultured cells for cell counting and confluence measurementAdjacent life science
Brightfield · Phase

Cell counting & confluence

Counts, density, and confluence from brightfield and phase contrast.

Cell countDensityConfluence %+1 more
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Fluorescence cell field with red and green assay channels for viability analysisAdjacent life science
Fluorescence · Brightfield

Viability & assays

Live and dead segmentation, viability ratios, and dose response.

Live / deadViability %Dose response+1 more
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Illustrative particles imagery for Nuclear and RNA fociAdjacent life science
Fluorescence · Confocal

Nuclear and RNA foci

Per-nucleus counts of intranuclear puncta: RNA foci, DNA-damage foci, FISH spots.

Foci per nucleusFoci-positive fractionFoci intensity+1 more
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Agar plate scan with countable coloniesAdjacent life science
Plate scan · Macro

Colony counting

Automated colony counts across plates and dilution series.

Colony countCFU/mLSize distribution+1 more
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Cell monolayer scratch assay with a central migration gapAdjacent life science
Phase · Brightfield · Time-lapse

Scratch & wound assay

Wound area and closure over time from migration assays.

Wound areaClosure %Migration rate+1 more
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Brightfield 3D culture spheroids for morphology measurementAdjacent life science
Brightfield · Confocal

Organoid & spheroid

Size, count, and morphology of 3D culture structures.

DiameterCountCircularity+1 more
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Microscopy field with branching tube-formation networkAdjacent life science
Phase · Fluorescence

Angiogenesis & tubes

Network length, branch points, and node counts from tube-formation assays.

Total lengthBranch pointsNodes+1 more
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Multichannel fluorescence microscopy field for colocalization analysisAdjacent life science
Confocal · Widefield

Fluorescence colocalization

Pearson, Manders, and Costes across multi-channel fields.

Pearson rManders M1 / M2Costes threshold+1 more
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Built for standards-aware measurement, not black-box grading

ConductVision is designed to support the methods your lab already cites. We use careful claim wording: supported workflows, not certified compliance, until validated on your images.

WorkflowStandard / methodConductVision outputClaim wording
Grain sizeASTM E112, E1382Boundaries, intercepts, G-number, distributionSupports ASTM-style grain-size workflows
Textile pillingISO 12945-2/-4, ASTM D4970Grade suggestion, density, heatmap, attributionAssists pilling assessment and QC review
Particle sizingISO 13322-1Count, distribution, D10/D50/D90, shapeSupports image-based particle sizing
Inclusion ratingASTM E1245, E45Inclusion count, area fraction, type, severitySupports inclusion quantification workflows
CoatingsASTM B487Thickness profile, coverage, bare areas, defectsMeasures thickness and coverage from calibrated images
PorosityMetallography / CT sliceVoid fraction, pore size distribution, pore mapQuantifies pore/void features from images
Abraded woven fabric with raised pills for textile pilling assessmentWorked example
Application spotlight

Textile pilling analysis for fabric R&D and QC

Upload fabric surface images, estimate an ISO-style pilling grade, review the regions that drove the call, and compare fiber, yarn, weave, and finishing parameters. ConductVision reports pill density, grade confidence, heatmap overlays, and SHAP explanations for production-factor review — the workflow where ConductVision already has unusually specific proof.

  • ISO 1–5 grade suggestion
  • Pilling density (pills/cm²)
  • Grad-CAM heatmap overlay
  • SHAP feature attribution
  • Stage contributions: fiber, yarn, weave, finishing
  • Batch comparison by lot, supplier, wash & abrasion cycle
Standards-aware:ISO 12945-2ISO 12945-4ASTM D4970
Explore textile pilling →

Ten primitives behind every page

Every application is the same reusable engine, exposed under the name your field uses. Calibrate, detect, measure, review, export — then compare across lots and time points.

Scale calibration

Set real units from a bar or known dimension.

Object detection

Locate every object of interest in the field.

Semantic segmentation

Label each pixel by class: phase, pore, tissue.

Instance segmentation

Separate touching objects into countable instances.

Boundary tracing

Trace grain, cell, and region outlines precisely.

Crack & line detection

Follow cracks, fibers, and thin linear features.

Texture classification

Score surface texture, domains, and patterns.

Statistical export

Distributions and summaries, publication-ready.

Batch & lot comparison

Compare across cohorts, lots, and time points.

Overlay review

Inspect and adjust every result on the image.

Validated on your image type, not a global accuracy number

Every high-stakes workflow needs validation on your samples. ConductVision supports locked protocols, reviewed overlays, and held-out validation sets so teams can document exactly how each measurement was produced — compared against expert manual measurements, held out by material family, supplier, microscope, and lighting, and labelled clearly when a protocol is still a custom or research workflow.

Send a sample image and a measurement goal

We will show the closest ConductVision workflow and identify what needs custom validation for your images.