Joining, electronics & semiconductor

Solder joint inspection

Joint-quality classification and void measurement for solder and bond images.

Modalities:OpticalX-rayCross-section
8.4%
Void
256
Joints
3
Reject

Example outputs shown for illustration. Numbers depend on your samples and protocol.

The measurement, today

Solder voids and joint defects are inspected manually, which is slow and misses sub-surface voids in BGA joints.

From image to reviewed result

  1. 1

    Calibrate the scale

    Set spatial scale from a bar or known dimension. Every downstream number inherits real units.

  2. 2

    Detect & segment

    Segmentation models find the objects and regions of interest: grains, particles, pores, fibers, cells.

  3. 3

    Measure

    Quantify size, count, area fraction, density, and orientation. The metrics your method already defines.

  4. 4

    Review the overlay

    Inspect the result on every field. Adjust thresholds by hand; the change is logged with the output.

  5. 5

    Export & compare

    Publication-ready statistics, plus batch comparison across lots, conditions, and time points.

What you export

Joint class
Void %
Defect map
Count

Send a sample image and a measurement goal

We will show the closest ConductVision workflow and flag what needs custom validation for your images.