
Benchtop NIR Spectrometer, Sub-30-Second Analysis
Benchtop near-infrared spectrometer returning a full compositional result in under 30 seconds.

Louise Corscadden, PhD
Director of Science · ConductScience
Ask Louise about Benchtop NIR Spectrometer, Sub-30-Second Analysis fit, setup, configuration, or quote prep.
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Key Specifications
Full details →- Model fit
- Configured during quote
- SKU family
- CS-ANL-00002
- Sizing
- Model-specific dimensions confirmed from the selected configuration
- Ordering
- Quote-reviewed before fulfillment
- Category
- Spectrophotometry
- Build notes
- Confirm accessories, station layout, and support needs before purchase
A benchtop near-infrared spectrometer built around throughput. A complete diffuse-reflectance analysis returns in under thirty seconds with no reagents and nothing consumed, which is what lets NIR sit in a production line rather than at the end of one.
Key features
- Diffuse-reflectance measurement supports rapid solid and liquid sample screening.
- Interchangeable probes adapt the optical path to different sample presentations.
- A temperature-controlled indium gallium arsenide detector supports repeatable measurements.
Applications
Built for production QC and raw-material inspection laboratories.
- Textile industry, Fruit field, Food inspection (Flake, granule, powder solid sample model)
- Edible oil, Gasoline ( Liquid sample model).
Choosing the right configuration
Select the wavelength range, optical resolution, sample presentation, calibration set, and data workflow for the matrices being measured. ConductScience reviews those choices with the intended method before quoting the instrument.
Features & Benefits
Communication interface
- USB2.0
Spectral resolution
- (10.95±0.3) nm @1529.5nm
Wavelength range
- 1000-1800nm
Stray light
- < 0.15%
Wavelength accuracy
- ±0.2nm
Analysis time
- < 30 seconds
Wavelength repeatability
- < 0.01nm
Accessory
- with various probes available
Absorbance noise
- <50uA
Detection form
- Diffuse reflection and transflection detection
Light source power
- Internal light source of 5V/5W; external light source of 5V/10W
Detector
- TEC refrigerated and temperature-controlled indium gallium arsenide (InGaAs) detector
Light source life
- > 5000 hours
Power supply
- DC 19V adapter or built-in lithium battery (lifetime: up to 8 hours)
What does this instrument measure, and who is it for?
It measures sample composition fast enough to sit inside a production line rather than at the end of one. It is built for production QC and raw-material inspection laboratories. It is a bench instrument that returns a result without consuming the sample, so the same material can be re-run or passed on.
What measurement principle does it use?
Diffuse-reflectance near-infrared measurement against a calibration model. Nothing is consumed and the sample is returned intact, which is why the measurement can sit in a line rather than after it.
Which specifications are confirmed?
The specification table lists fourteen confirmed ordering parameters for this instrument. Use them to compare the operating range, utilities, and analytical performance required by the method. They include Communication interface at USB2.0, Spectral resolution at (10.95±0.3) nm @1529.5nm and Wavelength range at 1000-1800nm.
What should be confirmed before ordering?
Confirm sample presentation geometry, whether an existing calibration model can be transferred to this instrument, and the ambient temperature stability of the location. These are configured and quoted per installation, so raise anything unusual about the site during quote review rather than after delivery.
What else is needed to run it?
A calibration model for your matrix. Near-infrared and infrared instruments measure absorbance; the model is what turns absorbance into composition, and it is matrix-specific.
How is it supplied?
This instrument is configured and quoted per installation rather than sold at a list price. Request a quote and we will confirm the configuration, the site requirements and the lead time before anything is ordered.
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