Atomic Force Microscopy
High-resolution atomic force microscopy system providing sub-nanometer surface characterization with multiple scanning ranges and digital feedback control for materials and biological sample analysis.
Louise Corscadden, PhD
Director of Science · ConductScience
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Key Specifications
Full details →- Model fit
- Configured during quote
- SKU family
- BIO-0522
- Sizing
- 115.0 x 55.0 x 55.0 cm
- Ordering
- Online checkout and quote request available
- Category
- Microscopy
- Build notes
- Confirm accessories, station layout, and support needs before purchase
The ConductScience Atomic Force Microscopy (AFM) system provides nanometer-scale surface characterization capabilities for materials science, surface chemistry, and biological sample analysis. This AFM features sub-nanometer resolution with 0.2 nm XY precision and 0.05 nm Z precision, enabling detailed topographical mapping and surface property measurements at the atomic level.
The system incorporates multiple scanning ranges (10×10 μm to 100×100 μm) with 18-bit digital control in XY directions and 16-bit Z control, providing precise positioning for diverse sample types. DSP-based digital feedback operates at 64 kHz sampling rate, ensuring stable imaging performance across various scanning conditions. The system accommodates samples up to 90 mm diameter and 20 mm height with ±6.5 mm positioning range.
How It Works
Atomic force microscopy operates by scanning a sharp probe tip across the sample surface while monitoring the deflection of a cantilever beam. The system maintains constant force between the tip and sample through a feedback loop that adjusts the vertical position based on cantilever deflection measurements. As the probe encounters surface features, the feedback system records height variations to construct a three-dimensional topographical map.
This AFM system employs DSP digital feedback control operating at 64 kHz sampling rate to maintain stable tip-sample interaction. The 18-bit digital-to-analog converters in XY directions provide precise lateral positioning, while 16-bit Z-direction control enables accurate height measurements. The scanning process generates 512×512 pixel images with scan rates adjustable from 0.6 Hz to 4.34 Hz depending on resolution requirements and sample characteristics.
Multiple scanning ranges from 10×10 μm to 100×100 μm accommodate diverse sample types and feature sizes. The optical microscope component with 4X magnification and 2.5 μm resolution assists in probe positioning and sample navigation before engaging AFM scanning mode.
Features & Benefits
Automation Level
- semi-automated
Sample Size
- Ф≤90mm, H≤20mm
Scanners Available
- 10*10μm, 20*20μm, 50*50μm, 100*100μm
Scanning Resolution
- 0.2nm in XY direction, 0.05nm in Z direction
Range of Sample Movement
- ±6.5mm
Step-motor Pulse Width
- 10±2ms
Image Sampling Points
- 512*512
Optical Magnification 4X
- Optical resolution 2.5μm
Scan Rate 0.6Hz~4.34Hz
- Scan angle 0°~360°
Scanning Control
- 18-bit D/A in XY direction, 16-bit D/A in Z direction
Data Sampling
- 14-bit A/D, double 16-bit A/D multi-channel synchronous sampling
Feedback
- DSP digital feedback
Feedback Sampling Rate
- 64kHz
Computer interface
- USB 2.0
Operating System
- Windows XP/7/8/10
Brand
- ConductScience
Research Domain
- Analytical Chemistry
- Cell Biology
- Environmental Monitoring
- Materials Science
- Microbiology
- Pharmaceutical QC
Weight
- 65.0 kg
Dimensions
- L: 115.0 mm
- W: 55.0 mm
- H: 55.0 mm
| Feature | This Product | Typical Alternative | Advantage |
|---|---|---|---|
| Scanning Resolution | 0.2 nm XY, 0.05 nm Z direction | Entry-level systems often provide 1-5 nm resolution | Enables atomic-scale feature detection and precise surface roughness measurements for advanced materials characterization. |
| Digital Control Resolution | 18-bit XY, 16-bit Z direction | Basic systems commonly use 12-16 bit control | Provides smoother scanning motion and more precise positioning for high-quality imaging without positioning artifacts. |
| Feedback Sampling Rate | 64 kHz DSP digital feedback | Lower-end models often operate at 10-20 kHz | Enables faster response to surface variations and more stable imaging of dynamic samples or soft materials. |
| Sample Size Capacity | Φ≤90mm diameter, H≤20mm height | Compact systems may limit samples to 25-50 mm | Accommodates larger specimens including full wafers and bulk material samples without size-related constraints. |
| Scan Range Options | Four ranges: 10×10 to 100×100 μm | Basic models often provide 1-2 scan ranges | Optimizes resolution and field of view for diverse applications from cellular imaging to large-area surface mapping. |
| Image Sampling | 512×512 pixel resolution | Entry-level systems may offer 256×256 or lower | Provides sufficient pixel density for detailed quantitative analysis and publication-quality image generation. |
This AFM system combines sub-nanometer resolution capabilities with high-speed digital feedback control and multiple scan range options. The 18-bit XY positioning control and 64 kHz feedback sampling rate provide stable, high-quality imaging performance across diverse sample types and measurement conditions.
Practical Tips
Perform regular calibration using certified height standards to verify Z-axis accuracy and maintain measurement traceability.
Why: Ensures quantitative measurements remain accurate over time and environmental changes.
Check cantilever alignment and laser beam position weekly, especially after probe changes or system transport.
Why: Proper optical alignment is critical for sensitive deflection detection and stable feedback operation.
Start with slower scan rates (0.6-1 Hz) for new samples to optimize feedback parameters before increasing speed.
Why: Prevents tip damage and ensures stable imaging conditions are established before high-speed acquisition.
Use the integrated optical microscope to select appropriate scanning areas free from large defects or contamination.
Why: Optimizes AFM scan area selection and prevents probe damage from unexpected surface features.
If images show drift or instability, reduce scan rate and verify the 64 kHz feedback system is operating correctly.
Why: High-frequency feedback is essential for maintaining stable tip-sample interaction during scanning.
Always approach samples slowly using the ±6.5 mm positioning range to avoid probe contact during initial setup.
Why: Prevents expensive cantilever damage and maintains consistent probe performance throughout experiments.
Match scan range selection (10×10 to 100×100 μm) to feature sizes of interest for optimal resolution and measurement precision.
Why: Proper scale selection maximizes both resolution and field of view for specific analytical requirements.
Clean the sample stage and positioning system regularly to prevent contamination that could affect the ±6.5 mm movement accuracy.
Why: Maintains precise sample positioning capability essential for reproducible measurements and multi-point analysis.
Setup Guide
What’s in the Box
- AFM main unit with scanning head
- Control electronics module
- USB 2.0 interface cable
- Optical microscope with 4X objective
- Sample stage with positioning system
- Cantilever probe holder assembly
- Windows control software package
- User manual and technical documentation
- Calibration standards (typical)
- Power supply and cables (typical)
Warranty
ConductScience provides comprehensive warranty coverage including one-year manufacturer warranty on system components and ongoing technical support. Extended service plans and calibration services are available for continued system performance verification.
Compliance
What is the practical resolution limit for biological samples in liquid environment?
While the system specifications indicate 0.2 nm XY and 0.05 nm Z resolution, practical resolution in liquid environments depends on sample stability, cantilever selection, and environmental vibration. Consult product datasheet for specific performance parameters under different operating conditions.
Can the system operate in contact and non-contact modes?
The system specifications focus on scanning parameters and feedback control but do not specify supported imaging modes. Contact manufacturer to confirm available operating modes and compatible probe types.
What file formats are supported for data export and analysis?
The system uses Windows-based control software with USB 2.0 interface, but specific data formats and export options are not detailed in the specifications. Verify compatible analysis software and file formats with technical support.
How does the 64 kHz feedback sampling rate affect imaging speed?
The high-speed DSP feedback enables stable operation across the 0.6-4.34 Hz scan rate range, allowing optimization between imaging speed and quality based on sample requirements and desired resolution.
What environmental conditions are required for optimal performance?
System specifications do not include environmental operating ranges. Consult technical documentation for temperature, humidity, and vibration isolation requirements for stable nanometer-scale measurements.
Is the system compatible with heated or cooled sample stages?
The standard sample stage accommodates samples up to 90 mm diameter and 20 mm height, but temperature control options are not specified. Contact manufacturer regarding environmental stage compatibility and sample holder modifications.
What maintenance procedures are required for the scanning probe system?
Regular maintenance typically includes cantilever replacement, optical alignment verification, and calibration standard measurements, but specific procedures depend on usage patterns and environmental conditions.
Can multiple users access the system remotely or simultaneously?
The system uses USB 2.0 interface with Windows-based control software, but multi-user access capabilities and network connectivity options are not detailed in the specifications.
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